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Hierarchical test generation for combinational circuits with real defects coverage (title)
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journal article
Hierarchical test generation for combinational circuits with real defects coverage
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2002
/
p. 1141-1149 : ill
https://www.sciencedirect.com/science/article/pii/S002627140200080X
journal article
Number of records 1, displaying
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keyword
21
1.
Hierarchical Multi-level Test Generation
2.
combinational and sequential circuits
3.
combinational circuits
4.
test coverage
5.
real-time room temperature test
6.
adaptive test strategy generation
7.
automated test pattern generation
8.
automatic test case generation
9.
automatic test pattern generation
10.
automatic test program generation
11.
behaviour level test generation
12.
functional test generation
13.
high-level test data generation
14.
highlevel test generation
15.
implementation-independent test generation
16.
offline test generation
17.
provably correct test generation
18.
test generation
19.
test generation and fault diagnosis
20.
Test Group Generation for Detecting Multiple Faults
21.
test program generation
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