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book article EST
/
book article ENG
European Test Symposium Teams: an anniversary snapshot
Jenihhin, Maksim
;
Raik, Jaan
;
Jutman, Artur
;
Cherezova, Natalia
;
Ubar, Raimund-Johannes
;
Míclea, Liviu Cristian
;
Enyedi, Szilárd
;
Stefan, Iulia Adina
;
Stan, Ovidiu Petru
;
Corches, Cosmina
2025 IEEE European Test Symposium (ETS) : ETS 2025 : May 26-30, 2025, Tallinn, Estonia : proceedings
2025
/
48, p.
https://doi.org/10.1109/ETS63895.2025.11049652
Conference proceedings at Scopus
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book article EST
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book article ENG
Number of records 1, displaying
1 - 1
keyword
149
1.
circuit testing
2.
airflows short-circuit
3.
application-specific integrated circuit (ASIC)
4.
bidirectional circuit breaker
5.
buck-boost with unfolding circuit
6.
calculation of short-circuit currents
7.
circuit analysis
8.
circuit breaker
9.
circuit breaker technologies
10.
circuit breakers
11.
circuit design
12.
circuit faults
13.
circuit modeling
14.
circuit optimization
15.
circuit simulation
16.
circuit switching
17.
circuit synthesis
18.
converter circuit
19.
core short-circuit
20.
data-controlled circuit partition
21.
dc circuit breaker
22.
dc circuit breaker (DCCB)
23.
digital integrated circuit (IC) design
24.
equivalent circuit
25.
equivalent circuit model
26.
fractional open circuit voltage
27.
gate-level circuit abstraction
28.
H-bridge unfolder circuit
29.
High voltage circuit breaker
30.
integrated circuit design
31.
integrated circuit modeling
32.
laminate embedded printed circuit board
33.
logic circuit
34.
magnetic equivalent circuit (MEC)
35.
non-linear circuit
36.
open circuit fault
37.
open circuit protection
38.
printed circuit boards
39.
printed circuit boards (PCBs)
40.
RC parallel circuit
41.
reconfigurable DC solid-state circuit breaker (SSCB)
42.
RLC circuit
43.
short circuit
44.
short circuit current
45.
short circuit fault
46.
short circuit protection
47.
short-circuit current
48.
short-circuit detection
49.
short-circuit protection
50.
solid state circuit breakers (SSCBs)
51.
solid-state circuit breakers (SSCB)
52.
switched-capacitor circuit
53.
z-source circuit breaker
54.
Z-source DC circuit breakers (ZSCB)
55.
turn short-circuit
56.
unfolding circuit
57.
waste printed circuit boards
58.
waste printed circuit boards (WPCBs)
59.
3-D circuit
60.
accelerated testing
61.
acoustomechanical testing
62.
anaerobic testing
63.
aspect-oriented testing
64.
assessment and testing
65.
at-speed testing
66.
benchmark testing
67.
Berridge testing
68.
burst testing
69.
cancer genomic testing
70.
compliance testing
71.
compositional testing
72.
computer aided testing
73.
cone heater testing
74.
conformance testing
75.
courses on electronic testing and design
76.
cybersecurity testing
77.
D. non-destructive testing
78.
deformation testing
79.
design field testing
80.
destructive testing
81.
eddy current testing
82.
eddy current testing (ECT)
83.
erosion testing
84.
fabric testing
85.
fatigue testing
86.
fire testing
87.
hierarchical testing
88.
hypotheses testing
89.
Implementation-Independent Testing of Microprocessors
90.
integration testing
91.
laboratory scale testing
92.
load testing
93.
macro mechanical testing and green surface tribology
94.
material testing
95.
materials testing
96.
measurement and testing
97.
mechanical testing
98.
memory testing
99.
metamorphic testing
100.
microprocessor testing
101.
model based testing
102.
model-based mutation testing
103.
model-based testing
104.
multi-scenario testing
105.
mutation testing
106.
network-testing
107.
non destructive testing
108.
nondestructive testing
109.
non-destructive testing
110.
non-destructive testing (NDT)
111.
On-site drug testing
112.
on-site testing
113.
pin on disc wear testing
114.
PMU calibration testing
115.
PMU testing
116.
point-of-care testing
117.
processor core testing
118.
processor testing
119.
real-time HiL testing
120.
regression testing
121.
RISC processor testing
122.
robustness testing
123.
safety and security testing
124.
scenario testing
125.
Scenario-Based Testing
126.
scratch testing
127.
secure online testing
128.
security testing
129.
shear testing
130.
small-scale fire testing
131.
software testing
132.
software-in-the-loop (SIL) testing
133.
stand-alone testing
134.
stress-testing
135.
substation testing methods
136.
system testing
137.
tensile testing
138.
testing
139.
testing methods
140.
testing of digital devices
141.
testing of generator
142.
testing of phasor measurement units
143.
two-dimensional array testing
144.
ultrasonic testing
145.
wafer testing
146.
wear testing
147.
well testing
148.
vibration testing
149.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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