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1
book article
A scalable technique to identify true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
2017
/
p. 152-157 : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
book article
2
book
Boole'i algebra kasutamine automaatikalülituste projekteerimisel : loengukonspekt
Agur, Ustus
1972
https://www.ester.ee/record=b1327567*est
book
3
journal article EST
/
journal article ENG
Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Microprocessors and microsystems
2020
/
art. 103117, 12 p
https://doi.org/10.1016/j.micpro.2020.103117
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
4
book article
Combinational fault simulation in sequential circuits
Ubar, Raimund-Johannes
;
Kõusaar, Jaak
;
Gorev, Maksim
;
Devadze, Sergei
2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]
2015
/
p. 2876-2879 : ill
book article
5
book article
Complex delay fault reasoning with sequential 7-valued algebra
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Aleksejev, Igor
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
2015
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2015.7102403
book article
6
book
Computational aspects of nodal method for simulation of electronic circuits
Laksberg, Edgar
1983
book
7
journal article
Computer-aided examination of the I²L current source and the behaviour of the I²L flip-flop used in static memory cells
Rang, Toomas
Periodica polytechnica. Electrical engineering = Электротехника
1981
/
p. 159-165 : joon
https://www.ester.ee/record=b1198855*est
https://pp.bme.hu/ee/article/view/4776/3881
journal article
8
book article
Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p. : ill
https://doi.org/10.1109/BEC.2018.8600967
book article
9
book article
Critical path tracing based simulation of transition delay faults
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings
2014
/
p. 108-113 : ill
book article
10
book article
Critical path tracing based simulation of transition delay faults
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
Proceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere
2014
/
p. 61-66 : ill
book article
11
book article
Defects, faults and fault models
Gramatova, Elena
;
Fisherova, Maria
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
Handbook of testing electronic systems
2005
/
p. 26-96 : ill
book article
12
journal article
Design error diagnosis in digital circuits with stuck-at fault model
Jutman, Artur
;
Ubar, Raimund-Johannes
Microelectronics reliability
2000
/
2, p. 307-320 : ill
journal article
13
book article
Diagnostics system for electronic circuits
Melentjev, Sergei
11th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 16-21, 2012
2012
/
p. 192-194 : ill
book article
14
book
Digitaalsüsteemide diagnostika
Ubar, Raimund-Johannes
2005
http://www.ester.ee/record=b2097071*est
book
15
book article
Efficient at-speed interconnect BIST and diagnosis framework
Jutman, Artur
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
2005
/
p. 257-258 : ill
https://artiklid.elnet.ee/record=b1018804*est
book article
16
book article
Ein universeller Weg zur Automatisierung des Testentwurfs für digitale Objecte
Ubar, Raimund-Johannes
;
Lohuaru, Tõnu
Fehler in Automaten
1989
/
S. 16-30 : Ill
book article
17
book
Electronic circuits : examples for project based subject "Technologies of electronic products"
Sillakivi, Peeter
;
Tamm, Uljas
2003
https://www.ester.ee/record=b1828290*est
book
18
book
Elektronlülitused : näidisskeemid projektipõhilisele õppeainele "Elektrontoodete tehnoloogiad"
2003
https://www.ester.ee/record=b1828299*est
book
19
book
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
Cantarella, JD
2005
https://www.ester.ee/record=b2300865*est
book
20
book article
Evolutionary approach to test generation for functional BIST
Skobtsov, Y.A.
;
Ivanov, D.E.
;
Skobtsov, V.Y.
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
2005
/
p. 151-155 : ill
https://artiklid.elnet.ee/record=b1018764*est
book article
21
journal article
Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuits
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Devadze, Sergei
;
Raik, Jaan
International journal of microelectronics and computer science
2018
/
p. 9−18
https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1
https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf
journal article
22
journal article EST
/
journal article ENG
Fast identification of true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jürimägi, Lembit
Microelectronics reliability
2018
/
p. 252-261 : ill
https://doi.org/10.1016/j.microrel.2017.11.027
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
23
book article
Fault simulation with parallel exact critical path tracing in multiple core environment
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 9-13 March 2015, Grenoble, France
2015
/
p. 1180-1185 : ill
book article
24
book
Handbook of testing electronic systems
Novak, Ondrej
;
Gramatova, Elena
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
2005
https://www.ester.ee/record=b2102523*est
book
25
book article
Hierarchical identification of NBTI-critical gates in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
Number of records 64, displaying
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