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Schottky barjäär (subject term)
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1
book article EST
/
book article ENG
Analysis of barrier inhomogeneities of P-type Al/4H-SiC Schottky barrier diodes
Ziko, Mehadi Hasan
;
Koel, Ants
;
Rang, Toomas
;
Toompuu, Jana
Silicon Carbide and Related Materials 2019 : Selected peer-reviewed papers from International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019), September 29 - October 4, 2019, Kyoto, Japan
Materials science forum
2020
/
p. 960-972
https://doi.org/10.4028/www.scientific.net/MSF.1004.960
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
2
book article
Analysis of the basic Schottky parameters for diffusion-welded aluminium contacts to p- and n-type SiC
Korolkov, Oleg
;
Ljutov, Jevgeni
;
Kuznetsova, Natalja
;
Ruut, Jana
;
Rang, Toomas
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 51-53 : ill
book article
3
dissertation
Characterization of Interfaces Between the Metal Film and Silicon Carbide Semiconductor = Metallkontakti ja ränikarbiidi vahelise liidespinna karakteriseerimine
Ziko, Mehadi Hasan
2021
https://digikogu.taltech.ee/et/Item/34be534c-63e8-4013-b271-eaf1a7cb22e7
https://www.ester.ee/record=b5471196*est
https://doi.org/10.23658/taltech.52/2021
dissertation
4
book article
Charge carrier transport in SiC Schottky interfaces : shape factor approach
Kurel, Raido
;
Rang, Toomas
;
Rang, Galina
;
Kasemaa, Argo
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 87-90 : ill
book article
5
book article
Clamp mode package diffusion welded power SiC Schottky diodes
Korolkov, Oleg
;
Kuznetsova, Natalja
;
Rang, Toomas
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 55-58 : ill
book article
6
book article
Comparative characteristics of diffusion-welded high-voltage stacks and connected in series Schottky diodes
Sleptšuk, Natalja
;
Korolkov, Oleg
;
Land, Raul
;
Toompuu, Jana
;
Annus, Paul
;
Rang, Toomas
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
2016
/
p. 39-42 : ill
http://www.ester.ee/record=b2150914*est
book article
7
book article
Comparison of Schottky parameters for diffusion-welded and sputter contacts to silicon carbide
Kuznetsova, Natalja
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 162-165 : ill
book article
8
journal article
Computer aided simulation of power Scottky Diodes
Rang, Toomas
;
Koel, Ants
;
Udal, Andres
Modeling, Simulation and Control
1985
/
p. 1-13
journal article
9
book article
Current crowding phenomenon in JBC structures
Rang, Toomas
;
Kurel, Raido
;
Higelin, G.
;
Poirier, Laurent
Computer Methods and Experimental Measurements for Surface Effects and Contact Mechanics VII
2005
/
p. 387-396
https://www.witpress.com/elibrary/wit-transactions-on-engineering-sciences/49/15383
book article
10
book article
Degradation of 600-V 4H-SiC Schottky diodes under irradiation with 0.9 MeV electrons
Lebedev, Alexander A.
;
Davidovskaja, Klavdia
;
Kozlovski, Vitali V.
;
Korolkov, Oleg
;
Sleptšuk, Natalja
;
Toompuu, Jana
Silicon Carbide and Related Materials 2016 : selected, peer reviewed papers from the 11th European Conference on Silicon Carbide and Related Materials 2016 (ECSCRM 2016), September 25-29, 2016, Halkidiki, Greece
2017
/
p. 447-450 : ill
https://doi.org/10.4028/www.scientific.net/MSF.897.447
book article
11
book article
Degragation of 600-V 4H-SiC Schottky diodes under irradation with 0,9 MeV electrons
Lebedev, Alexander A.
;
Davydovskaja, K. S.
;
Kozlovski, Vitali V.
;
Korolkov, Oleg
;
Sleptšuk, Natalja
;
Toompuu, Jana
11th European Conference on Silicon Carbide and Related Materials : September 25-29, 2016, Porto Carras Grand Resort, Halkidiki, Greece : [poster session]
2016
/
p. 49
book article
12
book article
Diffusion welding techniques for power SiC Schottky packaging
Korolkov, Oleg
;
Rang, Toomas
;
Syrkin, A.
;
Dmitriev, V.
Silicon carbide and related materials 2005
2006
/
p. 919-922
book article
13
book article
Diffusion welding techniques for power SiC Schottky packaging
Korolkov, Oleg
;
Rang, Toomas
;
Syrkin, A.
;
Dmitriev, V.
Final programm of the 12th International Conference on Silicon Carbide and Related Materials : ICSCRM2005 : Pittsburgh, PA, USA
2005
/
p. 71
book article
14
dissertation
Formation of Diffusion welded Al contacts to semiconductor silicon carbide
Korolkov, Oleg
2004
dissertation
15
book article
High voltage diffusion‐welded stacks on the basis of SiC Schottky diodes
Korolkov, Oleg
;
Sleptšuk, Natalja
;
Annus, Paul
;
Land, Raul
;
Rang, Toomas
ICSRM 2015 : program guide
2015
/
p. 73
book article
16
book article
High-voltage diffusion‐welded stacks on the basis of SiC Schottky diodes
Korolkov, Oleg
;
Sleptšuk, Natalja
;
Annus, Paul
;
Land, Raul
;
Rang, Toomas
Silicon carbide and related materials 2015 (ICSRM 2015) : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy
2016
/
p. 790-794 : ill
http://dx.doi.org/10.4028/www.scientific.net/MSF.858.790
book article
17
book article
Hot spots caused by contact inhomogeneities in 4H- and 6H-SiC Schottky structures
Kurel, Raido
;
Rang, Toomas
Advanced Computational Methods in Heat Transfer VI
2000
/
p. 437-444
https://www.witpress.com/elibrary/wit-transactions-on-engineering-sciences/27/4468
book article
18
journal article
Interpretation of some physical parameters of SiC Schottky interfaces manufactured by diffusion welding technology
Rang, Toomas
;
Korolkov, Oleg
;
Ljutov, Jevgeni
Proceedings of the Estonian Academy of Sciences. Engineering
2004
/
3, p. 179-184
journal article
19
journal article EST
/
journal article ENG
Investigation of barrier inhomogeneities and electronic transport on Al-Foil/p-Type-4H-SiCSchottky barrier Diodes using diffusion welding
Ziko, Mehadi Hasan
;
Koel, Ants
;
Rang, Toomas
;
Rashid, Muhammad Haroon
Crystals
2020
/
p. 636-647
https://doi.org/10.3390/cryst10080636
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
20
book article
Investigation of deep level centers in i- and n-layers of GaAs pin-diodes
Toompuu, Jana
;
Korolkov, Oleg
;
Sleptšuk, Natalja
;
Rang, Toomas
BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia
2014
/
p. 25-28 : ill
book article
21
dissertation
Investigation of electrical characteristics of SiC based complementary JBS structures
Kurel, Raido
2005
https://www.ester.ee/record=b2053292*est
dissertation
22
book
Investigation of P-i-n GaAs structures by DLTS method : the deep level transient spectroscopy in application to GaAs p-i-n structures for identification of deep levels
Toompuu, Jana
2010
https://www.amazon.com/Investigation-p-i-n-GaAs-structures-method/dp/383839223X
book
23
dissertation
Investigation of the intermediate layer in the metal-silicon carbide contact obtained by diffusion welding = Difusioonkeevitusega valmistatud metalli ja ränikarbiidi vahelise üleminekuala vahekihi uurimine
Sleptšuk, Natalja
2011
https://www.ester.ee/record=b2692547*est
dissertation
24
book article
Large area 4H-SiC power Schottky diode
Rang, Toomas
;
Korolkov, Oleg
;
Pikkov, Mihhail
Proceedings of the 3rd International Conference and Exhibition Micro Materials : MicroMat2000 : April 17-19, 2000, Berlin, Germany
2000
/
p. 890-893
book article
25
journal article
Large area 6H-SiC Schottky diode
Rang, Toomas
;
Korolkov, Oleg
;
Pikkov, Mihhail
Proceedings of the Estonian Academy of Sciences. Engineering
2000
/
2, p. 155-159 : ill
https://artiklid.elnet.ee/record=b1004045*est
journal article
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Mott–Schottky plot
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schottky barrier diode
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SiC Schottky diodes
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Schottky barjäär
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hematoentsefaalne barjäär
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