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book article
A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs
Cardoso Medeiros, Guilherme
;
Gürsoy, Cemil Cem
;
Fieback, Moritz
;
Wu, Lizhou
;
Jenihhin, Maksim
;
Taouil, Mottaqiallah
;
Hamdioui, Said
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
2020
/
p. 792-797
https://doi.org/10.23919/DATE48585.2020.9116278
book article
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keyword
112
1.
memory testing
2.
activation memory
3.
cache memory
4.
Digital Object Memory
5.
in-memory databases
6.
learning and memory
7.
long short term memory
8.
long short -term memory (LSTM)
9.
long short-term memory
10.
long short-term memory (LSTM)
11.
Long Short-Term Memory Networks (LSTMs)
12.
long-short term memory
13.
long-short-term memory (LSTM)
14.
material with memory
15.
memory
16.
memory architecture
17.
memory bottleneck
18.
memory effect
19.
memory efficiency
20.
memory interconnect test
21.
memory kernels
22.
memory management
23.
memory network
24.
memory overhead
25.
memory systems
26.
memory-induced resonance
27.
National memory
28.
non-volatile memory
29.
processing-in-memory
30.
random access memory
31.
relaxed memory
32.
shape memory alloy
33.
Shape memory alloys
34.
shape memory efect
35.
accelerated testing
36.
acoustomechanical testing
37.
anaerobic testing
38.
aspect-oriented testing
39.
at-speed testing
40.
benchmark testing
41.
Berridge testing
42.
burst testing
43.
cancer genomic testing
44.
compliance testing
45.
compositional testing
46.
computer aided testing
47.
conformance testing
48.
courses on electronic testing and design
49.
cybersecurity testing
50.
D. non-destructive testing
51.
deformation testing
52.
design field testing
53.
destructive testing
54.
eddy current testing
55.
eddy current testing (ECT)
56.
erosion testing
57.
fatigue testing
58.
fire testing
59.
hierarchical testing
60.
hypotheses testing
61.
Implementation-Independent Testing of Microprocessors
62.
integration testing
63.
laboratory scale testing
64.
load testing
65.
macro mechanical testing and green surface tribology
66.
material testing
67.
materials testing
68.
measurement and testing
69.
mechanical testing
70.
metamorphic testing
71.
microprocessor testing
72.
model based testing
73.
model-based mutation testing
74.
model-based testing
75.
mutation testing
76.
network-testing
77.
non destructive testing
78.
nondestructive testing
79.
non-destructive testing
80.
on-site testing
81.
pin on disc wear testing
82.
PMU calibration testing
83.
PMU testing
84.
point-of-care testing
85.
processor core testing
86.
processor testing
87.
real-time HiL testing
88.
regression testing
89.
RISC processor testing
90.
robustness testing
91.
safety and security testing
92.
scenario testing
93.
scratch testing
94.
security testing
95.
small-scale fire testing
96.
software testing
97.
software-in-the-loop (SIL) testing
98.
stand-alone testing
99.
stress-testing
100.
substation testing methods
101.
system testing
102.
tensile testing
103.
testing
104.
testing methods
105.
testing of digital devices
106.
testing of generator
107.
testing of phasor measurement units
108.
two-dimensional array testing
109.
wafer testing
110.
wear testing
111.
vibration testing
112.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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