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book article
A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs
Cardoso Medeiros, Guilherme
;
Gürsoy, Cemil Cem
;
Fieback, Moritz
;
Wu, Lizhou
;
Jenihhin, Maksim
;
Taouil, Mottaqiallah
;
Hamdioui, Said
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
2020
/
p. 792-797
https://doi.org/10.23919/DATE48585.2020.9116278
book article
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keyword
117
1.
memory testing
2.
activation memory
3.
cache memory
4.
Digital Object Memory
5.
in-memory databases
6.
learning and memory
7.
long short term memory
8.
long short -term memory (LSTM)
9.
long short-term memory
10.
long short-term memory (LSTM)
11.
Long Short-Term Memory Networks (LSTMs)
12.
long-short term memory
13.
long-short-term memory (LSTM)
14.
material with memory
15.
memory
16.
memory architecture
17.
memory bottleneck
18.
memory effect
19.
memory efficiency
20.
memory interconnect test
21.
memory kernels
22.
memory management
23.
memory network
24.
memory overhead
25.
memory systems
26.
memory-induced resonance
27.
National memory
28.
non-volatile memory
29.
processing-in-memory
30.
random access memory
31.
relaxed memory
32.
shape memory alloy
33.
Shape memory alloys
34.
shape memory efect
35.
accelerated testing
36.
acoustomechanical testing
37.
anaerobic testing
38.
aspect-oriented testing
39.
assessment and testing
40.
at-speed testing
41.
benchmark testing
42.
Berridge testing
43.
burst testing
44.
cancer genomic testing
45.
compliance testing
46.
compositional testing
47.
computer aided testing
48.
cone heater testing
49.
conformance testing
50.
courses on electronic testing and design
51.
cybersecurity testing
52.
D. non-destructive testing
53.
deformation testing
54.
design field testing
55.
destructive testing
56.
eddy current testing
57.
eddy current testing (ECT)
58.
erosion testing
59.
fabric testing
60.
fatigue testing
61.
fire testing
62.
hierarchical testing
63.
hypotheses testing
64.
Implementation-Independent Testing of Microprocessors
65.
integration testing
66.
laboratory scale testing
67.
load testing
68.
macro mechanical testing and green surface tribology
69.
material testing
70.
materials testing
71.
measurement and testing
72.
mechanical testing
73.
metamorphic testing
74.
microprocessor testing
75.
model based testing
76.
model-based mutation testing
77.
model-based testing
78.
mutation testing
79.
network-testing
80.
non destructive testing
81.
nondestructive testing
82.
non-destructive testing
83.
on-site testing
84.
pin on disc wear testing
85.
PMU calibration testing
86.
PMU testing
87.
point-of-care testing
88.
processor core testing
89.
processor testing
90.
real-time HiL testing
91.
regression testing
92.
RISC processor testing
93.
robustness testing
94.
safety and security testing
95.
scenario testing
96.
scratch testing
97.
security testing
98.
shear testing
99.
small-scale fire testing
100.
software testing
101.
software-in-the-loop (SIL) testing
102.
stand-alone testing
103.
stress-testing
104.
substation testing methods
105.
system testing
106.
tensile testing
107.
testing
108.
testing methods
109.
testing of digital devices
110.
testing of generator
111.
testing of phasor measurement units
112.
two-dimensional array testing
113.
ultrasonic testing
114.
wafer testing
115.
wear testing
116.
vibration testing
117.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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