prindi

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]

autor
Gorev, Maksim
Ubar, Raimund-Johannes
Ellervee, Peeter
Devadze, Sergei
Raik, Jaan
Min, Mart
vastutusandmed
Maksim Gorev, Raimund Ubar, Peeter Ellervee, Sergei Devadze, Jaan Raik, Mart Min
allikas
31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers
ilmumiskoht
Piscataway
kirjastus/väljaandja
IEEE
ilmumisaasta
2013
leheküljed
p. 1-6 : ill [USB]
konverentsi nimetus, aeg
31st Norchip Conference, 11-12 November, 2013
konverentsi toimumispaik
Vilnius, Lithuania
märksõna
integraallülitused
testimine
võtmesõna
pipe-lined signal processing architectures
built-in self-test
at-speed testing
design for testability
ISBN
978-1-4799-1646-7
märkused
Bibliogr.: 25 ref
TTÜ struktuuriüksus
arvutitehnika instituut
Thomas Johann Seebecki elektroonikainstituut
keel
inglise
Gorev M., Ubar, R., Ellervee, P., Devadze, S., Raik, J., Min, M. At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource] // 31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers. Piscataway : IEEE, 2013. p. 1-6 : ill [USB].