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Aleksejev, Igor (TTÜ author)
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1
book article
A scalable static test set compaction method for sequential circuits
Aleksejev, Igor
;
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
2008
/
p. 87-92 : ill
book article
2
book article
Application of sequential test set compaction to LFSR reseeding
Aleksejev, Igor
;
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings
2008
/
p. 102-107 : ill
http://dx.doi.org/10.1109/NORCHP.2008.4738292
book article
3
book article
BIST analyzer : a training platform for SoC testing [Electronic resource]
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 2007
2007
/
p. S3H-8-S3H-13 : ill. [CD-ROM]
http://dx.doi.org/10.1109/FIE.2007.4418125
book article
4
book article
Complex delay fault reasoning with sequential 7-valued algebra
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Aleksejev, Igor
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
2015
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2015.7102403
book article
5
book article
E-learning environment for WEB-based study of testing
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Aleksejev, Igor
;
Tšepurov, Anton
;
Tšertov, Anton
;
Kostin, Sergei
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
Proceedings of the 8th European Workshop on Microelectronics Education : EWME 2010 : Darmstadt, Germany, 10-12 May 2010
2010
/
p. 47-52 : ill
book article
6
book article
Embedded instrumentation toolbox for screening marginal defects and outliers for production
Odintsov, Sergei
;
Jutman, Artur
;
Devadze, Sergei
;
Aleksejev, Igor
IEEE AUTOTESTCON 2017 : Schaumburg, USA, Sept 11-14, 2017 : proceedings
2017
/
p. 336-334 : ill
https://doi.org/10.1109/AUTEST.2017.8080516
book article
7
book article
Embedded synthetic instruments for board-level testing
Jutman, Artur
;
Devadze, Sergei
;
Aleksejev, Igor
;
Wenzel, Thomas
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
2012
/
1 p. : ill
book article
8
book article
Fast extended test access via JTAG and FPGAs
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
International Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings
2009
/
p. 1-7 : ill
http://dx.doi.org/10.1109/TEST.2009.5355668
book article
9
dissertation
FPGA-based embedded virtual instrumentation = FPGA-sisesed virtuaalsed test- ja mõõtevahendid
Aleksejev, Igor
2013
http://www.ester.ee/record=b2927687*est
dissertation
10
book article
FPGA-based synthetic instrumentation for board test
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
;
Odintsov, Sergei
;
Wenzel, Thomas
Proceedings : International Test Conference 2012
2012
/
p. 1-10 : ill
book article
11
book article
IEEE P1687 IJTAG demonstrator on FPGA
Shibin, Konstantin
;
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
DATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 2012
2012
/
1 p. : ill
book article
12
book article
On coverage of timing related faults at board level
Jutman, Artur
;
Aleksejev, Igor
;
Devadze, Sergei
2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings
2016
/
[2] p. : ill
https://doi.org/10.1109/ETS.2016.7519295
book article
13
journal article EST
/
journal article ENG
Optimization of boundary scan tests using FPGA-based efficient scan architectures
Aleksejev, Igor
;
Devadze, Sergei
;
Jutman, Artur
;
Shibin, Konstantin
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 245-255 : ill
https://doi.org/10.1007/s10836-016-5588-y
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
14
book article
Optimization of the store-and-generate based built-in self-test
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Aleksejev, Igor
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 199-202 : ill
book article
15
book article
Reseeding using compaction of pre-generated LFSR sequences
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
;
Ubar, Raimund-Johannes
ICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : 31st August to 3rd September 2008, Malta : conference guide
2008
/
p. 215
book article
16
book article
Reseeding using compaction of pre-generated LFSR sub-sequences
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
;
Ubar, Raimund-Johannes
ICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : Malta
2008
/
p. 1290-1295 : ill
http://dx.doi.org/10.1109/ICECS.2008.4675096
book article
17
book article
Run-time reconfigurable instruments for advanced board-level testing
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
IEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings
2016
/
p. 385-392 : ill
https://doi.org/10.1109/AUTEST.2016.7589627
book article
18
journal article
Run-time reconfigurable instruments for advanced board-level testing
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
IEEE instrumentation & measurement magazine
2017
/
p. 23-30 : ill
https://doi.org/10.1109/MIM.2017.8006390
journal article
19
book article
Sequential test set compaction in LFSR reseeding
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
Design and test technology for dependable systems-on-chip
2011
/
p. 476-493 : ill
https://ieeexplore.ieee.org/document/4738292
book article
20
book article
Teaching digital test with BIST analyzer
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings
2008
/
p. 123-128 : ill
http://dx.doi.org/10.1109/EAEEIE.2008.4610171
book article
21
book article
Turning JTAG inside out for fast extended test access
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
10th IEEE Latin American Test Workshop : 2-5 March 2009, Brazil
2009
/
[6] p. : ill
https://ieeexplore.ieee.org/document/4813799
book article
22
book article
Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko
;
Odintsov, Sergei
;
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Wenzel, Thomas
2019 IEEE AUTOTESTCON
2019
/
10 p : ill
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057
book article
23
book article
Virtual reconfigurable scan-chains on FPGAs for optimized board test
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
;
Shibin, Konstantin
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
2015
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2015.7102411
book article
Number of records 23, displaying
1 - 23
author
75
1.
Aleksejev, Igor
2.
Aleksejev, Anton
3.
Aleksejev, E.
4.
Aleksejev, Jevgeni
5.
Aleksejev, O.B.
6.
Aleksejev, S.
7.
Aleksejev, Valeri
8.
Ehala-Aleksejev, Kristel
9.
Artemtšuk, Igor
10.
Astrov, Igor
11.
Bakhovtsev, Igor A.
12.
Belkin, Igor M.
13.
Beltšuk, Igor
14.
Bodík, Igor
15.
Bossenko, Igor
16.
Davõdov, Igor
17.
Devjatõhh, Igor
18.
Didenkulov, Igor
19.
Dimitrenko, Igor
20.
Dimitryuk, Igor
21.
Dmitrenko, Igor
22.
Dmitrienko, Igor
23.
Evtodiev, Igor
24.
Golovtsov, Igor
25.
Gräzin, Igor
26.
Haljasmaa, Igor
27.
Harizomenov, Igor
28.
Iashchishyn, Igor A.
29.
Jankovski, Igor
30.
Kanattšikov, Igor
31.
Klemenoks, Igor
32.
Koloniuk, Igor
33.
Komarnitskyi, Igor
34.
Kommel, Igor
35.
Kondratenko, Igor
36.
Konovalov, Igor
37.
Kravtsenko, Igor
38.
Krupenski, Igor
39.
Kulp, Igor
40.
Külaots, Igor
41.
Latsko, Igor
42.
Leont'yev, Igor
43.
Medved, Igor
44.
Mets, Igor
45.
Nechaev, Igor
46.
Novikov, Igor
47.
Papic, Igor
48.
Penkov, Igor
49.
Petrov, Igor
50.
Petuhhov, Igor
51.
Plokhov, Igor
52.
Poliantšikov, Igor
53.
Poljantšikov, Igor
54.
Polyantchikov, Igor
55.
Ponomarenko, Igor
56.
Presniakov, Igor A.
57.
Pšenitšnikov, Igor
58.
Resnick, Igor
59.
Rõtov, Igor
60.
Sartori, Igor
61.
Savraev, Igor
62.
Savrajev, Igor
63.
Schvede, Igor
64.
Skirdov, Igor
65.
Sozin, Igor
66.
Stubna, Igor
67.
Taro, Igor
68.
Tokarski, Igor
69.
Tuuling, Igor
70.
Volke, Igor
71.
Ševtšuk, Igor
72.
Širai, Igor
73.
Štšeglov, Igor
74.
Štuba, Igor
75.
Štubna, Igor
CV
27
1.
Aleksejev, Igor 1986
2.
Aleksejev, Aleksandr 1922
3.
Astrov, Igor 1959
4.
Bossenko, Igor 1973
5.
Davõdov, Igor 1930
6.
Fedchenko, Igor
7.
Fedtsenko, Igor 1972
8.
Fedtšenko, Igor
9.
Golovtsov, Igor 1966
10.
Jankovski, Igor 1921-2011
11.
Kostjukevitš, Igor 1962
12.
Krupenski, Igor 1983
13.
Külaots, Igor 1932-2017
14.
Malmet, Igor 1926-2007
15.
Novikov, Igor 1974
16.
Penkov, Igor 1969
17.
Petrov, Igor 1958
18.
Petuhhov, Igor
19.
Popov, Igor 1961
20.
Pšenitšnikov, Igor 1957
21.
Sevtsuk, Igor
22.
Shevtsuk, Igor
23.
Smirnov, Igor 1956
24.
Sozin, Igor 1960
25.
Tjurlik, Igor 1972
26.
Ševtšuk, Igor 1953
27.
Štšeglov, Igor 1954
name of the person
9
1.
Artemtšuk, Igor
2.
Gnezdilov, Igor
3.
Krupenski, Igor
4.
Novikov, Igor
5.
Poljantšikov, Igor
6.
Rõtov, Igor
7.
Schechter, Igor
8.
Volke, Igor
9.
Volke, Igor, 1950–2024
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