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at-speed testing (keyword)
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1
book article
At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers
2013
/
p. 1-6 : ill [USB]
book article
2
journal article EST
/
journal article ENG
Functional self-test of high-performance pipe-lined signal processing architectures
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
Microprocessors and microsystems
2015
/
p. 909-918 : ill
https://doi.org/10.1016/j.micpro.2014.11.002
Journal metrics at Scopus
Article at Scopus
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Article at WOS
journal article EST
/
journal article ENG
3
book article
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
book article
Number of records 3, displaying
1 - 3
keyword
131
1.
at-speed testing
2.
absolute convergence with speed
3.
A-statistical convergence with speed
4.
boundedness and summability with speed
5.
boundedness with speed
6.
convergence and absolute convergence with speed
7.
convergence and boundedness with speed
8.
convergence and α-absolute convergence with speed
9.
convergence with speed
10.
Drilling speed
11.
high speed boat
12.
high speed craft (HSC)
13.
high speed machining
14.
high speed measurement
15.
high-speed
16.
high-speed craft
17.
high-speed design
18.
high-speed MAS (magic angle spinning)
19.
high-speed planing crafts
20.
high-speed railway
21.
high-speed serial link test
22.
high-speed temperature scanner
23.
high-speed thermogravimetric analysis
24.
low speed
25.
operational speed
26.
paranormal absolute convergence with speed
27.
paranormal boundedness with speed
28.
paranormal convergence with speed
29.
paranormed absolute convergence with speed
30.
paranormed boundedness with speed
31.
paranormed convergence with speed
32.
paranormed zero-convergence with speed
33.
Pollen fall speed
34.
speed
35.
speed and position estimation
36.
speed of convergence
37.
speed of releases
38.
speed tracking setpoints
39.
speed-Maddox spaces
40.
summability and absolute summability with speed
41.
summability and boundedness with speed
42.
zero-convergence with speed
43.
variable speed drive
44.
variable speed drives
45.
variable speed wind turbines
46.
variable-speed drives
47.
variable-speed drives (VSDs)
48.
water speed
49.
wind speed
50.
α-absolute convergence with speed
51.
α-absolute summability with speed
52.
accelerated testing
53.
acoustomechanical testing
54.
anaerobic testing
55.
aspect-oriented testing
56.
assessment and testing
57.
benchmark testing
58.
Berridge testing
59.
burst testing
60.
cancer genomic testing
61.
compliance testing
62.
compositional testing
63.
computer aided testing
64.
conformance testing
65.
courses on electronic testing and design
66.
cybersecurity testing
67.
D. non-destructive testing
68.
deformation testing
69.
design field testing
70.
destructive testing
71.
eddy current testing
72.
eddy current testing (ECT)
73.
erosion testing
74.
fatigue testing
75.
fire testing
76.
hierarchical testing
77.
hypotheses testing
78.
Implementation-Independent Testing of Microprocessors
79.
integration testing
80.
laboratory scale testing
81.
load testing
82.
macro mechanical testing and green surface tribology
83.
material testing
84.
materials testing
85.
measurement and testing
86.
mechanical testing
87.
memory testing
88.
metamorphic testing
89.
microprocessor testing
90.
model based testing
91.
model-based mutation testing
92.
model-based testing
93.
mutation testing
94.
network-testing
95.
non destructive testing
96.
nondestructive testing
97.
non-destructive testing
98.
on-site testing
99.
pin on disc wear testing
100.
PMU calibration testing
101.
PMU testing
102.
point-of-care testing
103.
processor core testing
104.
processor testing
105.
real-time HiL testing
106.
regression testing
107.
RISC processor testing
108.
robustness testing
109.
safety and security testing
110.
scenario testing
111.
scratch testing
112.
security testing
113.
small-scale fire testing
114.
software testing
115.
software-in-the-loop (SIL) testing
116.
stand-alone testing
117.
stress-testing
118.
substation testing methods
119.
system testing
120.
tensile testing
121.
testing
122.
testing methods
123.
testing of digital devices
124.
testing of generator
125.
testing of phasor measurement units
126.
two-dimensional array testing
127.
ultrasonic testing
128.
wafer testing
129.
wear testing
130.
vibration testing
131.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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