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book article
BIST analyzer : a training platform for SoC testing [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 2007
2007
/
p. S3H-8-S3H-13 : ill. [CD-ROM]
http://dx.doi.org/10.1109/FIE.2007.4418125
book article
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keyword
100
1.
courses on electronic testing and design
2.
design field testing
3.
electronic design automation
4.
nano-electronic systems design
5.
ADR regulations training courses
6.
correspondence courses
7.
DG training courses
8.
education courses
9.
educational courses
10.
IT education elective courses
11.
open online courses
12.
optional courses
13.
retraining courses
14.
self-study courses
15.
technical courses
16.
design methodology and human-centred design
17.
accelerated testing
18.
acoustomechanical testing
19.
anaerobic testing
20.
aspect-oriented testing
21.
assessment and testing
22.
at-speed testing
23.
benchmark testing
24.
Berridge testing
25.
burst testing
26.
cancer genomic testing
27.
compliance testing
28.
compositional testing
29.
computer aided testing
30.
cone heater testing
31.
conformance testing
32.
cybersecurity testing
33.
D. non-destructive testing
34.
deformation testing
35.
destructive testing
36.
eddy current testing
37.
eddy current testing (ECT)
38.
erosion testing
39.
fabric testing
40.
fatigue testing
41.
fire testing
42.
hierarchical testing
43.
hypotheses testing
44.
Implementation-Independent Testing of Microprocessors
45.
integration testing
46.
laboratory scale testing
47.
load testing
48.
macro mechanical testing and green surface tribology
49.
material testing
50.
materials testing
51.
measurement and testing
52.
mechanical testing
53.
memory testing
54.
metamorphic testing
55.
microprocessor testing
56.
model based testing
57.
model-based mutation testing
58.
model-based testing
59.
mutation testing
60.
network-testing
61.
non destructive testing
62.
nondestructive testing
63.
non-destructive testing
64.
non-destructive testing (NDT)
65.
On-site drug testing
66.
on-site testing
67.
pin on disc wear testing
68.
PMU calibration testing
69.
PMU testing
70.
point-of-care testing
71.
processor core testing
72.
processor testing
73.
real-time HiL testing
74.
regression testing
75.
RISC processor testing
76.
robustness testing
77.
safety and security testing
78.
scenario testing
79.
scratch testing
80.
security testing
81.
shear testing
82.
small-scale fire testing
83.
software testing
84.
software-in-the-loop (SIL) testing
85.
stand-alone testing
86.
stress-testing
87.
substation testing methods
88.
system testing
89.
tensile testing
90.
testing
91.
testing methods
92.
testing of digital devices
93.
testing of generator
94.
testing of phasor measurement units
95.
two-dimensional array testing
96.
ultrasonic testing
97.
wafer testing
98.
wear testing
99.
vibration testing
100.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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