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board test (võtmesõna)

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A new FPGA-based detection method for spurious variations in PCBA power distribution networkOdintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 6 p. : ill https://doi.org/10.1109/DDECS.2019.8724662

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Re-using chip level DFT at board levelGu, Xinli; Jutman, ArturProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p

artikkel kogumikus

Kirjeid leitud 2, kuvan 1 - 2

1. board test
2. processor-centric board test
3. Board and System Test
4. board
5. board composition
6. board diagnosis
7. board diversity
8. board of directors
9. Estonian Police and Border Guard Board (PPA)
10. laminate embedded printed circuit board
11. off-board charger
12. off-board charger (OBC)
13. off-board chargers
14. on-board charger (OBC)
15. on-board chargers
16. processor-centric board
17. single board computer
18. single-board computer
19. accelerated shelf-life test
20. adaptive test strategy generation
21. antigen test
22. ASTM G65 dry sand rubber wheel abrasion test
23. automated test environment
24. automated test pattern generation
25. automatic test case generation
26. automatic test pattern generation
27. automatic test program generation
28. Auvergne test-bed
29. battery test
30. behavioral test
31. behaviour level test generation
32. bending test
33. bit-error rate test
34. bounds test
35. built-in self-test
36. capillary condensation redistribution test
37. chi-square test
38. closed bottle test
39. cognitive screening test
40. compartment fire test
41. compartment test
42. cone penetration test (CPT)
43. COVID-19 antigen test
44. cutting test
45. cybersecurity test bed
46. DDR4 interconnect test
47. design and test
48. design-for-test
49. deterministic test sequences
50. diagnostic test
51. digital test
52. Digital test and testable design
53. double-pulse test
54. drawing test
55. dry droplet antimicrobial test
56. embedded test
57. fan pressurisation test
58. final test result prediction
59. four-point bending test
60. FPGA based test
61. FPGA-Assisted Test
62. FPGA-centric test
63. functional self-test
64. functional test generation
65. Granger causality test
66. hardness test
67. high-level synthesis for test
68. high-level test data generation
69. highlevel test generation
70. high-speed serial link test
71. IEEE 9 bus test system
72. implementation-independent test generation
73. in situ tensile test in SEM
74. industrial field test
75. in-situ tensile test in SEM
76. Johansen cointegration test
77. Kolmogorov-Smirnov test
78. load test
79. logic built-in self-test
80. Luria alternating series test
81. Mann–Kendall test
82. memory interconnect test
83. microprocessor test
84. Model test
85. multiplier test
86. offline test generation
87. orthogonal test
88. package test analysis
89. parallel design and test
90. performance test
91. piezocone penetration test (CPTu)
92. Point Load Test index
93. pressurisation test
94. progressive damage test
95. provably correct test generation
96. pseudo-exhaustive test
97. purity test
98. rolling thin film oven test
99. rtioco-based timed test sequences
100. seasonal Mann Kendall test
101. seismic piezocone penetration test
102. self-test
103. self-test architectures
104. sentence writing test
105. serial sevens test
106. ship towing test tank
107. similar material simulation test
108. small-scale fire test
109. small‐scale test
110. software based self-test
111. software-based self-test
112. software-based self-test (SBST)
113. soil phosphorus (P) test
114. standard test method
115. static load test
116. static-dynamic probing test (SDT)
117. stress test
118. system level test
119. teaching design and test of systems
120. tensile test
121. test
122. test and evaluation platform
123. test automation
124. test bench
125. test coverage
126. test driven development
127. test driven modelling
128. test embankment
129. test equipment
130. test generation
131. test generation and fault diagnosis
132. test groups
133. test model design
134. test optimization
135. test packets
136. test path synthesis
137. test patterns
138. test point insertion
139. test program generation
140. test reference year
141. test replication
142. test scenario description language
143. test-bed
144. test-chips
145. test-house
146. test-pattern
147. test-suite reduction
148. Three-point bending test
149. unit root test
150. usability platform test
151. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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