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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

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journal article EST / journal article ENG

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill https://doi.org/10.1016/j.micpro.2014.11.002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article

Number of records 3, displaying 1 - 3

1. at-speed testing
2. absolute convergence with speed
3. A-statistical convergence with speed
4. boundedness and summability with speed
5. boundedness with speed
6. convergence and absolute convergence with speed
7. convergence and boundedness with speed
8. convergence and α-absolute convergence with speed
9. convergence with speed
10. Drilling speed
11. high speed boat
12. high speed craft (HSC)
13. high speed machining
14. high speed measurement
15. high-speed
16. high-speed camera
17. high-speed craft
18. high-speed design
19. high-speed MAS (magic angle spinning)
20. high-speed planing crafts
21. high-speed railway
22. high-speed serial link test
23. high-speed temperature scanner
24. high-speed thermogravimetric analysis
25. low speed
26. operational speed
27. paranormal absolute convergence with speed
28. paranormal boundedness with speed
29. paranormal convergence with speed
30. paranormed absolute convergence with speed
31. paranormed boundedness with speed
32. paranormed convergence with speed
33. paranormed zero-convergence with speed
34. Pollen fall speed
35. speed
36. speed and position estimation
37. speed of convergence
38. speed of releases
39. speed tracking setpoints
40. speed-Maddox spaces
41. summability and absolute summability with speed
42. summability and boundedness with speed
43. zero-convergence with speed
44. variable speed drive
45. variable speed drives
46. variable speed wind turbines
47. variable-speed drives
48. variable-speed drives (VSDs)
49. water speed
50. wind speed
51. α-absolute convergence with speed
52. α-absolute summability with speed
53. accelerated testing
54. acoustomechanical testing
55. anaerobic testing
56. aspect-oriented testing
57. assessment and testing
58. benchmark testing
59. Berridge testing
60. burst testing
61. cancer genomic testing
62. compliance testing
63. compositional testing
64. computer aided testing
65. conformance testing
66. courses on electronic testing and design
67. cybersecurity testing
68. D. non-destructive testing
69. deformation testing
70. design field testing
71. destructive testing
72. eddy current testing
73. eddy current testing (ECT)
74. erosion testing
75. fatigue testing
76. fire testing
77. hierarchical testing
78. hypotheses testing
79. Implementation-Independent Testing of Microprocessors
80. integration testing
81. laboratory scale testing
82. load testing
83. macro mechanical testing and green surface tribology
84. material testing
85. materials testing
86. measurement and testing
87. mechanical testing
88. memory testing
89. metamorphic testing
90. microprocessor testing
91. model based testing
92. model-based mutation testing
93. model-based testing
94. mutation testing
95. network-testing
96. non destructive testing
97. nondestructive testing
98. non-destructive testing
99. on-site testing
100. pin on disc wear testing
101. PMU calibration testing
102. PMU testing
103. point-of-care testing
104. processor core testing
105. processor testing
106. real-time HiL testing
107. regression testing
108. RISC processor testing
109. robustness testing
110. safety and security testing
111. scenario testing
112. scratch testing
113. security testing
114. small-scale fire testing
115. software testing
116. software-in-the-loop (SIL) testing
117. stand-alone testing
118. stress-testing
119. substation testing methods
120. system testing
121. tensile testing
122. testing
123. testing methods
124. testing of digital devices
125. testing of generator
126. testing of phasor measurement units
127. two-dimensional array testing
128. ultrasonic testing
129. wafer testing
130. wear testing
131. vibration testing
132. virtual testing

1. Testing and Calibration Centre of TUT

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