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International Test Conference (kirjastus/väljaandja)

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Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

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FPGA-based synthetic instrumentation for board testAleksejev, Igor; Jutman, Artur; Devadze, Sergei; Odintsov, Sergei; Wenzel, ThomasProceedings : International Test Conference 20122012 / p. 1-10 : ill https://ieeexplore.ieee.org/document/6401571

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Kirjeid leitud 2, kuvan 1 - 2

1. 24th IEEE International Conference on Industrial Technology 2023
2. international relations and international political economy
3. accelerated shelf-life test
4. adaptive test strategy generation
5. antigen test
6. Applications in Test Engineering
7. ASTM G65 dry sand rubber wheel abrasion test
8. Automated Synthesis of Software-based Self-test
9. automated test environment
10. automated test pattern generation
11. automatic test case generation
12. automatic test pattern generation
13. automatic test program generation
14. Auvergne test-bed
15. battery test
16. behavioral test
17. behaviour level test generation
18. bending test
19. bit-error rate test
20. Board and System Test
21. board test
22. bounds test
23. built-in self-test
24. capillary condensation redistribution test
25. chi-square test
26. closed bottle test
27. cognitive screening test
28. compartment fire test
29. compartment test
30. cone penetration test (CPT)
31. COVID-19 antigen test
32. cutting test
33. cybersecurity test bed
34. DDR4 interconnect test
35. design and test
36. design-for-test
37. deterministic test sequences
38. diagnostic test
39. digital test
40. Digital test and testable design
41. double-pulse test
42. drawing test
43. dry droplet antimicrobial test
44. embedded test
45. fan pressurisation test
46. final test result prediction
47. four-point bending test
48. FPGA based test
49. FPGA-Assisted Test
50. FPGA-centric test
51. functional self-test
52. functional test generation
53. Granger causality test
54. hardness test
55. Hierarchical Multi-level Test Generation
56. high-level synthesis for test
57. high-level test data generation
58. highlevel test generation
59. high-speed serial link test
60. IEEE 9 bus test system
61. implementation-independent test generation
62. in situ tensile test in SEM
63. industrial field test
64. in-situ tensile test in SEM
65. Johansen cointegration test
66. Kolmogorov-Smirnov test
67. load test
68. logic built-in self-test
69. Luria alternating series test
70. Mann–Kendall test
71. Mann-Kendall trend test
72. memory interconnect test
73. microprocessor test
74. Model test
75. multiplier test
76. offline test generation
77. orthogonal test
78. package test analysis
79. parallel design and test
80. performance test
81. piezocone penetration test (CPTu)
82. Point Load Test index
83. pressurisation test
84. processor-centric board test
85. progressive damage test
86. provably correct test generation
87. pseudo-exhaustive test
88. purity test
89. real-time room temperature test
90. rolling thin film oven test
91. rtioco-based timed test sequences
92. seasonal Mann Kendall test
93. seismic piezocone penetration test
94. self-test
95. self-test architectures
96. sentence writing test
97. serial sevens test
98. ship towing test tank
99. similar material simulation test
100. small-scale fire test
101. small‐scale test
102. software based self-test
103. software-based self-test
104. software-based self-test (SBST)
105. soil phosphorus (P) test
106. standard test method
107. static load test
108. static-dynamic probing test (SDT)
109. stress test
110. system level test
111. teaching design and test of systems
112. tensile test
113. tensile test
114. test
115. test and evaluation platform
116. test automation
117. test bench
118. test coverage
119. test driven development
120. test driven modelling
121. test embankment
122. test equipment
123. test generation
124. test generation and fault diagnosis
125. Test Group Generation for Detecting Multiple Faults
126. test groups
127. test model design
128. test optimization
129. test packets
130. test path synthesis
131. test patterns
132. test point insertion
133. test program generation
134. test reference year
135. test replication
136. test scenario description language
137. test-bed
138. test-chips
139. test-house
140. test-pattern
141. test-suite reduction
142. Three-point bending test
143. unit root test
144. usability platform test
145. 1995 ECC benchmark test

1. International Baltic conference on engineering materials and tribology (24 : 2015 : Tallinn)
2. European Test Symposium (ETS)
3. 16PF (test)
4. Danube Adria Association for Automation and Manufacturing. International conference

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