Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Symbolic test generation for hierarchically modeled digital systems (title)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
1
Look more..
(1/21)
Export
export all inquiry results
(1)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
dissertation
Symbolic test generation for hierarchically modeled digital systems
Zaugarov, Viktor
1993
https://www.ester.ee/record=b2090336*est
dissertation
Number of records 1, displaying
1 - 1
keyword
21
1.
adaptive test strategy generation
2.
automated test pattern generation
3.
automatic test case generation
4.
automatic test pattern generation
5.
automatic test program generation
6.
behaviour level test generation
7.
functional test generation
8.
Hierarchical Multi-level Test Generation
9.
high-level test data generation
10.
highlevel test generation
11.
implementation-independent test generation
12.
offline test generation
13.
provably correct test generation
14.
test generation
15.
test generation and fault diagnosis
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
18.
digital test
19.
Digital test and testable design
20.
distributed generation systems
21.
un-modeled dynamics
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT