Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
at-speed testing (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
3
Look more..
(2/143)
Export
export all inquiry results
(3)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers
2013
/
p. 1-6 : ill [USB]
book article
2
journal article EST
/
journal article ENG
Functional self-test of high-performance pipe-lined signal processing architectures
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
Microprocessors and microsystems
2015
/
p. 909-918 : ill
https://doi.org/10.1016/j.micpro.2014.11.002
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
3
book article
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
book article
Number of records 3, displaying
1 - 3
keyword
142
1.
at-speed testing
2.
absolute convergence with speed
3.
A-statistical convergence with speed
4.
boundedness and summability with speed
5.
boundedness with speed
6.
convergence and absolute convergence with speed
7.
convergence and boundedness with speed
8.
convergence and α-absolute convergence with speed
9.
convergence with speed
10.
Drilling speed
11.
high speed boat
12.
high speed craft (HSC)
13.
high speed machining
14.
high speed measurement
15.
high speed planing craft
16.
high-speed
17.
high-speed camera
18.
high-speed craft
19.
high-speed design
20.
high-speed MAS (magic angle spinning)
21.
high-speed planing crafts
22.
high-speed rail
23.
high-speed railway
24.
high-speed serial link test
25.
high-speed temperature scanner
26.
high-speed temperature scanner (HSTS)
27.
high-speed thermogravimetric analysis
28.
low speed
29.
operational speed
30.
paranormal absolute convergence with speed
31.
paranormal boundedness with speed
32.
paranormal convergence with speed
33.
paranormed absolute convergence with speed
34.
paranormed boundedness with speed
35.
paranormed convergence with speed
36.
paranormed zero-convergence with speed
37.
peeling speed
38.
Pollen fall speed
39.
speed
40.
speed and position estimation
41.
speed of convergence
42.
speed of releases
43.
speed tracking setpoints
44.
speed-Maddox spaces
45.
summability and absolute summability with speed
46.
summability and boundedness with speed
47.
zero-convergence with speed
48.
variable speed drive
49.
variable speed drives
50.
variable speed wind turbines
51.
variable-speed drives
52.
variable-speed drives (VSDs)
53.
water speed
54.
wind speed
55.
α-absolute convergence with speed
56.
α-absolute summability with speed
57.
accelerated testing
58.
acoustomechanical testing
59.
anaerobic testing
60.
aspect-oriented testing
61.
assessment and testing
62.
benchmark testing
63.
Berridge testing
64.
burst testing
65.
cancer genomic testing
66.
compliance testing
67.
compositional testing
68.
computer aided testing
69.
cone heater testing
70.
conformance testing
71.
courses on electronic testing and design
72.
cybersecurity testing
73.
D. non-destructive testing
74.
deformation testing
75.
design field testing
76.
destructive testing
77.
eddy current testing
78.
eddy current testing (ECT)
79.
erosion testing
80.
fabric testing
81.
fatigue testing
82.
fire testing
83.
hierarchical testing
84.
hypotheses testing
85.
Implementation-Independent Testing of Microprocessors
86.
integration testing
87.
laboratory scale testing
88.
load testing
89.
macro mechanical testing and green surface tribology
90.
material testing
91.
materials testing
92.
measurement and testing
93.
mechanical testing
94.
memory testing
95.
metamorphic testing
96.
microprocessor testing
97.
model based testing
98.
model-based mutation testing
99.
model-based testing
100.
mutation testing
101.
network-testing
102.
non destructive testing
103.
nondestructive testing
104.
non-destructive testing
105.
non-destructive testing (NDT)
106.
On-site drug testing
107.
on-site testing
108.
pin on disc wear testing
109.
PMU calibration testing
110.
PMU testing
111.
point-of-care testing
112.
processor core testing
113.
processor testing
114.
real-time HiL testing
115.
regression testing
116.
RISC processor testing
117.
robustness testing
118.
safety and security testing
119.
scenario testing
120.
Scenario-Based Testing
121.
scratch testing
122.
security testing
123.
shear testing
124.
small-scale fire testing
125.
software testing
126.
software-in-the-loop (SIL) testing
127.
stand-alone testing
128.
stress-testing
129.
substation testing methods
130.
system testing
131.
tensile testing
132.
testing
133.
testing methods
134.
testing of digital devices
135.
testing of generator
136.
testing of phasor measurement units
137.
two-dimensional array testing
138.
ultrasonic testing
139.
wafer testing
140.
wear testing
141.
vibration testing
142.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT