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board test (võtmesõna)

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Kirjeid leitud 2
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A new FPGA-based detection method for spurious variations in PCBA power distribution networkOdintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 6 p. : ill https://doi.org/10.1109/DDECS.2019.8724662

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Re-using chip level DFT at board levelGu, Xinli; Jutman, ArturProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p https://www.academia.edu/25351525/Re_using_chip_level_DFT_at_board_level

artikkel kogumikus

Kirjeid leitud 2, kuvan 1 - 2

1. board test
2. processor-centric board test
3. Board and System Test
4. across-the-board cuts
5. board
6. board composition
7. board diagnosis
8. board diversity
9. board of directors
10. Estonian Police and Border Guard Board (PPA)
11. laminate embedded printed circuit board
12. off-board charger
13. off-board charger (OBC)
14. off-board chargers
15. on-board charger (OBC)
16. on-board chargers
17. processor-centric board
18. single board computer
19. single-board computer
20. accelerated shelf-life test
21. adaptive test strategy generation
22. antigen test
23. Applications in Test Engineering
24. ASTM G65 dry sand rubber wheel abrasion test
25. Automated Synthesis of Software-based Self-test
26. automated test environment
27. automated test pattern generation
28. automatic test case generation
29. automatic test pattern generation
30. automatic test program generation
31. Auvergne test-bed
32. battery test
33. behavioral test
34. behaviour level test generation
35. bending test
36. bit-error rate test
37. bounds test
38. built-in self-test
39. capillary condensation redistribution test
40. chi-square test
41. closed bottle test
42. cognitive screening test
43. compartment fire test
44. compartment test
45. cone penetration test (CPT)
46. COVID-19 antigen test
47. cutting test
48. cybersecurity test bed
49. DDR4 interconnect test
50. design and test
51. design-for-test
52. deterministic test sequences
53. diagnostic test
54. digital test
55. Digital test and testable design
56. double-pulse test
57. drawing test
58. dry droplet antimicrobial test
59. embedded test
60. fan pressurisation test
61. final test result prediction
62. four-point bending test
63. FPGA based test
64. FPGA-Assisted Test
65. FPGA-centric test
66. functional self-test
67. functional test generation
68. Granger causality test
69. hardness test
70. Hierarchical Multi-level Test Generation
71. high-level synthesis for test
72. high-level test data generation
73. highlevel test generation
74. high-speed serial link test
75. IEEE 9 bus test system
76. implementation-independent test generation
77. in situ tensile test in SEM
78. industrial field test
79. in-situ tensile test in SEM
80. Johansen cointegration test
81. Kolmogorov-Smirnov test
82. load test
83. logic built-in self-test
84. Luria alternating series test
85. Mann–Kendall test
86. Mann-Kendall trend test
87. memory interconnect test
88. microprocessor test
89. Model test
90. multiplier test
91. offline test generation
92. orthogonal test
93. package test analysis
94. parallel design and test
95. performance test
96. piezocone penetration test (CPTu)
97. Point Load Test index
98. pressurisation test
99. progressive damage test
100. provably correct test generation
101. pseudo-exhaustive test
102. purity test
103. rolling thin film oven test
104. rtioco-based timed test sequences
105. seasonal Mann Kendall test
106. seismic piezocone penetration test
107. self-test
108. self-test architectures
109. sentence writing test
110. serial sevens test
111. ship towing test tank
112. similar material simulation test
113. small-scale fire test
114. small‐scale test
115. software based self-test
116. software-based self-test
117. software-based self-test (SBST)
118. soil phosphorus (P) test
119. standard test method
120. static load test
121. static-dynamic probing test (SDT)
122. stress test
123. system level test
124. teaching design and test of systems
125. tensile test
126. tensile test
127. test
128. test and evaluation platform
129. test automation
130. test bench
131. test coverage
132. test driven development
133. test driven modelling
134. test embankment
135. test equipment
136. test generation
137. test generation and fault diagnosis
138. Test Group Generation for Detecting Multiple Faults
139. test groups
140. test model design
141. test optimization
142. test packets
143. test path synthesis
144. test patterns
145. test point insertion
146. test program generation
147. test reference year
148. test replication
149. test scenario description language
150. test-bed
151. test-chips
152. test-house
153. test-pattern
154. test-suite reduction
155. Three-point bending test
156. unit root test
157. usability platform test
158. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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