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Fujiwara, Hideo (author)
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1
journal article
An approach for verification assertions reuse 2 in RTL test pattern generation
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
;
Fujiwara, Hideo
Journal of Shanghai Normal University : Natural Sciences
2010
/
p. 441-447 : ill
https://www.researchgate.net/publication/240613999_An_Approach_for_Verification_Assertions_Reuse_in_RTL_Test_Pattern_Generation
journal article
2
book article
An approach for verification assertions reuse in RTL test pattern generation
Jenihhin, Maksim
;
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
Digest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China
2010
/
p. 107-110 : ill
book article
3
book article
Constraint-based hierarchical untestability identification for synchronous sequential circuits
Raik, Jaan
;
Rannaste, Anna
;
Jenihhin, Maksim
;
Viilukas, Taavi
;
Ubar, Raimund-Johannes
;
Fujiwara, Hideo
Sixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim
2011
/
p. 147-152
book article
4
book article
Constraint-based hierarchical untestability identification for syncronous sequential circuits
Viilukas, Taavi
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Rannaste, Anna
;
Jenihhin, Maksim
;
Fujiwara, Hideo
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 139-142 : ill
book article
5
journal article
Identifying untestable faults in sequential circuits using test path constraints
Viilukas, Taavi
;
Karputkin, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Fujiwara, Hideo
Journal of electronic testing : theory and applications (JETTA)
2012
/
p. 511-521 : ill
journal article
6
book article
RT-level identification of potentially testable initialization faults
Raik, Jaan
;
Fujiwara, Hideo
;
Krivenko, Anna
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan
2008
/
[6] p
https://www.researchgate.net/publication/234032548_RT-level_identification_of_potentially_testable_initialization_faults
book article
7
book article
Untestable fault identification in sequential circuits using model-checking
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
Proceedings of the 17th Asian Test Symposium ATS 2008 : November 24-27, 2008, Sapporo, Japan
2008
/
p. 21-26 : ill
http://dx.doi.org/10.1109/ATS.2008.22
book article
8
book article
Untestable fault identification in sequential circuits using model-checking
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium
2011
/
p. 257-262 : ill
https://ieeexplore.ieee.org/document/4711554
book article
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Fujiwara, Hideo
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