Hierarchical test generation with multi-level decision diagram models

vastutusandmed
Gert Jervan, Antti Markus, Jaan Raik, Raimund Ubar
allikas
Proceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 1998
ilmumiskoht
[S.l.]
ilmumisaasta
leheküljed
p. 26-33
keel
inglise
Jervan, G., Markus, A., Raik, J., Ubar, R. Hierarchical test generation with multi-level decision diagram models // Proceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 1998. [S.l.], 1998. p. 26-33.