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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
2

book article

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

book article
3

journal article EST / journal article ENG

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill https://doi.org/10.1016/j.micpro.2014.11.002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
4

book article EST / book article ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG
5

book article

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

book article
6

book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article
7

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 7, displaying 1 - 7

1. built-in self-test
2. logic built-in self-test
3. Automated Synthesis of Software-based Self-test
4. functional self-test
5. self-test
6. self-test architectures
7. software based self-test
8. software-based self-test
9. software-based self-test (SBST)
10. As-built
11. as-built model
12. as-built survey
13. built environment
14. built environment and architecture
15. built environment investment
16. built environment skills needs
17. built in moisture
18. built-in moisture
19. Built-in transformer (BIT)
20. cultural built heritage
21. hand-built pottery
22. sustainable built environment
23. adolescent self-efficacy
24. association of local-self government
25. association of local-self governments
26. corporate energy self-sufficiency
27. covalent self-assembly in solid state
28. desired self-identity
29. diffusion and self-trapping of charge carriers
30. digital self-determination
31. digital self-efficacy
32. digital self-interference cancellation
33. European charter of local self-government
34. European self-sovereign identity framework
35. high strength self-compacting concrete
36. income of self-employed
37. increased self-consumption
38. local self-government
39. nikel-based self-fluxing alloy
40. NiP self-lubricating coating
41. open self‐ventilated machines
42. optical self-mixing
43. OSV (open self‐ventilated) machines
44. perceived general self-efficacy
45. renewables self-consumption
46. Self assessment tool
47. self aware
48. self learning software
49. self learning system
50. Self organization
51. self organizing map
52. self organizing network
53. self regulating heating
54. self regulation
55. self-analysis
56. self-assembled monolayers
57. self-assembly
58. self-assessed quality of life
59. self-assessment
60. self-assessment tool
61. self-attribution
62. self-aware
63. self-aware contracts
64. self-aware systems
65. self-awareness
66. self-checking
67. self-cleaning surfaces
68. self-consistent channels
69. self-consumption
70. self-costs
71. self-defence
72. self-determination
73. self-determination theory
74. self-determination theory of work motivation
75. self-development
76. self-driving car
77. self-driving cars
78. self-driving minibus
79. self-driving vehicle
80. self-driving vehicles
81. self-efficacy
82. self-efficacy development
83. self-employed
84. self-employment
85. self-evaluation
86. self-fluxing alloy
87. self-governance
88. self-healing
89. self-heating phenomenon
90. self-identification
91. self-identity
92. self-improvement
93. self-insurance
94. self-learning
95. self-lubrication
96. self-management
97. self‐management
98. self-mixing
99. self-organisation
100. self-organised teams
101. self-organization
102. self-organized criticality
103. self-organized teams
104. self-perforating dowel
105. self-propagating high temperature synthesized (SHS)
106. Self-Propagating High-Temperature Synthesis
107. self-propulsion
108. self-regulated learning
109. self-regulation
110. self-reported musculoskeletal disorders
111. self-rolling
112. self-shading envelopes
113. self-sovereign
114. self-study
115. self-study courses
116. self-training
117. social self-development
118. solo self-employment
119. accelerated shelf-life test
120. adaptive test strategy generation
121. antigen test
122. Applications in Test Engineering
123. ASTM G65 dry sand rubber wheel abrasion test
124. automated test environment
125. automated test pattern generation
126. automatic test case generation
127. automatic test pattern generation
128. automatic test program generation
129. Auvergne test-bed
130. battery test
131. behavioral test
132. behaviour level test generation
133. bending test
134. bit-error rate test
135. Board and System Test
136. board test
137. bounds test
138. capillary condensation redistribution test
139. chi-square test
140. closed bottle test
141. cognitive screening test
142. compartment fire test
143. compartment test
144. cone penetration test (CPT)
145. COVID-19 antigen test
146. cutting test
147. cybersecurity test bed
148. DDR4 interconnect test
149. design and test
150. design-for-test
151. deterministic test sequences
152. diagnostic test
153. digital test
154. Digital test and testable design
155. double-pulse test
156. drawing test
157. dry droplet antimicrobial test
158. embedded test
159. fan pressurisation test
160. final test result prediction
161. four-point bending test
162. FPGA based test
163. FPGA-Assisted Test
164. FPGA-centric test
165. functional test generation
166. Granger causality test
167. hardness test
168. Hierarchical Multi-level Test Generation
169. high-level synthesis for test
170. high-level test data generation
171. highlevel test generation
172. high-speed serial link test
173. IEEE 9 bus test system
174. implementation-independent test generation
175. in situ tensile test in SEM
176. industrial field test
177. in-situ tensile test in SEM
178. Johansen cointegration test
179. Kolmogorov-Smirnov test
180. load test
181. Luria alternating series test
182. Mann–Kendall test
183. Mann-Kendall trend test
184. memory interconnect test
185. microprocessor test
186. Model test
187. multiplier test
188. offline test generation
189. orthogonal test
190. package test analysis
191. parallel design and test
192. performance test
193. piezocone penetration test (CPTu)
194. Point Load Test index
195. pressurisation test
196. processor-centric board test
197. progressive damage test
198. provably correct test generation
199. pseudo-exhaustive test
200. purity test
201. real-time room temperature test
202. rolling thin film oven test
203. rtioco-based timed test sequences
204. seasonal Mann Kendall test
205. seismic piezocone penetration test
206. sentence writing test
207. serial sevens test
208. ship towing test tank
209. similar material simulation test
210. small-scale fire test
211. small‐scale test
212. soil phosphorus (P) test
213. standard test method
214. static load test
215. static-dynamic probing test (SDT)
216. stress test
217. system level test
218. teaching design and test of systems
219. tensile test
220. tensile test
221. test
222. test and evaluation platform
223. test automation
224. test bench
225. test coverage
226. test driven development
227. test driven modelling
228. test embankment
229. test equipment
230. test generation
231. test generation and fault diagnosis
232. Test Group Generation for Detecting Multiple Faults
233. test groups
234. test model design
235. test optimization
236. test packets
237. test path synthesis
238. test patterns
239. test point insertion
240. test program generation
241. test reference year
242. test replication
243. test scenario description language
244. test-bed
245. test-chips
246. test-house
247. test-pattern
248. test-suite reduction
249. Three-point bending test
250. unit root test
251. usability platform test
252. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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