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book article
How to generate high quality tests for digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Kruus, Helena
;
Raik, Jaan
2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 2
2004
/
p. 459-462 : ill
http://dx.doi.org/10.1109/SMICND.2004.1403048
book article
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keyword
91
1.
hierarchical testing
2.
agglomerative hierarchical clustering
3.
analytical hierarchical process
4.
ascending hierarchical grid system
5.
hierarchical
6.
hierarchical approaches
7.
hierarchical cluster analysis (statistics)
8.
hierarchical control
9.
hierarchical finite state machine
10.
hierarchical internal variable
11.
hierarchical microstructure
12.
hierarchical modulation
13.
hierarchical service models
14.
hierarchical structure
15.
hierarchical structures
16.
hierarchical timing analysis
17.
hierarchical two-level analysis
18.
synthesis on hierarchical service models
19.
WordNet hierarchical structure
20.
accelerated testing
21.
acoustomechanical testing
22.
anaerobic testing
23.
aspect-oriented testing
24.
at-speed testing
25.
benchmark testing
26.
Berridge testing
27.
cancer genomic testing
28.
compliance testing
29.
compositional testing
30.
computer aided testing
31.
conformance testing
32.
courses on electronic testing and design
33.
cybersecurity testing
34.
D. non-destructive testing
35.
design field testing
36.
eddy current testing
37.
erosion testing
38.
fatigue testing
39.
fire testing
40.
hypotheses testing
41.
integration testing
42.
laboratory scale testing
43.
load testing
44.
macro mechanical testing and green surface tribology
45.
material testing
46.
materials testing
47.
measurement and testing
48.
mechanical testing
49.
memory testing
50.
metamorphic testing
51.
microprocessor testing
52.
model based testing
53.
model-based mutation testing
54.
model-based testing
55.
mutation testing
56.
network-testing
57.
non destructive testing
58.
nondestructive testing
59.
non-destructive testing
60.
on-site testing
61.
pin on disc wear testing
62.
PMU calibration testing
63.
PMU testing
64.
point-of-care testing
65.
processor core testing
66.
processor testing
67.
real-time HiL testing
68.
regression testing
69.
RISC processor testing
70.
robustness testing
71.
scenario testing
72.
scratch testing
73.
security testing
74.
small-scale fire testing
75.
software testing
76.
software-in-the-loop (SIL) testing
77.
stand-alone testing
78.
stress-testing
79.
substation testing methods
80.
system testing
81.
tensile testing
82.
testing
83.
testing methods
84.
testing of digital devices
85.
testing of generator
86.
testing of phasor measurement units
87.
two-dimensional array testing
88.
wafer testing
89.
wear testing
90.
vibration testing
91.
virtual testing
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