prindi

Structural fault collapsing by superposition of BDDs for test generation in digital circuits

autor
Ubar, Raimund-Johannes
Mironov, Dmitri
Raik, Jaan
Jutman, Artur
vastutusandmed
R. Ubar, D.Mironov, J.Raik, A.Jutman
allikas
Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA
ilmumiskoht
Los Alamitos
kirjastus/väljaandja
IEEE Computer Society Press
ilmumisaasta
2010
leheküljed
p. 250-257 : ill
konverentsi nimetus, aeg
11th International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010
konverentsi toimumispaik
San Jose, California USA
leitav
https://ieeexplore.ieee.org/document/5450451
märksõna
digitaalintegraallülitused
testimine
vead
diagnostika (tehnika)
otsustusdiagrammid
ISBN
978-1-4244-6454-8
märkused
Bibliogr.: 30 ref
keel
inglise
Ubar, R., Mironov, D., Raik, J., Jutman, A. Structural fault collapsing by superposition of BDDs for test generation in digital circuits // Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA. Los Alamitos : IEEE Computer Society Press, 2010. p. 250-257 : ill. https://ieeexplore.ieee.org/document/5450451