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1

book article

Aspect-oriented testing of a rehabilitation systemSarna, Külli; Vain, JüriVALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France2014 / p. 73-78 : ill

book article
2

book article

At-speed functional built-in self-test methodology for processors [Electronic resource]Ubar, Raimund-Johannes; Indus, Viljar; Kalmend, OliverProceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka2012 / p. 168-172 : ill [CD-ROM]

book article
3

book article

Exploiting aspects in model-based testingSarna, Külli; Vain, JüriFOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German2012 / p. 45-47 : ill https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing

book article
4

book article

High-level test data generation for software based self-test in microprocessorsOyeniran, Adeboye Stephen; Jasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 20172017 / p. 86-91 : ill https://doi.org/10.1109/MECO.2017.7977167

book article
5

book article

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

book article
6

book article

Implementation-independent functional test for transition delay faults in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia2020 / p. 646-650 https://doi.org/10.1109/DSD51259.2020.00105

book article
7

book article

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

book article
8

book article

Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287

book article
9

book article

A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915

book article
10

book article EST / book article ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG
11

book article

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

book article
12

book article

Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

book article
13

book article

Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p

book article
14

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 14, displaying 1 - 14

1. behaviour level test generation
2. functional test generation
3. highlevel test generation
4. implementation-independent test generation
5. offline test generation
6. provably correct test generation
7. test generation
8. test generation and fault diagnosis
9. adaptive test strategy generation
10. automated test pattern generation
11. automatic test case generation
12. automatic test pattern generation
13. automatic test program generation
14. high-level test data generation
15. test program generation
16. Activity-based demand generation
17. automatic code generation
18. Automatic generation control
19. automatic GUI model generation
20. building and urban form generation
21. business model generation
22. code generation
23. disaster alert generation
24. distributed electricity generation
25. distributed generation
26. Distributed Generation (DG)
27. distributed generation systems
28. distributed power generation
29. distrubuted power generation
30. droplet generation
31. droplet generation rate control
32. electric power generation
33. electricity generation
34. energy generation
35. extreme penetration level of non synchronous generation
36. feasible path generation
37. fifth generation computer
38. fourth generation district heating
39. frequent item generation
40. generation
41. generation and transmission expansion planning
42. Generation Costs
43. generation of electric energy
44. generation succession
45. heat generation
46. hydroelectric power generation
47. hydrogen generation
48. I–III generation
49. job generation
50. multisine generation
51. next generation 4D printing
52. next generation sequencing
53. Next-generation probiotics
54. next-generation sequencing
55. oil-shale power generation
56. pattern Generation
57. photovoltaic (PV) generation
58. photovoltaic generation dispatch
59. power generation
60. power generation dispatch
61. power generation economics
62. power generation planning
63. PV generation
64. PV power generation
65. Renewable energy generation
66. renewable generation
67. residual generation
68. Second generation bioethanol
69. second generation of tribology models
70. second generation sequencing
71. signal generation
72. silver generation
73. solar power generation
74. space generation advisory council
75. template based sql generation
76. trajectory generation
77. waste generation
78. wave generation
79. white light generation
80. wind energy generation
81. wind generation
82. wind power generation
83. 16S rRNA gene amplicon next-generation sequencing
84. 4GDH (4th generation district heating)
85. 4th generation district heating
86. 5th generation district heating
87. accelerated shelf-life test
88. antigen test
89. ASTM G65 dry sand rubber wheel abrasion test
90. automated test environment
91. Auvergne test-bed
92. battery test
93. behavioral test
94. bending test
95. bit-error rate test
96. Board and System Test
97. board test
98. bounds test
99. built-in self-test
100. capillary condensation redistribution test
101. chi-square test
102. closed bottle test
103. cognitive screening test
104. compartment fire test
105. compartment test
106. cone penetration test (CPT)
107. COVID-19 antigen test
108. cutting test
109. cybersecurity test bed
110. DDR4 interconnect test
111. design and test
112. design-for-test
113. deterministic test sequences
114. diagnostic test
115. digital test
116. Digital test and testable design
117. double-pulse test
118. drawing test
119. dry droplet antimicrobial test
120. embedded test
121. fan pressurisation test
122. final test result prediction
123. four-point bending test
124. FPGA based test
125. FPGA-Assisted Test
126. FPGA-centric test
127. functional self-test
128. Granger causality test
129. hardness test
130. high-level synthesis for test
131. high-speed serial link test
132. IEEE 9 bus test system
133. in situ tensile test in SEM
134. industrial field test
135. in-situ tensile test in SEM
136. Johansen cointegration test
137. Kolmogorov-Smirnov test
138. load test
139. logic built-in self-test
140. Luria alternating series test
141. Mann–Kendall test
142. memory interconnect test
143. microprocessor test
144. Model test
145. multiplier test
146. orthogonal test
147. package test analysis
148. parallel design and test
149. performance test
150. piezocone penetration test (CPTu)
151. Point Load Test index
152. pressurisation test
153. processor-centric board test
154. progressive damage test
155. pseudo-exhaustive test
156. purity test
157. rtioco-based timed test sequences
158. seasonal Mann Kendall test
159. seismic piezocone penetration test
160. self-test
161. self-test architectures
162. sentence writing test
163. serial sevens test
164. ship towing test tank
165. similar material simulation test
166. small-scale fire test
167. small‐scale test
168. software based self-test
169. software-based self-test
170. software-based self-test (SBST)
171. soil phosphorus (P) test
172. standard test method
173. static load test
174. static-dynamic probing test (SDT)
175. stress test
176. system level test
177. teaching design and test of systems
178. tensile test
179. test
180. test and evaluation platform
181. test bench
182. test coverage
183. test driven development
184. test driven modelling
185. test embankment
186. test equipment
187. test groups
188. test model design
189. test optimization
190. test packets
191. test path synthesis
192. test patterns
193. test point insertion
194. test reference year
195. test replication
196. test scenario description language
197. test-bed
198. test-chips
199. test-house
200. test-pattern
201. test-suite reduction
202. Three-point bending test
203. unit root test
204. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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