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51

artikkel kogumikus

Exact static compaction of independent test sequencesRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 315-318 : ill

artikkel kogumikus

52

artikkel kogumikus

Exact static compaction of sequential circuit tests using branch-and-bound and search state registrationRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest2002 / p. 19-20 https://www.researchgate.net/publication/250423148_Exact_Static_Compaction_of_Sequential_Circuit_Tests_Using_Branch_and-Bound_and_Search_State_Registration

artikkel kogumikus

53

artikkel kogumikus

Fast and efficient static compaction of test sequences based on greedy algorithmsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 117-122

artikkel kogumikus

54

artikkel kogumikus

Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

artikkel kogumikus

55

artikkel kogumikus

Fast fault simulation for extended class of faults in scan-path circuitsUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturProceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam2010 / p. 14-19 https://ieeexplore.ieee.org/document/5438717

artikkel kogumikus

56

artikkel kogumikus

Fast static compaction of test sequences using implications and greedy searchRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest2001 / p. 207-209 : ill

artikkel kogumikus

57

artikkel kogumikus

Fast static compaction of tests composed of independent sequences : basic properties and comparison of methodsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesThe 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II2002 / p. 445-448 : ill http://dx.doi.org/10.1109/ICECS.2002.1046190 https://ieeexplore.ieee.org/document/1046190

artikkel kogumikus

58

artikkel kogumikus

Fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France2010 / p. 653-656 : ill https://ieeexplore.ieee.org/document/5537504

artikkel kogumikus

59

artikkel kogumikus

Fault management instrumentation network based on IEEE P1687 IJTAGShibin, Konstantin; Jutman, Artur; Devadze, SergeiEuropean Test Symposium (ETS), 2013, Avignon, France2013

artikkel kogumikus

60

artikkel kogumikus

Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDsDevadze, Sergei; Raik, Jaan; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 97-102 : ill

artikkel kogumikus

61

dissertatsioon

FPGA-based embedded virtual instrumentation = FPGA-sisesed virtuaalsed test- ja mõõtevahendidAleksejev, Igor2013 http://www.ester.ee/record=b2927687*est

dissertatsioon

62

artikkel kogumikus

FPGA-based synthetic instrumentation for board testAleksejev, Igor; Jutman, Artur; Devadze, Sergei; Odintsov, Sergei; Wenzel, ThomasProceedings : International Test Conference 20122012 / p. 1-10 : ill

artikkel kogumikus

63

artikkel kogumikus

Functional test generation for finite state machinesUbar, Raimund-Johannes; Brik, Marina; Jutman, Artur; Raik, Jaan; Bengtsson, Tomas; Kumar, ShashiBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 205-208 : ill

artikkel kogumikus

64

artikkel kogumikus

Generic interconnect BIST for Network-on-ChipJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanDDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings2005 / p. 224-227 : ill

artikkel kogumikus

65

raamat

Handbook of testing electronic systemsNovak, Ondrej; Gramatova, Elena; Ubar, Raimund-Johannes; Jutman, Artur; Raik, Jaan2005 https://www.ester.ee/record=b2102523*est

raamat

66

artikkel kogumikus

Hardware/Software co-design in practice : MEMOCODE'08 contest experienceReinsalu, Uljana; Devadze, Sergei; Jutman, Artur; Tšertov, Anton; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 55-58 : ill

artikkel kogumikus

67

artikkel ajakirjas EST / artikkel ajakirjas ENG

Health management for self-aware SoCs based on IEEE 1687 infrastructureShibin, Konstantin; Devadze, Sergei; Jutman, Artur; Grabmann, Martin; Pricken, RobinIEEE Design & Test2017 / p. 27-35 : ill https://doi.org/10.1109/MDAT.2017.2750902 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

68

artikkel kogumikus

Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patternsUbar, Raimund-Johannes; Jutman, ArturProceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 19991999 / p. 437-442 : ill

artikkel kogumikus

69

artikkel kogumikus

HLS-based optimization of tau triggering algorithm for LHC: a case studyCherezova, Natalia; Mihhailov, Dmitri; Devadze, Sergei; Jutman, Artur2022 18th Biennial Baltic Electronics Conference (BEC)2022 / 6 p. : ill https://doi.org/10.1109/BEC56180.2022.9935599

artikkel kogumikus

70

artikkel kogumikus

IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoringTšertov, Anton; Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings2018 / 9 p.: ill https://doi.org/10.1109/AUTEST.2018.8532559

artikkel kogumikus

71

artikkel kogumikus EST / artikkel kogumikus ENG

IEEE European Test Symposium (ETS)Eggersgluss, Stephan; Hamdioui, Said; Jutman, Artur; Michael, Maria K.; Raik, Jaan2019 IEEE International Test Conference (ITC)2019 / 4 p https://doi.org/10.1109/ITC44170.2019.9000148 Conference proceeding at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

72

artikkel kogumikus

IEEE P1687 IJTAG demonstrator on FPGAShibin, Konstantin; Aleksejev, Igor; Jutman, Artur; Devadze, SergeiDATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 20122012 / 1 p. : ill

artikkel kogumikus

73

artikkel kogumikus

Improving the efficiency of timing simulation in digital circuits by using structurally synthesized BDDsUbar, Raimund-Johannes; Jutman, Artur; Peng, Z.IEEE Norchip Conference2000 / p. 254-261

artikkel kogumikus

74

artikkel kogumikus

Increasing the speed of delay simulation in digital circuitsUbar, Raimund-Johannes; Jutman, ArturThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 31-34 : ill

artikkel kogumikus

75

artikkel ajakirjas

In-system programming of non-volatile memories on microprocessor-centric boardsTšertov, Anton; Devadze, Sergei; Jutman, Artur; Jasnetski, ArtjomInternational journal of microelectronics and computer science2014 / p. 25-34 : ill

artikkel ajakirjas

Jutman, Artur (autor)

teaviku laadid

autor 33

CV 25

tema kohta 21

märksõna 1

TTÜ märksõna 1