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hierarchical testing (keyword)
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book article
How to generate high quality tests for digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Kruus, Helena
;
Raik, Jaan
2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 2
2004
/
p. 459-462 : ill
http://dx.doi.org/10.1109/SMICND.2004.1403048
book article
Number of records 1, displaying
1 - 1
keyword
103
1.
hierarchical testing
2.
agglomerative hierarchical clustering
3.
analytical hierarchical process
4.
ascending hierarchical grid system
5.
hierarchical
6.
hierarchical approaches
7.
hierarchical cluster analysis (statistics)
8.
hierarchical control
9.
hierarchical finite state machine
10.
hierarchical internal variable
11.
hierarchical microstructure
12.
hierarchical modulation
13.
Hierarchical Multi-level Test Generation
14.
hierarchical service models
15.
hierarchical structure
16.
hierarchical structures
17.
hierarchical timing analysis
18.
hierarchical two-level analysis
19.
synthesis on hierarchical service models
20.
WordNet hierarchical structure
21.
accelerated testing
22.
acoustomechanical testing
23.
anaerobic testing
24.
aspect-oriented testing
25.
assessment and testing
26.
at-speed testing
27.
benchmark testing
28.
Berridge testing
29.
burst testing
30.
cancer genomic testing
31.
compliance testing
32.
compositional testing
33.
computer aided testing
34.
cone heater testing
35.
conformance testing
36.
courses on electronic testing and design
37.
cybersecurity testing
38.
D. non-destructive testing
39.
deformation testing
40.
design field testing
41.
destructive testing
42.
eddy current testing
43.
eddy current testing (ECT)
44.
erosion testing
45.
fabric testing
46.
fatigue testing
47.
fire testing
48.
hypotheses testing
49.
Implementation-Independent Testing of Microprocessors
50.
integration testing
51.
laboratory scale testing
52.
load testing
53.
macro mechanical testing and green surface tribology
54.
material testing
55.
materials testing
56.
measurement and testing
57.
mechanical testing
58.
memory testing
59.
metamorphic testing
60.
microprocessor testing
61.
model based testing
62.
model-based mutation testing
63.
model-based testing
64.
mutation testing
65.
network-testing
66.
non destructive testing
67.
nondestructive testing
68.
non-destructive testing
69.
on-site testing
70.
pin on disc wear testing
71.
PMU calibration testing
72.
PMU testing
73.
point-of-care testing
74.
processor core testing
75.
processor testing
76.
real-time HiL testing
77.
regression testing
78.
RISC processor testing
79.
robustness testing
80.
safety and security testing
81.
scenario testing
82.
scratch testing
83.
security testing
84.
shear testing
85.
small-scale fire testing
86.
software testing
87.
software-in-the-loop (SIL) testing
88.
stand-alone testing
89.
stress-testing
90.
substation testing methods
91.
system testing
92.
tensile testing
93.
testing
94.
testing methods
95.
testing of digital devices
96.
testing of generator
97.
testing of phasor measurement units
98.
two-dimensional array testing
99.
ultrasonic testing
100.
wafer testing
101.
wear testing
102.
vibration testing
103.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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