Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Handbook of testing electronic systems (source)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
4
Look more..
(2/85)
Export
export all inquiry results
(4)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Defects, faults and fault models
Gramatova, Elena
;
Fisherova, Maria
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
Handbook of testing electronic systems
2005
/
p. 26-96 : ill
book article
2
book article
Test generation techniques and algorithms
Ubar, Raimund-Johannes
;
Gramatova, Elena
;
Fisherova, Maria
Handbook of testing electronic systems
2005
/
p. 99-173 : ill
book article
3
book article
Testing tools
Jutman, Artur
Handbook of testing electronic systems
2005
/
p. 361-365 : ill
book article
4
book article
Testing tools
Raik, Jaan
Handbook of testing electronic systems
2005
/
p. 373-378 : ill
book article
Number of records 4, displaying
1 - 4
keyword
84
1.
courses on electronic testing and design
2.
Electronic Document and Records Management Systems (EDRMS)
3.
electronic payment systems
4.
nano-electronic systems design
5.
handbook
6.
MIL-HDBK-217F handbook
7.
accelerated testing
8.
acoustomechanical testing
9.
anaerobic testing
10.
aspect-oriented testing
11.
at-speed testing
12.
benchmark testing
13.
Berridge testing
14.
burst testing
15.
cancer genomic testing
16.
compliance testing
17.
compositional testing
18.
computer aided testing
19.
conformance testing
20.
cybersecurity testing
21.
D. non-destructive testing
22.
deformation testing
23.
design field testing
24.
destructive testing
25.
eddy current testing
26.
eddy current testing (ECT)
27.
erosion testing
28.
fatigue testing
29.
fire testing
30.
hierarchical testing
31.
hypotheses testing
32.
Implementation-Independent Testing of Microprocessors
33.
integration testing
34.
laboratory scale testing
35.
load testing
36.
macro mechanical testing and green surface tribology
37.
material testing
38.
materials testing
39.
measurement and testing
40.
mechanical testing
41.
memory testing
42.
metamorphic testing
43.
microprocessor testing
44.
model based testing
45.
model-based mutation testing
46.
model-based testing
47.
mutation testing
48.
network-testing
49.
non destructive testing
50.
nondestructive testing
51.
non-destructive testing
52.
on-site testing
53.
pin on disc wear testing
54.
PMU calibration testing
55.
PMU testing
56.
point-of-care testing
57.
processor core testing
58.
processor testing
59.
real-time HiL testing
60.
regression testing
61.
RISC processor testing
62.
robustness testing
63.
safety and security testing
64.
scenario testing
65.
scratch testing
66.
security testing
67.
small-scale fire testing
68.
software testing
69.
software-in-the-loop (SIL) testing
70.
stand-alone testing
71.
stress-testing
72.
substation testing methods
73.
system testing
74.
tensile testing
75.
testing
76.
testing methods
77.
testing of digital devices
78.
testing of generator
79.
testing of phasor measurement units
80.
two-dimensional array testing
81.
wafer testing
82.
wear testing
83.
vibration testing
84.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT