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A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMsCardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz; Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / p. 792-797 https://doi.org/10.23919/DATE48585.2020.9116278

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52

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Diagnosis and correction of multiple design errors using critical path tracing and mutation analysisHantson, Hanno; Repinski, Urmas; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-JohannesLATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador2012 / [6 p.] : ill https://ieeexplore.ieee.org/document/6261234

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53

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Diagnostic modeling of digital systems with multi-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, MaksimDesign and test technology for dependable systems-on-chip2011 / p. 92-118 : ill https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams

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54

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Diagnostic modeling of microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, Maksim; Brik, Marina; Istenberg, Martin; Wuttke, Heinz-DietrichBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 147-150 : ill

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55

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Diagnostic test generation for statistical bug localization using evolutionary computationGaudesi, Marco; Jenihhin, Maksim; Raik, Jaan; Tihhomirov, Valentin; Ubar, Raimund-JohannesApplications of Evolutionary Computation : 17th European Conference, EvoApplications 2014, Granada, Spain, April 23-25, 2014 : revised selected papers2014 / p. 425-436 : ill https://doi.org/10.1007/978-3-662-45523-4_35 Conference proceeding at Scopus Article at Scopus Conference proceeding at WOS Article at WOS

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56

journal article

Early RTL analysis for SCA vulnerability in fuzzy extractors of memory-based PUF enabled devicesLai, Xinhui; Jenihhin, Maksim; Selims, GeorgiosarXiv.org2020 / 6 p. : ill https://doi.org/10.48550/arXiv.2008.08409 https://arxiv.org/abs/2008.08409

journal article

Related publications 1

Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid

57

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Edge-to-Fog collaborative computing in a swarm of dronesRahbari, Dadmehr; Alam, Muhammad Mahtab; Le Moullec, Yannick; Jenihhin, MaksimAdvances in Model and Data Engineering in the Digitalization Era : MEDI 2021 International Workshops: DETECT, SIAS, CSMML, BIOC, HEDA, Tallinn, Estonia, June 21–23, 2021 : proceedings2021 / p. 78–87 https://doi.org/10.1007/978-3-030-87657-9_6 Conference Proceedings at Scopus Article at Scopus

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58

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EEG analyzer prototype based on FPGAJenihhin, Maksim; Gorev, Maksim; Pesonen, Vadim; Mihhailov, Dmitri; Ellervee, Peeter; Hinrikus, Hiie; Bachmann, Maie; Lass, Jaanus7th International Symposium on Image and Signal Processing and Analysis (ISPA 2011) : September 4-6, 2011, Dubrovnik, Croatia : proceedings2011 / p. 101-106 : ill https://ieeexplore.ieee.org/document/6046588

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59

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Efficient fault injection based on dynamic HDL slicing techniqueBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 52-53 : ill https://doi.org/10.1109/IOLTS.2019.8854419

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Related publications 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

60

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E-learning environment for WEB-based study of testingUbar, Raimund-Johannes; Jutman, Artur; Raik, Jaan; Devadze, Sergei; Jenihhin, Maksim; Aleksejev, Igor; Tšepurov, Anton; Tšertov, Anton; Kostin, Sergei; Orasson, Elmet; Wuttke, Heinz-DietrichProceedings of the 8th European Workshop on Microelectronics Education : EWME 2010 : Darmstadt, Germany, 10-12 May 20102010 / p. 47-52 : ill

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61

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Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHCShibin, Konstantin; Auzinger, Georg; Bakhshiansohi, Hamed; Dabrowski, Anne; Dierlamm, Alexander; Dragicevic, Marko; Gholami, Asghar; Gomez, Gervasio; Guthoff, Moritz; Haranko, Mykyta; Honma, Alan; Jenihhin, MaksimJournal of physics : conference series2023 / p. 50-51 https://doi.org/10.48550/arXiv.2410.14867

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62

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Energy-efficient multi-fragment Markov model guided online model-based testing for MPSoCVain, Jüri; Tsiopoulos, Leonidas; Kharchenko, Vyacheslav; Apneet Kaur; Jenihhin, Maksim; Raik, Jaan; Nõmm, SvenGreen IT Engineering: Social, Business and Industrial Applications2019 / p. 273-297 https://doi.org/10.1007/978-3-030-00253-4_12 Article collection at Scopus Article at Scopus

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63

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Enhancing fault resilience of QNNs by selective neuron splittingAhmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS)2023 / 5 p. : ill https://doi.org/10.1109/AICAS57966.2023.10168633

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Related publications 2

64

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Estonia : e-Design and EDAJenihhin, Maksim50th DAC Global Forum2013 / [2] p

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65

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Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN AcceleratorsTaheri, Mahdi; Cherezova, Natalia; Ansari, Mohammad Saeed; Jenihhin, Maksim; Mahani, Ali; Daneshtalab, Masoud; Raik, JaanProceedings of the Twenty Fifth International Symposium on Quality ElectronicDesign : ISQED 20242024 / 8 p. : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10528372 https://doi.org/10.1109/ISQED60706.2024.10528372 Conference proceedings at Scopus Article at Scopus Article at WOS

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Related publications 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

66

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Extensible open-source framework for translating RTL VHDL IP cores to SystemCSaif Abrar, Syed; Jenihhin, Maksim; Raik, JaanProceedings of the 2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 8-10, 2013, Karlovy Vary, Czech Republic2013 / p. 112-115

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Fast and fair computation offloading management in a swarm of drones using a rating-based federated learning approachRahbari, Dadmehr; Alam, Muhammad Mahtab; Le Moullec, Yannick; Jenihhin, MaksimIEEE Access2021 / p. 113832-113849 https://doi.org/10.1109/ACCESS.2021.3104117 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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69

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ForewordDeniziak, Stanislaw; Sitek, Pawel; Jenihhin, Maksim; Steininger, Andreas; Schölzel, MarioProceedings - 2024 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 20242024 / 1 p. https://doi.org/10.1109/DDECS60919.2024.10508910 Article at Scopus

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FORTUNE: A Negative Memory Overhead Hardware-Agnostic Fault TOleRance TechniqUe in DNNsNazari, Samira; Taheri, Mahdi; Azarpeyvand, Ali; Afsharchi, Mohsen; Ghasempouri, Tara; Herglotz, Christian; Daneshtalab, Masoud; Jenihhin, Maksim2024 IEEE 33rd Asian Test Symposium (ATS)2024 / p. 1-6 : ill https://doi.org//10.1109/ATS64447.2024.10915463 Conference proceedings at Scopus Article at Scopus Article at WOS

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Related publications 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

71

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FP7 DIAMOND : design error diagnosis and correction success storiesRaik, Jaan; Jenihhin, Maksim; Könighofer, RobertEuropean Test Symposium (ETS), 2013, Avignon, France2013 / p. 1-6

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72

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FPGA-based implementation of EEG analyzerGorev, Maksim; Pesonen, Vadim; Mihhailov, Dmitri; Jenihhin, Maksim; Ellervee, PeeterDATE'11 Friday Workshop on "Design Methods and Tools for FPGA-Based Acceleration of Scientific Computing" : Grenoble, France, March 20112011 / [1] p https://www.microsoft.com/en-us/research/wp-content/uploads/2017/03/ellervee.pdf

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FSMD RTL design manipulation for clock interface abstractionAbrar, Syed Saif; Jenihhin, Maksim; Raik, Jaan2015 International Conference on Advances in Computing, Communications and Informatics (ICACCI) : 10-13 August 2015, Kerala, India2015 / p. 463-468 : ill http://dx.doi.org/10.1109/ICACCI.2015.7275652

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Gate-level graph representation learning : a step towards the improved stuck-at faults analysisBalakrishnan, Aneesh; Alexandrescu, Dan; Jenihhin, Maksim; Lange, Thomas; Glorieux, MaximilienProceedings of the Twenty Second International Symposium on Quality Electronic Design (ISQED) : Santa Clara, USA, 7-9 April 20212021 / p. 24-30 https://doi.org/10.1109/ISQED51717.2021.9424256

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Related publications 1

A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks

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Gate-level modelling of NBTI-induced delays under process variationsCopetti, Thiago; Cardoso Medeiros, Guilherme; Bolzani Poehls, Leticia; Vargas, Fabian; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 75-80 : ill http://dx.doi.org/10.1109/LATW.2016.7483343

book article

Jenihhin, Maksim (TalTech author)

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author 17

CV 9

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