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Handbook of testing electronic systems (source)
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1
book article
Defects, faults and fault models
Gramatova, Elena
;
Fisherova, Maria
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
Handbook of testing electronic systems
2005
/
p. 26-96 : ill
book article
2
book article
Test generation techniques and algorithms
Ubar, Raimund-Johannes
;
Gramatova, Elena
;
Fisherova, Maria
Handbook of testing electronic systems
2005
/
p. 99-173 : ill
book article
3
book article
Testing tools
Jutman, Artur
Handbook of testing electronic systems
2005
/
p. 361-365 : ill
book article
4
book article
Testing tools
Raik, Jaan
Handbook of testing electronic systems
2005
/
p. 373-378 : ill
book article
Number of records 4, displaying
1 - 4
keyword
89
1.
courses on electronic testing and design
2.
Electronic Document and Records Management Systems (EDRMS)
3.
electronic payment systems
4.
nano-electronic systems design
5.
handbook
6.
MIL-HDBK-217F handbook
7.
accelerated testing
8.
acoustomechanical testing
9.
anaerobic testing
10.
aspect-oriented testing
11.
assessment and testing
12.
at-speed testing
13.
benchmark testing
14.
Berridge testing
15.
burst testing
16.
cancer genomic testing
17.
compliance testing
18.
compositional testing
19.
computer aided testing
20.
cone heater testing
21.
conformance testing
22.
cybersecurity testing
23.
D. non-destructive testing
24.
deformation testing
25.
design field testing
26.
destructive testing
27.
eddy current testing
28.
eddy current testing (ECT)
29.
erosion testing
30.
fabric testing
31.
fatigue testing
32.
fire testing
33.
hierarchical testing
34.
hypotheses testing
35.
Implementation-Independent Testing of Microprocessors
36.
integration testing
37.
laboratory scale testing
38.
load testing
39.
macro mechanical testing and green surface tribology
40.
material testing
41.
materials testing
42.
measurement and testing
43.
mechanical testing
44.
memory testing
45.
metamorphic testing
46.
microprocessor testing
47.
model based testing
48.
model-based mutation testing
49.
model-based testing
50.
mutation testing
51.
network-testing
52.
non destructive testing
53.
nondestructive testing
54.
non-destructive testing
55.
on-site testing
56.
pin on disc wear testing
57.
PMU calibration testing
58.
PMU testing
59.
point-of-care testing
60.
processor core testing
61.
processor testing
62.
real-time HiL testing
63.
regression testing
64.
RISC processor testing
65.
robustness testing
66.
safety and security testing
67.
scenario testing
68.
scratch testing
69.
security testing
70.
shear testing
71.
small-scale fire testing
72.
software testing
73.
software-in-the-loop (SIL) testing
74.
stand-alone testing
75.
stress-testing
76.
substation testing methods
77.
system testing
78.
tensile testing
79.
testing
80.
testing methods
81.
testing of digital devices
82.
testing of generator
83.
testing of phasor measurement units
84.
two-dimensional array testing
85.
ultrasonic testing
86.
wafer testing
87.
wear testing
88.
vibration testing
89.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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