Otsing - TalTech teadusportaal

Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English

Publikatsioonid

Publikatsioonid

Otsing

Valitud kirjed 0

test generation (võtmesõna)

—

—

—

—

Lisa tingimus Liitotsing filter

Tühista

teaviku laadid

raamat ..

artikkel ajakirjas ..

artikkel ajalehes ..

artikkel kogumikus ..

dissertatsioon ..

Open Access ..

Teaduspublikatsioon ..

aasta

Toon andmeid..

Toon andmeid..

TTÜ struktuuriüksus

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Tühista

Kirjeid leitud 14
Vaata veel.. (2/209)
Ekspordi

ekspordi kõik päringu tulemused (14)
Salvesta TXT fail

Salvesta PDF fail

prindi
Märgitud kirjetega toimetamiseks ava valitud kirjed

kuva

reasta
1

artikkel kogumikus

Aspect-oriented testing of a rehabilitation systemSarna, Külli; Vain, JüriVALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France2014 / p. 73-78 : ill

artikkel kogumikus
2

artikkel kogumikus

At-speed functional built-in self-test methodology for processors [Electronic resource]Ubar, Raimund-Johannes; Indus, Viljar; Kalmend, OliverProceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka2012 / p. 168-172 : ill [CD-ROM]

artikkel kogumikus
3

artikkel kogumikus

Exploiting aspects in model-based testingSarna, Külli; Vain, JüriFOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German2012 / p. 45-47 : ill https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing

artikkel kogumikus
4

artikkel kogumikus

High-level test data generation for software based self-test in microprocessorsOyeniran, Adeboye Stephen; Jasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 20172017 / p. 86-91 : ill https://doi.org/10.1109/MECO.2017.7977167

artikkel kogumikus
5

artikkel kogumikus

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

artikkel kogumikus
6

artikkel kogumikus

Implementation-independent functional test for transition delay faults in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia2020 / p. 646-650 https://doi.org/10.1109/DSD51259.2020.00105

artikkel kogumikus
7

artikkel kogumikus

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

artikkel kogumikus
8

artikkel kogumikus

Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287

artikkel kogumikus
9

artikkel kogumikus

A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915

artikkel kogumikus
10

artikkel kogumikus EST / artikkel kogumikus ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG
11

artikkel kogumikus

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

artikkel kogumikus
12

artikkel kogumikus

Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

artikkel kogumikus
13

artikkel kogumikus

Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p

artikkel kogumikus
14

artikkel kogumikus

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

artikkel kogumikus

Kirjeid leitud 14, kuvan 1 - 14

1. behaviour level test generation
2. functional test generation
3. highlevel test generation
4. implementation-independent test generation
5. offline test generation
6. provably correct test generation
7. test generation
8. test generation and fault diagnosis
9. adaptive test strategy generation
10. automated test pattern generation
11. automatic test case generation
12. automatic test pattern generation
13. automatic test program generation
14. high-level test data generation
15. test program generation
16. Activity-based demand generation
17. automatic code generation
18. Automatic generation control
19. automatic GUI model generation
20. building and urban form generation
21. business model generation
22. code generation
23. data set generation
24. decentralized key generation
25. disaster alert generation
26. distributed electricity generation
27. distributed generation
28. Distributed Generation (DG)
29. distributed generation systems
30. distributed power generation
31. distrubuted power generation
32. droplet generation
33. droplet generation rate control
34. electric power generation
35. electricity generation
36. energy generation
37. extreme penetration level of non synchronous generation
38. feasible path generation
39. fifth generation computer
40. fourth generation district heating
41. frequent item generation
42. generation
43. generation and transmission expansion planning
44. Generation Costs
45. generation of electric energy
46. generation succession
47. heat generation
48. hydroelectric power generation
49. hydrogen generation
50. I–III generation
51. job generation
52. multisine generation
53. next generation 4D printing
54. next generation sequencing
55. Next-generation probiotics
56. next-generation sequencing
57. oil-shale power generation
58. pattern Generation
59. photovoltaic (PV) generation
60. photovoltaic generation dispatch
61. power generation
62. power generation dispatch
63. power generation economics
64. power generation planning
65. PV generation
66. PV power generation
67. Renewable energy generation
68. renewable generation
69. residual generation
70. Second generation bioethanol
71. second generation of tribology models
72. second generation sequencing
73. signal generation
74. silver generation
75. solar power generation
76. space generation advisory council
77. template based sql generation
78. trajectory generation
79. waste generation
80. wave generation
81. white light generation
82. wind energy generation
83. wind generation
84. wind power generation
85. 16S rRNA gene amplicon next-generation sequencing
86. 4GDH (4th generation district heating)
87. 4th generation district heating
88. 5th generation district heating
89. accelerated shelf-life test
90. antigen test
91. ASTM G65 dry sand rubber wheel abrasion test
92. automated test environment
93. Auvergne test-bed
94. battery test
95. behavioral test
96. bending test
97. bit-error rate test
98. Board and System Test
99. board test
100. bounds test
101. built-in self-test
102. capillary condensation redistribution test
103. chi-square test
104. closed bottle test
105. cognitive screening test
106. compartment fire test
107. compartment test
108. cone penetration test (CPT)
109. COVID-19 antigen test
110. cutting test
111. cybersecurity test bed
112. DDR4 interconnect test
113. design and test
114. design-for-test
115. deterministic test sequences
116. diagnostic test
117. digital test
118. Digital test and testable design
119. double-pulse test
120. drawing test
121. dry droplet antimicrobial test
122. embedded test
123. fan pressurisation test
124. final test result prediction
125. four-point bending test
126. FPGA based test
127. FPGA-Assisted Test
128. FPGA-centric test
129. functional self-test
130. Granger causality test
131. hardness test
132. high-level synthesis for test
133. high-speed serial link test
134. IEEE 9 bus test system
135. in situ tensile test in SEM
136. industrial field test
137. in-situ tensile test in SEM
138. Johansen cointegration test
139. Kolmogorov-Smirnov test
140. load test
141. logic built-in self-test
142. Luria alternating series test
143. Mann–Kendall test
144. memory interconnect test
145. microprocessor test
146. Model test
147. multiplier test
148. orthogonal test
149. package test analysis
150. parallel design and test
151. performance test
152. piezocone penetration test (CPTu)
153. Point Load Test index
154. pressurisation test
155. processor-centric board test
156. progressive damage test
157. pseudo-exhaustive test
158. purity test
159. rtioco-based timed test sequences
160. seasonal Mann Kendall test
161. seismic piezocone penetration test
162. self-test
163. self-test architectures
164. sentence writing test
165. serial sevens test
166. ship towing test tank
167. similar material simulation test
168. small-scale fire test
169. small‐scale test
170. software based self-test
171. software-based self-test
172. software-based self-test (SBST)
173. soil phosphorus (P) test
174. standard test method
175. static load test
176. static-dynamic probing test (SDT)
177. stress test
178. system level test
179. teaching design and test of systems
180. tensile test
181. test
182. test and evaluation platform
183. test automation
184. test bench
185. test coverage
186. test driven development
187. test driven modelling
188. test embankment
189. test equipment
190. test groups
191. test model design
192. test optimization
193. test packets
194. test path synthesis
195. test patterns
196. test point insertion
197. test reference year
198. test replication
199. test scenario description language
200. test-bed
201. test-chips
202. test-house
203. test-pattern
204. test-suite reduction
205. Three-point bending test
206. unit root test
207. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

vaste

reasta

Otsing
Valikud 0

ilmumisaasta

autor

TTÜ struktuuriüksus

märksõna

seeria-sari

tema kohta

võtmesõna

TalTech Raamatukogu

Akadeemia tee 1

13519

TalTech koduleht TalTech Raamatukogu koduleht Digikogu Digiteek Teadusandmed

6203551

data@taltech.ee

TalTech Raamatukogu