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built-in self-test (võtmesõna)
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1
artikkel kogumikus
At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers
2013
/
p. 1-6 : ill [USB]
artikkel kogumikus
2
artikkel kogumikus
Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
;
Wuttke, Heinz-Dietrich
International Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal
2007
/
[7] p. : ill. [CD-ROM]
http://icee2007.dei.uc.pt/proceedings/papers/429.pdf
artikkel kogumikus
3
artikkel ajakirjas
Functional self-test of high-performance pipe-lined signal processing architectures
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
Microprocessors and microsystems
2015
/
p. 909-918 : ill
http://dx.doi.org/10.1016/j.micpro.2014.11.002
artikkel ajakirjas
4
artikkel kogumikus EST
/
artikkel kogumikus ENG
Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
2018
/
5 p.: ill
https://doi.org/10.1109/ISCAS.2018.8350936
Conference proceedings at Scopus
Article at Scopus
Article at WOS
artikkel kogumikus EST
/
artikkel kogumikus ENG
5
artikkel kogumikus
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
artikkel kogumikus
6
artikkel kogumikus
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
artikkel kogumikus
7
artikkel kogumikus
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
artikkel kogumikus
Kirjeid leitud 7, kuvan
1 - 7
võtmesõna
227
1.
built-in self-test
2.
logic built-in self-test
3.
functional self-test
4.
self-test
5.
self-test architectures
6.
software based self-test
7.
software-based self-test
8.
software-based self-test (SBST)
9.
As-built
10.
built environment
11.
built environment and architecture
12.
built environment investment
13.
built environment skills needs
14.
built in moisture
15.
built-in moisture
16.
Built-in transformer (BIT)
17.
cultural built heritage
18.
sustainable built environment
19.
association of local-self government
20.
association of local-self governments
21.
corporate energy self-sufficiency
22.
diffusion and self-trapping of charge carriers
23.
digital self-determination
24.
digital self-efficacy
25.
digital self-interference cancellation
26.
European charter of local self-government
27.
European self-sovereign identity framework
28.
income of self-employed
29.
increased self-consumption
30.
local self-government
31.
nikel-based self-fluxing alloy
32.
NiP self-lubricating coating
33.
open self‐ventilated machines
34.
optical self-mixing
35.
OSV (open self‐ventilated) machines
36.
perceived general self-efficacy
37.
Self assessment tool
38.
self aware
39.
self learning software
40.
self learning system
41.
Self organization
42.
self organizing map
43.
self organizing network
44.
self regulating heating
45.
self regulation
46.
self-analysis
47.
self-assembled monolayers
48.
self-assembly
49.
self-assessed quality of life
50.
self-assessment
51.
self-assessment tool
52.
self-aware contracts
53.
self-aware systems
54.
self-awareness
55.
self-checking
56.
self-cleaning surfaces
57.
self-consumption
58.
self-costs
59.
self-defence
60.
self-determination
61.
self-determination theory
62.
self-determination theory of work motivation
63.
self-development
64.
self-driving car
65.
self-driving cars
66.
self-driving minibus
67.
self-driving vehicle
68.
self-driving vehicles
69.
self-efficacy
70.
self-employed
71.
self-employment
72.
self-evaluation
73.
self-fluxing alloy
74.
self-governance
75.
self-healing
76.
self-heating phenomenon
77.
self-identification
78.
self-identity
79.
self-improvement
80.
self-insurance
81.
self-learning
82.
self-lubrication
83.
self-management
84.
self‐management
85.
self-mixing
86.
self-organisation
87.
self-organised teams
88.
self-organization
89.
self-organized criticality
90.
self-organized teams
91.
self-perforating dowel
92.
self-propagating high temperature synthesized (SHS)
93.
Self-Propagating High-Temperature Synthesis
94.
self-propulsion
95.
self-regulated learning
96.
self-regulation
97.
self-reported musculoskeletal disorders
98.
self-rolling
99.
self-shading envelopes
100.
self-study
101.
self-study courses
102.
self-training
103.
social self-development
104.
accelerated shelf-life test
105.
adaptive test strategy generation
106.
antigen test
107.
ASTM G65 dry sand rubber wheel abrasion test
108.
automated test environment
109.
automated test pattern generation
110.
automatic test case generation
111.
automatic test pattern generation
112.
automatic test program generation
113.
Auvergne test-bed
114.
battery test
115.
behavioral test
116.
behaviour level test generation
117.
bending test
118.
bit-error rate test
119.
Board and System Test
120.
board test
121.
bounds test
122.
capillary condensation redistribution test
123.
chi-square test
124.
closed bottle test
125.
cognitive screening test
126.
compartment fire test
127.
compartment test
128.
cone penetration test (CPT)
129.
COVID-19 antigen test
130.
cutting test
131.
cybersecurity test bed
132.
DDR4 interconnect test
133.
design and test
134.
design-for-test
135.
deterministic test sequences
136.
diagnostic test
137.
digital test
138.
Digital test and testable design
139.
double-pulse test
140.
drawing test
141.
dry droplet antimicrobial test
142.
embedded test
143.
fan pressurisation test
144.
final test result prediction
145.
four-point bending test
146.
FPGA based test
147.
FPGA-Assisted Test
148.
FPGA-centric test
149.
functional test generation
150.
Granger causality test
151.
hardness test
152.
high-level synthesis for test
153.
high-level test data generation
154.
highlevel test generation
155.
high-speed serial link test
156.
IEEE 9 bus test system
157.
implementation-independent test generation
158.
in situ tensile test in SEM
159.
industrial field test
160.
in-situ tensile test in SEM
161.
Johansen cointegration test
162.
Kolmogorov-Smirnov test
163.
load test
164.
Luria alternating series test
165.
Mann–Kendall test
166.
memory interconnect test
167.
microprocessor test
168.
Model test
169.
multiplier test
170.
offline test generation
171.
orthogonal test
172.
package test analysis
173.
parallel design and test
174.
performance test
175.
piezocone penetration test (CPTu)
176.
Point Load Test index
177.
pressurisation test
178.
processor-centric board test
179.
progressive damage test
180.
provably correct test generation
181.
pseudo-exhaustive test
182.
purity test
183.
rtioco-based timed test sequences
184.
seasonal Mann Kendall test
185.
seismic piezocone penetration test
186.
sentence writing test
187.
serial sevens test
188.
ship towing test tank
189.
similar material simulation test
190.
small‐scale test
191.
soil phosphorus (P) test
192.
standard test method
193.
static load test
194.
static-dynamic probing test (SDT)
195.
stress test
196.
system level test
197.
teaching design and test of systems
198.
tensile test
199.
test
200.
test and evaluation platform
201.
test bench
202.
test coverage
203.
test driven development
204.
test driven modelling
205.
test embankment
206.
test equipment
207.
test generation
208.
test generation and fault diagnosis
209.
test groups
210.
test model design
211.
test optimization
212.
test packets
213.
test path synthesis
214.
test patterns
215.
test point insertion
216.
test program generation
217.
test reference year
218.
test replication
219.
test scenario description language
220.
test-bed
221.
test-chips
222.
test-house
223.
test-pattern
224.
test-suite reduction
225.
Three-point bending test
226.
unit root test
227.
1995 ECC benchmark test
märksõna
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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