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Mixed-level deterministic-random test generation for digital systems (title)
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book article
Mixed-level deterministic-random test generation for digital systems
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 5th International Conference on Mixed Design of Integrated Circuits and Systems, Lodz, Poland, June 18-20, 1998
1998
/
p. 335-340
book article
Number of records 1, displaying
1 - 1
keyword
29
1.
behaviour level test generation
2.
Hierarchical Multi-level Test Generation
3.
high-level test data generation
4.
Cross-level Modeling of Faults in Digital Systems
5.
High-level Decision Diagrams for Modeling Digital Systems
6.
deterministic test sequences
7.
random dynamical systems
8.
extreme penetration level of non synchronous generation
9.
adaptive test strategy generation
10.
automated test pattern generation
11.
automatic test case generation
12.
automatic test pattern generation
13.
automatic test program generation
14.
functional test generation
15.
highlevel test generation
16.
implementation-independent test generation
17.
offline test generation
18.
provably correct test generation
19.
test generation
20.
test generation and fault diagnosis
21.
Test Group Generation for Detecting Multiple Faults
22.
test program generation
23.
high-level synthesis for test
24.
level-crossing analog-to-digital converters
25.
level-crossing analogue-to-digital converters (ADC)
26.
system level test
27.
digital test
28.
Digital test and testable design
29.
distributed generation systems
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