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test generation (võtmesõna)
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1
artikkel kogumikus
Aspect-oriented testing of a rehabilitation system
Sarna, Külli
;
Vain, Jüri
VALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France
2014
/
p. 73-78 : ill
artikkel kogumikus
2
artikkel kogumikus
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
artikkel kogumikus
3
artikkel kogumikus
Exploiting aspects in model-based testing
Sarna, Külli
;
Vain, Jüri
FOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German
2012
/
p. 45-47 : ill
https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing
artikkel kogumikus
4
artikkel kogumikus EST
/
artikkel kogumikus ENG
GUARD: An ABC-GA hybrid approach utilizing mAchine LeaRning and dimensionality reduction for hardware Trojan detection
Hosseini, Mostafa
;
Azarpeyvand, Ali
;
Bagheri, Foad
;
Ghasempouri, Tara
2025 IEEE East-West Design & Test Symposium (EWDTS)
2025
/
8 p
http://doi.org/10.1109/EWDTS67441.2025.11303691
artikkel kogumikus EST
/
artikkel kogumikus ENG
5
artikkel kogumikus
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
artikkel kogumikus
6
artikkel kogumikus
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
artikkel kogumikus
7
artikkel kogumikus
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
artikkel kogumikus
8
artikkel kogumikus
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
artikkel kogumikus
9
artikkel kogumikus
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
artikkel kogumikus
10
artikkel kogumikus
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
artikkel kogumikus
11
artikkel kogumikus EST
/
artikkel kogumikus ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
artikkel kogumikus EST
/
artikkel kogumikus ENG
12
artikkel kogumikus EST
/
artikkel kogumikus ENG
PATROL: an evolutionary APproach to Automatic Test Pattern Generation for hardware TROjan detection leveraging PSO-GA hybrid techniques
Hosseini, Mostafa
;
Azarpeyvand, Ali
;
Ghasempouri, Tara
Proceedings of the 2024 IEEE 33rd Asian Test Symposium : ATS 2024 : Ahmedabad, India, 17-20 December 2024
2024
/
6 p.
https://doi.org/10.1109/ATS64447.2024.10915294
Conference proceedings at Scopus
Article at Scopus
Article at WOS
artikkel kogumikus EST
/
artikkel kogumikus ENG
13
artikkel kogumikus
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
artikkel kogumikus
14
artikkel kogumikus
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
artikkel kogumikus
15
artikkel kogumikus
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
artikkel kogumikus
16
artikkel kogumikus
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
artikkel kogumikus
Kirjeid leitud 16, kuvan
1 - 16
võtmesõna
222
1.
behaviour level test generation
2.
functional test generation
3.
Hierarchical Multi-level Test Generation
4.
highlevel test generation
5.
implementation-independent test generation
6.
offline test generation
7.
provably correct test generation
8.
test generation
9.
test generation and fault diagnosis
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
high-level test data generation
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
18.
Activity-based demand generation
19.
automated code generation
20.
automatic code generation
21.
Automatic generation control
22.
automatic GUI model generation
23.
building and urban form generation
24.
business model generation
25.
code generation
26.
data set generation
27.
decentralized key generation
28.
disaster alert generation
29.
distributed electricity generation
30.
distributed generation
31.
Distributed Generation (DG)
32.
distributed generation systems
33.
distributed power generation
34.
distrubuted power generation
35.
droplet generation
36.
droplet generation rate control
37.
electric power generation
38.
electricity generation
39.
energy generation
40.
extreme penetration level of non synchronous generation
41.
feasible path generation
42.
fifth generation computer
43.
food waste generation
44.
fourth generation district heating
45.
frequent item generation
46.
generation
47.
generation and transmission expansion planning
48.
Generation Costs
49.
generation of electric energy
50.
generation scheduling
51.
generation succession
52.
heat generation
53.
hydroelectric power generation
54.
hydrogen generation
55.
I–III generation
56.
job generation
57.
knowledge generation
58.
multisine generation
59.
next generation 4D printing
60.
next generation sequencing
61.
Next-generation probiotics
62.
next-generation sequencing
63.
oil-shale power generation
64.
pattern Generation
65.
photovoltaic (PV) generation
66.
photovoltaic generation dispatch
67.
power generation
68.
power generation dispatch
69.
power generation economics
70.
power generation planning
71.
PV generation
72.
PV power generation
73.
Renewable energy generation
74.
renewable generation
75.
residual generation
76.
rule generation
77.
Second generation bioethanol
78.
second generation of tribology models
79.
second generation sequencing
80.
signal generation
81.
silver generation
82.
sixth-generation (6G)
83.
solar power generation
84.
space generation advisory council
85.
template based sql generation
86.
trajectory generation
87.
waste generation
88.
wave generation
89.
white light generation
90.
wind energy generation
91.
wind generation
92.
wind power generation
93.
16S rRNA gene amplicon next-generation sequencing
94.
4GDH (4th generation district heating)
95.
4th generation district heating
96.
5th generation district heating
97.
accelerated shelf-life test
98.
antigen test
99.
Applications in Test Engineering
100.
ASTM G65 dry sand rubber wheel abrasion test
101.
Automated Synthesis of Software-based Self-test
102.
automated test environment
103.
Auvergne test-bed
104.
battery test
105.
behavioral test
106.
bending test
107.
bit-error rate test
108.
Board and System Test
109.
board test
110.
bounds test
111.
built-in self-test
112.
capillary condensation redistribution test
113.
chi-square test
114.
closed bottle test
115.
cognitive screening test
116.
compartment fire test
117.
compartment test
118.
cone penetration test (CPT)
119.
COVID-19 antigen test
120.
cutting test
121.
cybersecurity test bed
122.
DDR4 interconnect test
123.
design and test
124.
design-for-test
125.
deterministic test sequences
126.
diagnostic test
127.
digital test
128.
Digital test and testable design
129.
double-pulse test
130.
drawing test
131.
dry droplet antimicrobial test
132.
embedded test
133.
fan pressurisation test
134.
final test result prediction
135.
four-point bending test
136.
FPGA based test
137.
FPGA-Assisted Test
138.
FPGA-centric test
139.
functional self-test
140.
Granger causality test
141.
hardness test
142.
high-level synthesis for test
143.
high-speed serial link test
144.
IEEE 9 bus test system
145.
in situ tensile test in SEM
146.
industrial field test
147.
in-situ tensile test in SEM
148.
Johansen cointegration test
149.
Kolmogorov-Smirnov test
150.
load test
151.
logic built-in self-test
152.
Luria alternating series test
153.
Mann–Kendall test
154.
Mann-Kendall trend test
155.
memory interconnect test
156.
microprocessor test
157.
Model test
158.
multiplier test
159.
orthogonal test
160.
package test analysis
161.
parallel design and test
162.
performance test
163.
piezocone penetration test (CPTu)
164.
Point Load Test index
165.
pressurisation test
166.
processor-centric board test
167.
progressive damage test
168.
pseudo-exhaustive test
169.
purity test
170.
real-time room temperature test
171.
rolling thin film oven test
172.
rtioco-based timed test sequences
173.
seasonal Mann Kendall test
174.
seismic piezocone penetration test
175.
self-test
176.
self-test architectures
177.
sentence writing test
178.
serial sevens test
179.
ship towing test tank
180.
similar material simulation test
181.
small-scale fire test
182.
small‐scale test
183.
software based self-test
184.
software-based self-test
185.
software-based self-test (SBST)
186.
soil phosphorus (P) test
187.
standard test method
188.
static load test
189.
static-dynamic probing test (SDT)
190.
stress test
191.
system level test
192.
teaching design and test of systems
193.
tensile test
194.
tensile test
195.
test
196.
test and evaluation platform
197.
test automation
198.
test bench
199.
test coverage
200.
test driven development
201.
test driven modelling
202.
test embankment
203.
test equipment
204.
test groups
205.
test model design
206.
test optimization
207.
test packets
208.
test path synthesis
209.
test patterns
210.
test point insertion
211.
test reference year
212.
test replication
213.
test scenario description language
214.
test-bed
215.
test-chips
216.
test-house
217.
test-pattern
218.
test-suite reduction
219.
Three-point bending test
220.
unit root test
221.
usability platform test
222.
1995 ECC benchmark test
märksõna
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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