Otsing - TalTech teadusportaal

Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English

Publikatsioonid

Publikatsioonid

Liitotsing

Valitud kirjed 0

built-in self-test (võtmesõna)

—

—

Lisa tingimus Lihtotsing filter

Tühista

teaviku laadid

raamat ..

artikkel ajakirjas ..

artikkel ajalehes ..

artikkel kogumikus ..

dissertatsioon ..

Open Access ..

Teaduspublikatsioon ..

aasta

Toon andmeid..

Toon andmeid..

TTÜ struktuuriüksus

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Tühista

Kirjeid leitud 7
Vaata veel.. (2/260)
Ekspordi

ekspordi kõik päringu tulemused (7)
Salvesta TXT fail

prindi
Märgitud kirjetega toimetamiseks ava valitud kirjed

kuva

reasta
1

artikkel kogumikus

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

artikkel kogumikus
2

artikkel kogumikus

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

artikkel kogumikus
3

artikkel ajakirjas EST / artikkel ajakirjas ENG

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill https://doi.org/10.1016/j.micpro.2014.11.002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG
4

artikkel kogumikus EST / artikkel kogumikus ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG
5

artikkel kogumikus

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

artikkel kogumikus
6

artikkel kogumikus

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

artikkel kogumikus
7

artikkel kogumikus

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

artikkel kogumikus

Kirjeid leitud 7, kuvan 1 - 7

1. built-in self-test
2. logic built-in self-test
3. Automated Synthesis of Software-based Self-test
4. functional self-test
5. self-test
6. self-test architectures
7. software based self-test
8. software-based self-test
9. software-based self-test (SBST)
10. Self-assembly and Self-organization
11. As-built
12. as-built model
13. as-built survey
14. built environment
15. built environment and architecture
16. built environment investment
17. built environment skills needs
18. Built Heritage
19. built in moisture
20. built-in moisture
21. Built-in transformer (BIT)
22. cultural built heritage
23. hand-built pottery
24. sustainable built environment
25. adolescent self-efficacy
26. association of local-self government
27. association of local-self governments
28. corporate energy self-sufficiency
29. covalent self-assembly in solid state
30. desired self-identity
31. diffusion and self-trapping of charge carriers
32. digital self-determination
33. digital self-efficacy
34. digital self-interference cancellation
35. European charter of local self-government
36. European self-sovereign identity framework
37. high strength self-compacting concrete
38. income of self-employed
39. increased self-consumption
40. local self-government
41. nikel-based self-fluxing alloy
42. NiP self-lubricating coating
43. open self‐ventilated machines
44. optical self-mixing
45. OSV (open self‐ventilated) machines
46. perceived general self-efficacy
47. renewables self consumption
48. renewables self-consumption
49. Self assessment tool
50. self aware
51. self learning software
52. self learning system
53. Self organization
54. self organizing map
55. self organizing network
56. self regulating heating
57. self regulation
58. self-analysis
59. self-assembled monolayers
60. self-assembly
61. self-assessed quality of life
62. self-assessment
63. self-assessment tool
64. self-attribution
65. self-aware
66. self-aware contracts
67. self-aware systems
68. self-awareness
69. self-checking
70. self-cleaning surfaces
71. self-consistent channels
72. self-consumption
73. self-costs
74. self-defence
75. self-determination
76. self-determination theory
77. self-determination theory of work motivation
78. self-development
79. self-driving car
80. self-driving cars
81. self-driving minibus
82. self-driving vehicle
83. self-driving vehicles
84. self-efficacy
85. self-efficacy development
86. self-employed
87. self-employment
88. self-evaluation
89. self-fluxing alloy
90. self-governance
91. self-healing
92. self-heating phenomenon
93. self-identification
94. self-identity
95. self-improvement
96. self-insurance
97. self-learning
98. self-lubrication
99. self-management
100. self‐management
101. self-mixing
102. self-organisation
103. self-organised teams
104. self-organization
105. self-organized criticality
106. self-organized teams
107. self-perforating dowel
108. self-propagating high temperature synthesized (SHS)
109. Self-Propagating High-Temperature Synthesis
110. self-propulsion
111. self-regulated learning
112. self-regulation
113. self-reported musculoskeletal disorders
114. self-rolling
115. self-shading envelopes
116. self-sovereign
117. self-study
118. self-study courses
119. self-training
120. social self-development
121. solo self-employment
122. accelerated shelf-life test
123. adaptive test strategy generation
124. antigen test
125. Applications in Test Engineering
126. ASTM G65 dry sand rubber wheel abrasion test
127. automated test environment
128. automated test pattern generation
129. automatic test case generation
130. automatic test pattern generation
131. automatic test program generation
132. Auvergne test-bed
133. battery test
134. behavioral test
135. behaviour level test generation
136. bending test
137. bit-error rate test
138. Board and System Test
139. board test
140. bounds test
141. capillary condensation redistribution test
142. chi-square test
143. closed bottle test
144. cognitive screening test
145. compartment fire test
146. compartment test
147. cone penetration test (CPT)
148. COVID-19 antigen test
149. cutting test
150. cybersecurity test bed
151. DDR4 interconnect test
152. design and test
153. design-for-test
154. deterministic test sequences
155. diagnostic test
156. digital test
157. Digital test and testable design
158. double-pulse test
159. drawing test
160. dry droplet antimicrobial test
161. Embedded figures test
162. embedded test
163. fan pressurisation test
164. final test result prediction
165. four-point bending test
166. FPGA based test
167. FPGA-Assisted Test
168. FPGA-centric test
169. functional test generation
170. Granger causality test
171. hardness test
172. Hierarchical Multi-level Test Generation
173. high-level synthesis for test
174. high-level test data generation
175. highlevel test generation
176. high-speed serial link test
177. IEEE 9 bus test system
178. implementation-independent test generation
179. in situ tensile test in SEM
180. industrial field test
181. in-situ tensile test in SEM
182. Johansen cointegration test
183. Kolmogorov-Smirnov test
184. load test
185. Luria alternating series test
186. Mann–Kendall test
187. Mann-Kendall trend test
188. memory interconnect test
189. microprocessor test
190. Model test
191. multiplier test
192. offline test generation
193. orthogonal test
194. package test analysis
195. parallel design and test
196. performance test
197. piezocone penetration test (CPTu)
198. Point Load Test index
199. pressurisation test
200. processor-centric board test
201. progressive damage test
202. Provably Correct Test Development
203. provably correct test generation
204. pseudo-exhaustive test
205. purity test
206. real-time room temperature test
207. rolling thin film oven test
208. rtioco-based timed test sequences
209. seasonal Mann Kendall test
210. seismic piezocone penetration test
211. sentence writing test
212. serial sevens test
213. ship towing test tank
214. similar material simulation test
215. small-scale fire test
216. small‐scale test
217. soil phosphorus (P) test
218. standard test method
219. static load test
220. static-dynamic probing test (SDT)
221. stress test
222. system level test
223. teaching design and test of systems
224. tensile test
225. tensile test
226. test
227. Test Adapters
228. test and evaluation platform
229. test automation
230. test bench
231. test coverage
232. test driven development
233. test driven modelling
234. test embankment
235. test equipment
236. test generation
237. test generation and fault diagnosis
238. Test Group Generation for Detecting Multiple Faults
239. test groups
240. test model design
241. test optimization
242. test packets
243. test path synthesis
244. test patterns
245. test point insertion
246. test program generation
247. test reference year
248. test replication
249. test scenario description language
250. test-bed
251. test-chips
252. test-house
253. test-pattern
254. test-suite reduction
255. Three-point bending test
256. unit root test
257. usability platform test
258. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

vaste

reasta

Otsing
Valikud 0

ilmumisaasta

autor

TTÜ struktuuriüksus

märksõna

seeria-sari

tema kohta

võtmesõna

TalTech Raamatukogu

Akadeemia tee 1

13519

TalTech koduleht TalTech Raamatukogu koduleht Digikogu Digiteek Teadusandmed

6203551

data@taltech.ee

TalTech Raamatukogu