Mutation analysis with high-level decision diagrams
autor
vastutusandmed
Hanno Hantson, Jaan Raik, Maksim Jenihhin, Anton Chepurov, Raimund Ubar, Giuseppe di Guglielmo, Franco Fummi
allikas
LATW2010 : 11th Latin-American TestWorkshop, March 28-31, 2010, Punta del Este, Uruguay
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
[6] p. [CD-ROM]
konverentsi nimetus, aeg
11th Latin-American TestWorkshop, 28-31.03.2010
konverentsi toimumispaik
Punta del Este, Uruguay
märksõna
ISBN
978-1-4244-7786-9
keel
inglise
Hantson, H., Raik, J., Jenihhin, M., Chepurov, A., Ubar, R., Guglielmo, G., Fummi, F. Mutation analysis with high-level decision diagrams // LATW2010 : 11th Latin-American TestWorkshop, March 28-31, 2010, Punta del Este, Uruguay. [S.l.] : IEEE, 2010. [6] p. [CD-ROM]. https://ieeexplore.ieee.org/document/5550336