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test generation (keyword)
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1
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/EWME.2016.7496466
book article
2
book article
Aspect-oriented testing of a rehabilitation system
Sarna, Külli
;
Vain, Jüri
VALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France
2014
/
p. 73-78 : ill
book article
3
book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
4
book article
Exploiting aspects in model-based testing
Sarna, Külli
;
Vain, Jüri
FOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German
2012
/
p. 45-47 : ill
book article
5
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
6
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
7
book article
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
book article
8
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
9
book article
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
book article
10
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
11
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
12
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
13
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
14
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
Number of records 14, displaying
1 - 14
keyword
198
1.
behaviour level test generation
2.
functional test generation
3.
highlevel test generation
4.
implementation-independent test generation
5.
offline test generation
6.
provably correct test generation
7.
test generation
8.
test generation and fault diagnosis
9.
adaptive test strategy generation
10.
automated test pattern generation
11.
automatic test case generation
12.
automatic test pattern generation
13.
automatic test program generation
14.
high-level test data generation
15.
test program generation
16.
Activity-based demand generation
17.
automatic code generation
18.
Automatic generation control
19.
automatic GUI model generation
20.
building and urban form generation
21.
business model generation
22.
code generation
23.
disaster alert generation
24.
distributed electricity generation
25.
distributed generation
26.
Distributed Generation (DG)
27.
distributed power generation
28.
distrubuted power generation
29.
droplet generation
30.
droplet generation rate control
31.
electric power generation
32.
electricity generation
33.
energy generation
34.
extreme penetration level of non synchronous generation
35.
feasible path generation
36.
fifth generation computer
37.
fourth generation district heating
38.
frequent item generation
39.
generation
40.
generation and transmission expansion planning
41.
Generation Costs
42.
generation of electric energy
43.
generation succession
44.
heat generation
45.
hydroelectric power generation
46.
hydrogen generation
47.
I–III generation
48.
job generation
49.
multisine generation
50.
next generation 4D printing
51.
next generation sequencing
52.
Next-generation probiotics
53.
next-generation sequencing
54.
oil-shale power generation
55.
pattern Generation
56.
photovoltaic (PV) generation
57.
photovoltaic generation dispatch
58.
power generation
59.
power generation dispatch
60.
power generation economics
61.
power generation planning
62.
PV generation
63.
PV power generation
64.
Renewable energy generation
65.
renewable generation
66.
residual generation
67.
Second generation bioethanol
68.
second generation of tribology models
69.
second generation sequencing
70.
silver generation
71.
solar power generation
72.
space generation advisory council
73.
template based sql generation
74.
trajectory generation
75.
waste generation
76.
wave generation
77.
white light generation
78.
wind energy generation
79.
wind generation
80.
wind power generation
81.
4GDH (4th generation district heating)
82.
4th generation district heating
83.
5th generation district heating
84.
accelerated shelf-life test
85.
antigen test
86.
ASTM G65 dry sand rubber wheel abrasion test
87.
automated test environment
88.
Auvergne test-bed
89.
battery test
90.
behavioral test
91.
bending test
92.
bit-error rate test
93.
Board and System Test
94.
board test
95.
bounds test
96.
built-in self-test
97.
capillary condensation redistribution test
98.
chi-square test
99.
closed bottle test
100.
cognitive screening test
101.
compartment fire test
102.
compartment test
103.
cone penetration test (CPT)
104.
COVID-19 antigen test
105.
cutting test
106.
cybersecurity test bed
107.
DDR4 interconnect test
108.
design and test
109.
design-for-test
110.
deterministic test sequences
111.
diagnostic test
112.
digital test
113.
Digital test and testable design
114.
double-pulse test
115.
drawing test
116.
dry droplet antimicrobial test
117.
embedded test
118.
fan pressurisation test
119.
final test result prediction
120.
four-point bending test
121.
FPGA based test
122.
FPGA-Assisted Test
123.
FPGA-centric test
124.
functional self-test
125.
Granger causality test
126.
hardness test
127.
high-level synthesis for test
128.
high-speed serial link test
129.
IEEE 9 bus test system
130.
in situ tensile test in SEM
131.
industrial field test
132.
in-situ tensile test in SEM
133.
Johansen cointegration test
134.
Kolmogorov-Smirnov test
135.
load test
136.
logic built-in self-test
137.
Luria alternating series test
138.
Mann–Kendall test
139.
memory interconnect test
140.
microprocessor test
141.
Model test
142.
multiplier test
143.
orthogonal test
144.
package test analysis
145.
parallel design and test
146.
performance test
147.
piezocone penetration test (CPTu)
148.
Point Load Test index
149.
pressurisation test
150.
processor-centric board test
151.
pseudo-exhaustive test
152.
purity test
153.
rtioco-based timed test sequences
154.
seasonal Mann Kendall test
155.
self-test
156.
self-test architectures
157.
sentence writing test
158.
serial sevens test
159.
ship towing test tank
160.
similar material simulation test
161.
small‐scale test
162.
software based self-test
163.
software-based self-test
164.
software-based self-test (SBST)
165.
soil phosphorus (P) test
166.
standard test method
167.
static load test
168.
static-dynamic probing test (SDT)
169.
stress test
170.
system level test
171.
teaching design and test of systems
172.
tensile test
173.
test
174.
test and evaluation platform
175.
test bench
176.
test coverage
177.
test driven development
178.
test driven modelling
179.
test embankment
180.
test equipment
181.
test groups
182.
test model design
183.
test optimization
184.
test packets
185.
test path synthesis
186.
test patterns
187.
test point insertion
188.
test reference year
189.
test replication
190.
test scenario description language
191.
test-bed
192.
test-chips
193.
test-house
194.
test-pattern
195.
test-suite reduction
196.
Three-point bending test
197.
unit root test
198.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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