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courses on electronic testing and design (keyword)
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book article
BIST analyzer : a training platform for SoC testing [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 2007
2007
/
p. S3H-8-S3H-13 : ill. [CD-ROM]
http://dx.doi.org/10.1109/FIE.2007.4418125
book article
Number of records 1, displaying
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keyword
84
1.
courses on electronic testing and design
2.
design field testing
3.
nano-electronic systems design
4.
ADR regulations training courses
5.
correspondence courses
6.
DG training courses
7.
education courses
8.
educational courses
9.
open online courses
10.
optional courses
11.
self-study courses
12.
technical courses
13.
design methodology and human-centred design
14.
accelerated testing
15.
acoustomechanical testing
16.
anaerobic testing
17.
aspect-oriented testing
18.
at-speed testing
19.
benchmark testing
20.
Berridge testing
21.
cancer genomic testing
22.
compliance testing
23.
compositional testing
24.
computer aided testing
25.
conformance testing
26.
cybersecurity testing
27.
D. non-destructive testing
28.
eddy current testing
29.
erosion testing
30.
fatigue testing
31.
fire testing
32.
hierarchical testing
33.
hypotheses testing
34.
integration testing
35.
laboratory scale testing
36.
load testing
37.
macro mechanical testing and green surface tribology
38.
material testing
39.
materials testing
40.
measurement and testing
41.
mechanical testing
42.
memory testing
43.
metamorphic testing
44.
microprocessor testing
45.
model based testing
46.
model-based mutation testing
47.
model-based testing
48.
mutation testing
49.
network-testing
50.
non destructive testing
51.
nondestructive testing
52.
non-destructive testing
53.
on-site testing
54.
pin on disc wear testing
55.
PMU calibration testing
56.
PMU testing
57.
point-of-care testing
58.
processor core testing
59.
processor testing
60.
real-time HiL testing
61.
regression testing
62.
RISC processor testing
63.
robustness testing
64.
scenario testing
65.
scratch testing
66.
security testing
67.
small-scale fire testing
68.
software testing
69.
software-in-the-loop (SIL) testing
70.
stand-alone testing
71.
stress-testing
72.
substation testing methods
73.
system testing
74.
tensile testing
75.
testing
76.
testing methods
77.
testing of digital devices
78.
testing of generator
79.
testing of phasor measurement units
80.
two-dimensional array testing
81.
wafer testing
82.
wear testing
83.
vibration testing
84.
virtual testing
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