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Aleksejev, Igor (TTÜ author)

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1

book article

A scalable static test set compaction method for sequential circuitsAleksejev, Igor; Raik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 87-92 : ill

book article
2

book article

Application of sequential test set compaction to LFSR reseedingAleksejev, Igor; Jutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 102-107 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738292

book article
3

book article

BIST analyzer : a training platform for SoC testing [Electronic resource]Jutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 20072007 / p. S3H-8-S3H-13 : ill. [CD-ROM] http://dx.doi.org/10.1109/FIE.2007.4418125

book article
4

book article

Complex delay fault reasoning with sequential 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Aleksejev, Igor2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102403

book article
5

book article

E-learning environment for WEB-based study of testingUbar, Raimund-Johannes; Jutman, Artur; Raik, Jaan; Devadze, Sergei; Jenihhin, Maksim; Aleksejev, Igor; Tšepurov, Anton; Tšertov, Anton; Kostin, Sergei; Orasson, Elmet; Wuttke, Heinz-DietrichProceedings of the 8th European Workshop on Microelectronics Education : EWME 2010 : Darmstadt, Germany, 10-12 May 20102010 / p. 47-52 : ill

book article
6

book article

Embedded instrumentation toolbox for screening marginal defects and outliers for productionOdintsov, Sergei; Jutman, Artur; Devadze, Sergei; Aleksejev, IgorIEEE AUTOTESTCON 2017 : Schaumburg, USA, Sept 11-14, 2017 : proceedings2017 / p. 336-334 : ill https://doi.org/10.1109/AUTEST.2017.8080516

book article
7

book article

Embedded synthetic instruments for board-level testingJutman, Artur; Devadze, Sergei; Aleksejev, Igor; Wenzel, ThomasProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p. : ill

book article
8

book article

Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

book article
9

dissertation

FPGA-based embedded virtual instrumentation = FPGA-sisesed virtuaalsed test- ja mõõtevahendidAleksejev, Igor2013 http://www.ester.ee/record=b2927687*est

dissertation
10

book article

FPGA-based synthetic instrumentation for board testAleksejev, Igor; Jutman, Artur; Devadze, Sergei; Odintsov, Sergei; Wenzel, ThomasProceedings : International Test Conference 20122012 / p. 1-10 : ill

book article
11

book article

IEEE P1687 IJTAG demonstrator on FPGAShibin, Konstantin; Aleksejev, Igor; Jutman, Artur; Devadze, SergeiDATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 20122012 / 1 p. : ill

book article
12

book article

On coverage of timing related faults at board levelJutman, Artur; Aleksejev, Igor; Devadze, Sergei2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings2016 / [2] p. : ill https://doi.org/10.1109/ETS.2016.7519295

book article
13

journal article EST / journal article ENG

Optimization of boundary scan tests using FPGA-based efficient scan architecturesAleksejev, Igor; Devadze, Sergei; Jutman, Artur; Shibin, KonstantinJournal of electronic testing : theory and applications (JETTA)2016 / p. 245-255 : ill https://doi.org/10.1007/s10836-016-5588-y Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
14

book article

Optimization of the store-and-generate based built-in self-testUbar, Raimund-Johannes; Jervan, Gert; Kruus, Helena; Orasson, Elmet; Aleksejev, IgorBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 199-202 : ill

book article
15

book article

Reseeding using compaction of pre-generated LFSR sequencesJutman, Artur; Aleksejev, Igor; Raik, Jaan; Ubar, Raimund-JohannesICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : 31st August to 3rd September 2008, Malta : conference guide2008 / p. 215

book article
16

book article

Reseeding using compaction of pre-generated LFSR sub-sequencesJutman, Artur; Aleksejev, Igor; Raik, Jaan; Ubar, Raimund-JohannesICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : Malta2008 / p. 1290-1295 : ill http://dx.doi.org/10.1109/ICECS.2008.4675096

book article
17

book article

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 385-392 : ill https://doi.org/10.1109/AUTEST.2016.7589627

book article
18

journal article

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

journal article
19

book article

Sequential test set compaction in LFSR reseedingJutman, Artur; Aleksejev, Igor; Raik, JaanDesign and test technology for dependable systems-on-chip2011 / p. 476-493 : ill https://ieeexplore.ieee.org/document/4738292

book article
20

book article

Teaching digital test with BIST analyzerJutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 123-128 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610171

book article
21

book article

Turning JTAG inside out for fast extended test accessDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-Johannes10th IEEE Latin American Test Workshop : 2-5 March 2009, Brazil2009 / [6] p. : ill https://ieeexplore.ieee.org/document/4813799

book article
22

book article

Ways for board and system test to benefit from FPGA embedded instrumentationEhrenberg, Heiko; Odintsov, Sergei; Devadze, Sergei; Jutman, Artur; Aleksejev, Igor; Wenzel, Thomas2019 IEEE AUTOTESTCON2019 / 10 p : ill https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057

book article
23

book article

Virtual reconfigurable scan-chains on FPGAs for optimized board testAleksejev, Igor; Jutman, Artur; Devadze, Sergei; Shibin, Konstantin2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102411

book article

Number of records 23, displaying 1 - 23

1. Aleksejev, Igor 1986
2. Aleksejev, Aleksandr 1922
3. Astrov, Igor 1959
4. Bossenko, Igor 1973
5. Davõdov, Igor 1930
6. Fedchenko, Igor
7. Fedtsenko, Igor 1972
8. Fedtšenko, Igor
9. Golovtsov, Igor 1966
10. Jankovski, Igor 1921-2011
11. Kostjukevitš, Igor 1962
12. Krupenski, Igor 1983
13. Külaots, Igor 1932-2017
14. Malmet, Igor 1926-2007
15. Novikov, Igor 1974
16. Penkov, Igor 1969
17. Petrov, Igor 1958
18. Petuhhov, Igor
19. Popov, Igor 1961
20. Pšenitšnikov, Igor 1957
21. Sevtsuk, Igor
22. Shevtsuk, Igor
23. Smirnov, Igor 1956
24. Sozin, Igor 1960
25. Tjurlik, Igor 1972
26. Ševtšuk, Igor 1953
27. Štšeglov, Igor 1954

1. Artemtšuk, Igor
2. Gnezdilov, Igor
3. Krupenski, Igor
4. Novikov, Igor
5. Poljantšikov, Igor
6. Rõtov, Igor
7. Schechter, Igor
8. Volke, Igor
9. Volke, Igor, 1950–2024

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