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test reference year (võtmesõna)

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Kirjeid leitud 2
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Development of weighting factors for climate variables for selecting the energy reference year according to the EN ISO 15927-4 standardKalamees, Targo; Jylhä, Kirsti; Tietäväinen, Hanna; Jokisalo, Juha; Ilomets, Simo; Hyvönen, Reijo; Saku, SeppoEnergy and buildings2012 / p. 53-60 https://www.sciencedirect.com/science/article/abs/pii/S0378778811005779

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artikkel ajakirjas EST / artikkel ajakirjas ENG

New typical meteorological year generation method based on long-term building energy simulationsSeyed Salehi, Seyed Shahabaldin; Kalamees, Targo; Kurnitski, Jarek; Thalfeldt, MartinBuilding and environment2024 / art. 111504 https://doi.org/10.1016/j.buildenv.2024.111504 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

Kirjeid leitud 2, kuvan 1 - 2

1. test reference year
2. Common European Framework of Reference for Languages
3. digital reference
4. dq reference frame
5. European reference room
6. European Vertical Reference System (EVRS)
7. GNSS virtual reference station
8. gravity reference frame
9. height reference systems
10. HL7 Version 3: Reference Information Model (RIM)
11. model reference adaptive control
12. model reference controller
13. multi-loop model reference control
14. openEHR RM (Reference Model)
15. reference
16. reference architecture
17. reference architecture for global health data space
18. reference conditions
19. reference discovery
20. reference images
21. reference intervals
22. reference lakes
23. reference model
24. supply chain operations reference (SCOR)
25. supply chain operations reference (SCOR) model
26. synchronous reference frame theory
27. vertical reference
28. vertical reference datum
29. Vertical reference surface
30. accelerated shelf-life test
31. adaptive test strategy generation
32. antigen test
33. Applications in Test Engineering
34. ASTM G65 dry sand rubber wheel abrasion test
35. Automated Synthesis of Software-based Self-test
36. automated test environment
37. automated test pattern generation
38. automatic test case generation
39. automatic test pattern generation
40. automatic test program generation
41. Auvergne test-bed
42. battery test
43. behavioral test
44. behaviour level test generation
45. bending test
46. bit-error rate test
47. Board and System Test
48. board test
49. bounds test
50. built-in self-test
51. capillary condensation redistribution test
52. chi-square test
53. closed bottle test
54. cognitive screening test
55. compartment fire test
56. compartment test
57. cone penetration test (CPT)
58. COVID-19 antigen test
59. cutting test
60. cybersecurity test bed
61. DDR4 interconnect test
62. design and test
63. design-for-test
64. deterministic test sequences
65. diagnostic test
66. digital test
67. Digital test and testable design
68. double-pulse test
69. drawing test
70. dry droplet antimicrobial test
71. embedded test
72. fan pressurisation test
73. final test result prediction
74. four-point bending test
75. FPGA based test
76. FPGA-Assisted Test
77. FPGA-centric test
78. functional self-test
79. functional test generation
80. Granger causality test
81. hardness test
82. Hierarchical Multi-level Test Generation
83. high-level synthesis for test
84. high-level test data generation
85. highlevel test generation
86. high-speed serial link test
87. IEEE 9 bus test system
88. implementation-independent test generation
89. in situ tensile test in SEM
90. industrial field test
91. in-situ tensile test in SEM
92. Johansen cointegration test
93. Kolmogorov-Smirnov test
94. load test
95. logic built-in self-test
96. Luria alternating series test
97. Mann–Kendall test
98. Mann-Kendall trend test
99. memory interconnect test
100. microprocessor test
101. Model test
102. multiplier test
103. offline test generation
104. orthogonal test
105. package test analysis
106. parallel design and test
107. performance test
108. piezocone penetration test (CPTu)
109. Point Load Test index
110. pressurisation test
111. processor-centric board test
112. progressive damage test
113. provably correct test generation
114. pseudo-exhaustive test
115. purity test
116. real-time room temperature test
117. rolling thin film oven test
118. rtioco-based timed test sequences
119. seasonal Mann Kendall test
120. seismic piezocone penetration test
121. self-test
122. self-test architectures
123. sentence writing test
124. serial sevens test
125. ship towing test tank
126. similar material simulation test
127. small-scale fire test
128. small‐scale test
129. software based self-test
130. software-based self-test
131. software-based self-test (SBST)
132. soil phosphorus (P) test
133. standard test method
134. static load test
135. static-dynamic probing test (SDT)
136. stress test
137. system level test
138. teaching design and test of systems
139. tensile test
140. tensile test
141. test
142. test and evaluation platform
143. test automation
144. test bench
145. test coverage
146. test driven development
147. test driven modelling
148. test embankment
149. test equipment
150. test generation
151. test generation and fault diagnosis
152. Test Group Generation for Detecting Multiple Faults
153. test groups
154. test model design
155. test optimization
156. test packets
157. test path synthesis
158. test patterns
159. test point insertion
160. test program generation
161. test replication
162. test scenario description language
163. test-bed
164. test-chips
165. test-house
166. test-pattern
167. test-suite reduction
168. Three-point bending test
169. unit root test
170. usability platform test
171. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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