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Defect-oriented library builder and hierarchical test generation (title)
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Defect-oriented library builder and hierarchical test generation
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
2001
/
p. 163-168 : ill
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keyword
17
1.
Hierarchical Multi-level Test Generation
2.
adaptive test strategy generation
3.
automated test pattern generation
4.
automatic test case generation
5.
automatic test pattern generation
6.
automatic test program generation
7.
behaviour level test generation
8.
functional test generation
9.
high-level test data generation
10.
highlevel test generation
11.
implementation-independent test generation
12.
offline test generation
13.
provably correct test generation
14.
test generation
15.
test generation and fault diagnosis
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
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