Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Advanced search
My bookmarks
0
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
—
Add criteria
Simple search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
139520
Look more..
Export
export all inquiry results
(1000*)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
99526
journal article EST
/
journal article ENG
Test scenario specification language for model-based testing
Halling, Evelin
;
Vain, Jüri
;
Boyarchuk, Artem
;
Illiashenko, Oleg
International Journal of Computing
2019
/
p. 408-421 : ill
http://www.computingonline.net/computing/article/view/1611
https://doi.org/10.47839/ijc.18.4.1611
Journal metrics at Scopus
Article at Scopus
journal article EST
/
journal article ENG
99527
book article
Test set minimization using bipartite graphs
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 175-178: ill
book article
99528
book article
Test setup for measuring medium voltage power cable and joint temperature in high current tests using thermocouples [Online resource]
Taklaja, Paul
;
Kiitam, Ivar
;
Hyvönen, Petri
;
Klüss, Joni
34th Electrical Insulation Conference : Hotel Bonaventure, Montreal, Qc, Canada, 19-22 June 2016 : proceedings
2016
/
p. 480-483 : ill
https://doi.org/10.1109/EIC.2016.7548642
book article
99529
book article
Test strategy for a 486 computer multichip module
Magnhagen, Bengt
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 339-340: ill
book article
99530
book article
Test synthesis from register-transfer level descriptions
Raik, Jaan
;
Paomets, Priidu
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 311-314: ill
book article
99531
journal article
Test synthesis with alternative graphs
Ubar, Raimund-Johannes
IEEE design & test of computers
1996
/
Spring, p. 48-57: ill
journal article
99532
journal article
Test system for fault detection and diagnosis in microprocessor control devices
Ubar, Raimund-Johannes
;
Lohuaru, Tõnu
;
Männisalu, Mati
;
Pukk, P.
;
Vanamölder, E.
Tallinna Tehnikaülikooli Toimetised
1990
/
lk. 63-77: ill
journal article
99533
journal article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Journal of computer science and technology
2006
/
6, p. 907-912 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
journal article
99534
book article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China
2003
/
p. 318-325 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
book article
99535
book article
Test time minimization for hybrid BIST with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 112-116 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf
book article
99536
newspaper article
TEST: Gümnaasiumi maateaduse olümpiaadi küsimused [Võrguväljaanne]
postimees.ee
2021
"TEST: Gümnaasiumi maateaduse olümpiaadi küsimused"
newspaper article
99537
newspaper article
TEST: Kui hästi tunned meditsiinitehnoloogiat? [Võrguväljaanne]
postimees.ee
2021
"TEST: Kui hästi tunned meditsiinitehnoloogiat?"
newspaper article
99538
newspaper article
TEST: Kui palju tead energeetikast? [Võrguväljaanne]
postimees.ee
2021
"TEST: Kui palju tead energeetikast?"
newspaper article
99539
book article
Testability analysis for efficient register-transfer level test generation [Electronic resource]
Nõmmeots, Tanel
;
Raik, Jaan
;
Ubar, Raimund-Johannes
9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 2002
2002
/
[4] p. [CD-ROM]
book article
99540
book article
Testability analysis of digital design verification
Hahanov, V.
;
Kaminska, M.
;
Fomina, Jelena
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 171-174 : ill
book article
99541
book article
Testability calculation for digital circuits with decision diagrams
Ubar, Raimund-Johannes
3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers
2002
/
p. 137-143 : ill
https://dblp.org/rec/conf/latw/Ubar02.html
book article
99542
book article
Testability guided hierarchical test generation with decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Nõmmeots, Tanel
20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002
2002
/
p. 265-271
https://www.semanticscholar.org/paper/Testability-Guided-Hierarchical-Test-Generation-Ubar-Raik/c6301ac35d003c92f3867f26e2e75b87e1ad9b47
book article
99543
book article
Testability-based parameter measurement of analog measuring circuits in the frequency domain
Liu, Ji-Gou
;
Frühauf, Uwe
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 329-332: ill
book article
99544
journal article
Testaliin - uus püüniste peitsimisvahend ja selle tarvitamine
Tiitus, B.
Eesti Kalandus
1939
/
lk. 133-135
journal article
99545
book article
Testentwicklung für Mikroprozessorsystem mit Hilfe der alternativen Graphen
Alango, Villem
;
Kont, Toomas
;
Ubar, Raimund-Johannes
33. Internationales wissenschaftliches Kolloquium : 24.-28.10.1988. H.1.
1988
/
S- 11-14
https://www.ester.ee/record=b2936968*est
book article
99546
book article
Testentwurf für digitale Geräte mit Hilfe der Alternativgraphen
Voolaine, Andrus
;
Pall, Martin
;
Plakk, Mari
Fehler in Automaten
1989
/
S. 31-44 : Ill
book article
99547
book article
Tester partitioning and synchronization algorithm for testing real-time distributed systems
Pal, Deepak
;
Vain, Jüri
Proceedings of the 10th Junior Researcher Workshop on Real-Time Computing : JRWRTC 2016 : Brest, France, October 19-21, 2016
2016
/
p. 13-16 : ill
http://jrwrtc2016.gforge.inria.fr/
book article
99548
newspaper article
Testi tulemused ületasid ootusi : Ida-Virumaa põlevkivituhast saab toota värvi
rohe.geenius.ee
2024
Testi tulemused ületasid ootusi : Ida-Virumaa põlevkivituhast saab toota värvi
newspaper article
99549
book
Testid harjutamiseks
Teichmann, Mare
;
Anton, Riina
1997
book
99550
book article
Testide genereerimine loogikalülituste alternatiivsete graafide süsteemi mudeli abil
Saarma, G.
;
Ubar, Raimund-Johannes
XXIX vabariiklik üliõpilaste teaduslik- tehniline konverents 30. märtsist - 1. aprillini 1977 : ettekannete teesid
1977
/
lk. 43
https://www.ester.ee/record=b2449987*est
book article
Number of records 139520, displaying
99526 - 99550
previous
3978
3979
3980
3981
3982
3983
3984
3985
3986
3987
next
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT