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An improved test generation approach for sequential circuits using decision diagrams (title)
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book article
An improved test generation approach for sequential circuits using decision diagrams
Brik, Marina
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 155-158: ill
book article
Number of records 1, displaying
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keyword
28
1.
Structural Decision Diagrams for Modeling Digital Circuits
2.
combinational and sequential circuits
3.
sequential circuits
4.
Binary Decision Diagrams
5.
binary decision diagrams (BDD)
6.
decision diagrams
7.
highlevel decision diagrams
8.
high-level decision diagrams
9.
high-level decision diagrams (HLDD) synthesis
10.
High-level Decision Diagrams for Modeling Digital Systems
11.
shared structurally synthesized Binary Decision Diagrams
12.
adaptive test strategy generation
13.
automated test pattern generation
14.
automatic test case generation
15.
automatic test pattern generation
16.
automatic test program generation
17.
behaviour level test generation
18.
functional test generation
19.
Hierarchical Multi-level Test Generation
20.
high-level test data generation
21.
highlevel test generation
22.
implementation-independent test generation
23.
offline test generation
24.
provably correct test generation
25.
test generation
26.
test generation and fault diagnosis
27.
Test Group Generation for Detecting Multiple Faults
28.
test program generation
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