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memory testing (keyword)
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1
book article
A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs
Cardoso Medeiros, Guilherme
;
Gürsoy, Cemil Cem
;
Fieback, Moritz
;
Wu, Lizhou
;
Jenihhin, Maksim
;
Taouil, Mottaqiallah
;
Hamdioui, Said
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
2020
/
p. 792-797
https://doi.org/10.23919/DATE48585.2020.9116278
book article
Number of records 1, displaying
1 - 1
keyword
100
1.
memory testing
2.
activation memory
3.
cache memory
4.
Digital Object Memory
5.
learning and memory
6.
long short term memory
7.
long short -term memory (LSTM)
8.
long short-term memory (LSTM)
9.
long-short term memory
10.
long-short-term memory (LSTM)
11.
memory
12.
memory architecture
13.
memory effect
14.
memory efficiency
15.
memory interconnect test
16.
memory kernels
17.
memory management
18.
memory network
19.
memory systems
20.
memory-induced resonance
21.
National memory
22.
non-volatile memory
23.
processing-in-memory
24.
random access memory
25.
relaxed memory
26.
shape memory alloy
27.
Shape memory alloys
28.
shape memory efect
29.
accelerated testing
30.
acoustomechanical testing
31.
anaerobic testing
32.
aspect-oriented testing
33.
at-speed testing
34.
benchmark testing
35.
Berridge testing
36.
cancer genomic testing
37.
compliance testing
38.
compositional testing
39.
computer aided testing
40.
conformance testing
41.
courses on electronic testing and design
42.
cybersecurity testing
43.
D. non-destructive testing
44.
design field testing
45.
eddy current testing
46.
erosion testing
47.
fatigue testing
48.
fire testing
49.
hierarchical testing
50.
hypotheses testing
51.
integration testing
52.
laboratory scale testing
53.
load testing
54.
macro mechanical testing and green surface tribology
55.
material testing
56.
materials testing
57.
measurement and testing
58.
mechanical testing
59.
metamorphic testing
60.
microprocessor testing
61.
model based testing
62.
model-based mutation testing
63.
model-based testing
64.
mutation testing
65.
network-testing
66.
non destructive testing
67.
nondestructive testing
68.
non-destructive testing
69.
on-site testing
70.
pin on disc wear testing
71.
PMU calibration testing
72.
PMU testing
73.
point-of-care testing
74.
processor core testing
75.
processor testing
76.
real-time HiL testing
77.
regression testing
78.
RISC processor testing
79.
robustness testing
80.
scenario testing
81.
scratch testing
82.
security testing
83.
small-scale fire testing
84.
software testing
85.
software-in-the-loop (SIL) testing
86.
stand-alone testing
87.
stress-testing
88.
substation testing methods
89.
system testing
90.
tensile testing
91.
testing
92.
testing methods
93.
testing of digital devices
94.
testing of generator
95.
testing of phasor measurement units
96.
two-dimensional array testing
97.
wafer testing
98.
wear testing
99.
vibration testing
100.
virtual testing
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