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High quality test generation for digital systems (title)
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journal article
High quality test generation for digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Kruus, Helena
;
Raik, Jaan
Romanian journal of information science and technology
2005
/
1, p. 73-84 : ill
journal article
Number of records 1, displaying
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keyword
35
1.
high-level test data generation
2.
High-level Decision Diagrams for Modeling Digital Systems
3.
adaptive test strategy generation
4.
automated test pattern generation
5.
automatic test case generation
6.
automatic test pattern generation
7.
automatic test program generation
8.
behaviour level test generation
9.
functional test generation
10.
Hierarchical Multi-level Test Generation
11.
highlevel test generation
12.
implementation-independent test generation
13.
offline test generation
14.
provably correct test generation
15.
test generation
16.
test generation and fault diagnosis
17.
Test Group Generation for Detecting Multiple Faults
18.
test program generation
19.
digital test
20.
Digital test and testable design
21.
high-level synthesis for test
22.
high-speed serial link test
23.
distributed generation systems
24.
Cross-level Modeling of Faults in Digital Systems
25.
digital circuits and systems
26.
digital control systems
27.
digital product-service systems
28.
digital social systems
29.
digital systems
30.
teaching design and test of systems
31.
high-performance computer systems
32.
high-performance computing systems
33.
high-performance computing systems, Information processing
34.
High-Performance Work Systems
35.
High-Pressure High-Temperature Spark Plasma Sintering
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