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26
book article
Hierarchical identification of untestable faults in sequential circuits
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
;
Kruus, Margus
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 668-671 : ill
http://dx.doi.org/10.1109/DSD.2007.4341539
book article
27
journal article
Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits
Jenihhin, Maksim
;
Squillero, Giovanni
;
Tihhomirov, Valentin
;
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 273-289 : ill
http://dx.doi.org/10.1007/s10836-016-5589-x
journal article
28
book article
Identification and rejuvenation of NBTI-critical paths in nanoscale logic circuits
Jenihhin, Maksim
1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems : May 28-29, 2015, Cluj-Napoca, Romania
2015
/
[1] p
book article
29
book
Impulss-seadmed : laboratoorne töö nr. 5 : trigerid loogikaelementidel
1986
https://www.ester.ee/record=b1240931*est
book
30
book
Impulss-seadmed : laboratoorne töö nr. 8 : lineaarpinge generaator
1986
https://www.ester.ee/record=b2618544*est
book
31
book
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
2005
https://www.ester.ee/record=b2055139*est
book
32
book article
Investigating defects in digital circuits by Boolean differential equations
Kruus, Helena
;
Orasson, Elmet
;
Robal, Tarmo
;
Ubar, Raimund-Johannes
The 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)
2004
/
p. 432-435
book article
33
journal article EST
/
journal article ENG
Low frequency acoustic method to measure the complex bulk modulus of porous materials
Napolitano, Marialuisa
;
Di Giulio, Elio
;
Auriemma, Fabio
The Journal of the Acoustical Society of America
2022
/
art. 1545
https://doi.org/10.1121/10.0009767
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
34
journal article
Modeling and simulation of circuits with shared structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
;
Viies, Vladimir
Microprocessors and microsystems
2017
/
p. 56-61 : ill
http://dx.doi.org/10.1016/j.micpro.2016.09.006
journal article
35
book article
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
book article
36
book article
Multiple fault analyses in logic circuits
Ubar, Raimund-Johannes
IFAC-Symposium Discrete Systems : Dresden, 14.-19. 3. 77
1977
/
p. [?]
book article
37
book article
Organ bio-impedance modelling with 3D mesh of equivalent circuits
Gordon, Rauno
Proceedings of the XII International Conference on Electrical Bioimpedance & the V Conference on Electrical Impedance Tomography : ICEBI/EIT 2004 : June 20-24, 2004, Gdansk, Poland. Vol. 2
2004
/
p. 715-718
book article
38
book
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
http://www.ester.ee/record=b2777270*est
book
39
book
Product and manufacturing in electronics : supplementary material in the subject "Technologies of electronic circuits"
Rang, Toomas
2003
https://www.ester.ee/record=b1766953*est
book
40
book article
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG
Palermo, N.
;
Tihhomirov, Valentin
;
Copetti, Thiago
;
Jenihhin, Maksim
;
Raik, Jaan
;
Kostin, Sergei
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
2015
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2015.7102405
book article
41
book article
Scalable algorithm for structural fault collapsing in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Orasson, Elmet
;
Raik, Jaan
2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea
2015
/
p. 171-176 : ill
book article
42
book article
7-valued algebra for transition delay fault analysis
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia
2014
/
p. 89-92 : ill
book article
43
book article
Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway
2015
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2015.7364406
book article
44
book article
SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 223-228 : ill
book article
45
book article
State of charge estimation for Li-ion batteries based on equivalent circuit diagrams and the application of a Kalman filter
Rahmoun, Ahmad
;
Biechl, Helmuth
;
Rosin, Argo
12th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Kuressaare, Estonia, June 11-16, 2012
2012
/
p. 125-128 : ill
book article
46
dissertation
Symbolic test generation for hierarchically modeled digital systems
Zaugarov, Viktor
1993
https://www.ester.ee/record=b2090336*est
dissertation
47
journal article
10th IEEE European Test Symposium
Ubar, Raimund-Johannes
;
Prinetto, Paolo
;
Raik, Jaan
IEEE journal of design & test of computers
2005
/
p. 480-481 : phot
http://dx.doi.org/10.1109/MDT.2005.106
journal article
48
book article
Testing tools
Jutman, Artur
Handbook of testing electronic systems
2005
/
p. 361-365 : ill
book article
49
book article
Testing tools
Raik, Jaan
Handbook of testing electronic systems
2005
/
p. 373-378 : ill
book article
50
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
Number of records 64, displaying
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