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courses on electronic testing and design (keyword)
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book article
BIST analyzer : a training platform for SoC testing [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 2007
2007
/
p. S3H-8-S3H-13 : ill. [CD-ROM]
http://dx.doi.org/10.1109/FIE.2007.4418125
book article
Number of records 1, displaying
1 - 1
keyword
97
1.
courses on electronic testing and design
2.
design field testing
3.
electronic design automation
4.
nano-electronic systems design
5.
ADR regulations training courses
6.
correspondence courses
7.
DG training courses
8.
education courses
9.
educational courses
10.
IT education elective courses
11.
open online courses
12.
optional courses
13.
retraining courses
14.
self-study courses
15.
technical courses
16.
design methodology and human-centred design
17.
accelerated testing
18.
acoustomechanical testing
19.
anaerobic testing
20.
aspect-oriented testing
21.
assessment and testing
22.
at-speed testing
23.
benchmark testing
24.
Berridge testing
25.
burst testing
26.
cancer genomic testing
27.
compliance testing
28.
compositional testing
29.
computer aided testing
30.
cone heater testing
31.
conformance testing
32.
cybersecurity testing
33.
D. non-destructive testing
34.
deformation testing
35.
destructive testing
36.
eddy current testing
37.
eddy current testing (ECT)
38.
erosion testing
39.
fatigue testing
40.
fire testing
41.
hierarchical testing
42.
hypotheses testing
43.
Implementation-Independent Testing of Microprocessors
44.
integration testing
45.
laboratory scale testing
46.
load testing
47.
macro mechanical testing and green surface tribology
48.
material testing
49.
materials testing
50.
measurement and testing
51.
mechanical testing
52.
memory testing
53.
metamorphic testing
54.
microprocessor testing
55.
model based testing
56.
model-based mutation testing
57.
model-based testing
58.
mutation testing
59.
network-testing
60.
non destructive testing
61.
nondestructive testing
62.
non-destructive testing
63.
on-site testing
64.
pin on disc wear testing
65.
PMU calibration testing
66.
PMU testing
67.
point-of-care testing
68.
processor core testing
69.
processor testing
70.
real-time HiL testing
71.
regression testing
72.
RISC processor testing
73.
robustness testing
74.
safety and security testing
75.
scenario testing
76.
scratch testing
77.
security testing
78.
shear testing
79.
small-scale fire testing
80.
software testing
81.
software-in-the-loop (SIL) testing
82.
stand-alone testing
83.
stress-testing
84.
substation testing methods
85.
system testing
86.
tensile testing
87.
testing
88.
testing methods
89.
testing of digital devices
90.
testing of generator
91.
testing of phasor measurement units
92.
two-dimensional array testing
93.
ultrasonic testing
94.
wafer testing
95.
wear testing
96.
vibration testing
97.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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