Structural fault collapsing by superposition of BDDs for test generation in digital circuits
vastutusandmed
R. Ubar, D.Mironov, J.Raik, A.Jutman
allikas
Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA
ilmumiskoht
Los Alamitos
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 250-257 : ill
konverentsi nimetus, aeg
11th International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010
konverentsi toimumispaik
San Jose, California USA
ISBN
978-1-4244-6454-8
märkused
Bibliogr.: 30 ref
keel
inglise
Ubar, R., Mironov, D., Raik, J., Jutman, A. Structural fault collapsing by superposition of BDDs for test generation in digital circuits // Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA. Los Alamitos : IEEE Computer Society Press, 2010. p. 250-257 : ill.