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Hierarchical concurrent test generation for synchronous sequential circuits (title)
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book article
Hierarchical concurrent test generation for synchronous sequential circuits
Ubar, Raimund-Johannes
;
Brik, Marina
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
2000
/
p. 533-538 : ill
book article
Number of records 1, displaying
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keyword
20
1.
Hierarchical Multi-level Test Generation
2.
combinational and sequential circuits
3.
sequential circuits
4.
extreme penetration level of non synchronous generation
5.
adaptive test strategy generation
6.
automated test pattern generation
7.
automatic test case generation
8.
automatic test pattern generation
9.
automatic test program generation
10.
behaviour level test generation
11.
functional test generation
12.
high-level test data generation
13.
highlevel test generation
14.
implementation-independent test generation
15.
offline test generation
16.
provably correct test generation
17.
test generation
18.
test generation and fault diagnosis
19.
Test Group Generation for Detecting Multiple Faults
20.
test program generation
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