Calculation of testability measures on structurally synthesized binary decision diagrams
vastutusandmed
R.Ubar, J.Heinlaid, J.Raik, L.Raun
ilmumiskoht
[Tallinn]
ilmumisaasta
leheküljed
p. 179-182: ill
ISBN
9985-59-081-3
märkused
Bibl. 13 ref
keel
inglise
Ubar, R., Heinlaid, J., Raik, J., Raun, L. Calculation of testability measures on structurally synthesized binary decision diagrams // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 179-182: ill.