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16PF (test) (märksõna)

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Küsimustik 16 PF1993 https://www.ester.ee/record=b1065014*est

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Küsimustik 16 PF1992 https://www.ester.ee/record=b1062546*est

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Kirjeid leitud 2, kuvan 1 - 2

1. accelerated shelf-life test
2. adaptive test strategy generation
3. antigen test
4. Applications in Test Engineering
5. ASTM G65 dry sand rubber wheel abrasion test
6. Automated Synthesis of Software-based Self-test
7. automated test environment
8. automated test pattern generation
9. automatic test case generation
10. automatic test pattern generation
11. automatic test program generation
12. Auvergne test-bed
13. battery test
14. behavioral test
15. behaviour level test generation
16. bending test
17. bit-error rate test
18. Board and System Test
19. board test
20. bounds test
21. built-in self-test
22. capillary condensation redistribution test
23. chi-square test
24. closed bottle test
25. cognitive screening test
26. compartment fire test
27. compartment test
28. cone penetration test (CPT)
29. COVID-19 antigen test
30. cutting test
31. cybersecurity test bed
32. DDR4 interconnect test
33. design and test
34. design-for-test
35. deterministic test sequences
36. diagnostic test
37. digital test
38. Digital test and testable design
39. double-pulse test
40. drawing test
41. dry droplet antimicrobial test
42. embedded test
43. fan pressurisation test
44. final test result prediction
45. four-point bending test
46. FPGA based test
47. FPGA-Assisted Test
48. FPGA-centric test
49. functional self-test
50. functional test generation
51. Granger causality test
52. hardness test
53. Hierarchical Multi-level Test Generation
54. high-level synthesis for test
55. high-level test data generation
56. highlevel test generation
57. high-speed serial link test
58. IEEE 9 bus test system
59. implementation-independent test generation
60. in situ tensile test in SEM
61. industrial field test
62. in-situ tensile test in SEM
63. Johansen cointegration test
64. Kolmogorov-Smirnov test
65. load test
66. logic built-in self-test
67. Luria alternating series test
68. Mann–Kendall test
69. Mann-Kendall trend test
70. memory interconnect test
71. microprocessor test
72. Model test
73. multiplier test
74. offline test generation
75. orthogonal test
76. package test analysis
77. parallel design and test
78. performance test
79. piezocone penetration test (CPTu)
80. Point Load Test index
81. pressurisation test
82. processor-centric board test
83. progressive damage test
84. provably correct test generation
85. pseudo-exhaustive test
86. purity test
87. real-time room temperature test
88. rolling thin film oven test
89. rtioco-based timed test sequences
90. seasonal Mann Kendall test
91. seismic piezocone penetration test
92. self-test
93. self-test architectures
94. sentence writing test
95. serial sevens test
96. ship towing test tank
97. similar material simulation test
98. small-scale fire test
99. small‐scale test
100. software based self-test
101. software-based self-test
102. software-based self-test (SBST)
103. soil phosphorus (P) test
104. standard test method
105. static load test
106. static-dynamic probing test (SDT)
107. stress test
108. system level test
109. teaching design and test of systems
110. tensile test
111. tensile test
112. test
113. test and evaluation platform
114. test automation
115. test bench
116. test coverage
117. test driven development
118. test driven modelling
119. test embankment
120. test equipment
121. test generation
122. test generation and fault diagnosis
123. Test Group Generation for Detecting Multiple Faults
124. test groups
125. test model design
126. test optimization
127. test packets
128. test path synthesis
129. test patterns
130. test point insertion
131. test program generation
132. test reference year
133. test replication
134. test scenario description language
135. test-bed
136. test-chips
137. test-house
138. test-pattern
139. test-suite reduction
140. Three-point bending test
141. unit root test
142. usability platform test
143. 1995 ECC benchmark test

1. 16PF (test)
2. European Test Symposium (ETS)

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