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176
book article
Hierarchical calculation of malicious faults for evaluating the fault-tolerance
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jervan, Gert
;
Ellervee, Peeter
Proceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China
2008
/
p. 222-227 : ill
https://ieeexplore.ieee.org/document/4459544
book article
177
book article
Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Evartson, Teet
;
Lensen, Harri
;
Aarna, Margit
5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada
2007
/
[6] p. [CD-ROM]
book article
178
book article
Hierarchical fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
International Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings
2001
/
p. 181-184 : ill
book article
179
book article
Hierarchical identification of NBTI-critical gates in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
180
book article
Hierarchical identification of untestable faults in sequential circuits
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
;
Kruus, Margus
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 668-671 : ill
http://dx.doi.org/10.1109/DSD.2007.4341539
book article
181
book article
High level fault modeling in digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Brik, Marina
;
Raik, Jaan
Synergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 2
2004
/
p. 486-491
book article
182
book article
High-frequency current sensor for power network on-line mea[s]urements
Kütt, Lauri
;
Järvik, Jaan
;
Vaimann, Toomas
;
Shafiq, Muhammad
;
Lehtonen, Matti
;
Kilter, Jako
Proceedings of the 13th International Scientific Conference Electric Power Engineering 2012 : EPE 2012 : Brno. Vol. 1
2012
/
p. 367-371 : ill
https://www.researchgate.net/publication/262674502_High-Frequency_Current_Sensor_for_Power_Network_On-line_Measurements
book article
183
book article
High-level decision diagram based fault models for targeting FSMs
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 353-358 : ill
http://dx.doi.org/10.1109/DSD.2006.60
book article
184
book article
High-level design error diagnosis using backtrace on decision diagrams
Raik, Jaan
;
Repinski, Urmas
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers
2010
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2010.5669486
book article
185
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
186
book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
187
book article
High-level modeling and testing of multiple control faults in digital systems
Jasnetski, Artjom
;
Oyeniran, Adeboye Stephen
;
Tšertov, Anton
;
Schölzel, Mario
;
Ubar, Raimund-Johannes
Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/DDECS.2016.7482445
book article
188
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
189
journal article
Holistic approach for Fault-Tolerant Network-on-Chip based many-core systems [Online resource]
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Raik, Jaan
;
Jervan, Gert
;
Hollstein, Thomas
arXiv.org
2016
/
[8] p. : ill
journal article
190
dissertation
Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseks
Orasson, Elmet
2007
https://www.ester.ee/record=b2305436*est
dissertation
191
book article
Hybrid FEA-Simulink modelling of permanent magnet assisted synchronous reluctance motor with unbalanced magnet flux
Pando-Acedo, Jaime
;
Rassõlkin, Anton
;
Lehikoinen, Antti
;
Vaimann, Toomas
;
Kallaste, Ants
;
Romero-Cadaval, Enrique
;
Belahcen, Anouar
2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), 27-30 Aug. 2019, Toulouse, France : proceedings
2019
/
p. : 174-180 : ill
https://doi.org/10.1109/DEMPED.2019.8864925
book article
192
journal article EST
/
journal article ENG
Identification and location of PD defects in medium voltage underground power cables using high frequency current transformer
Shafiq, Muhammad
;
Kiitam, Ivar
;
Taklaja, Paul
;
Kütt, Lauri
;
Kauhaniemi, Kimmo
;
Palu, Ivo
IEEE Access
2019
/
art. 8771171, p. 103608 - 103618 : ill
https://doi.org/10.1109/ACCESS.2019.2930704
Journal metrics at Scopus
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Article at WOS
journal article EST
/
journal article ENG
193
book article
Impact of faults and different operating conditions on current parameters in case of broken rotor bars
Kudelina, Karolina
21st International Symposium "Topical problems in the field of electrical and power engineering. Doctoral school of energy and geotechnology. III" : Pärnu, Estonia, June 15-18, 2022
2022
/
p. 41-42 : ill
https://www.ester.ee/record=b5504019*est
book article
194
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
195
book article
Implementation-independent test generation for a large class of faults in RISC processor modules
Jenihhin, Maksim
;
Oyeniran, Adeboye Stephen
;
Raik, Jaan
;
Ubar, Raimund-Johannes
24th Euromicro Conference on Digital System Design (DSD)
2021
https://doi.org/10.1109/DSD53832.2021.00090
book article
196
book article
An improved estimation methodology for hybrid BIST cost calculation
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Korelina, Olga
Proceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 2004
2004
/
p. 297-300 : ill
https://ieeexplore.ieee.org/document/1423882
book article
197
journal article EST
/
journal article ENG
Improved fault classification and localization in power transmission networks using vae-generated synthetic data and machine learning algorithms
Khan, Muhammad Amir
;
Asad, Bilal
;
Vaimann, Toomas
;
Kallaste, Ants
;
Pomarnacki, Raimondas
;
Hyunh, Van Khang
Machines
2023
/
art. 963
https://doi.org/10.3390/machines11100963
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
198
book article
Improved fault emulation for synchronous sequential circuits
Raik, Jaan
;
Ellervee, Peeter
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 72-78 : ill
book article
199
book article
Improving the confidence level in functional safety simulation tools for ISO 26262
Bagbaba, Ahmet Cagri
;
Augusto da Silva, Felipe
;
Sauer, Christian
2018 Design and Verification Conference (DVCON) Europe : [proceedings]
2018
/
6 p. : ill
https://dvcon-proceedings.org/document/improving-the-confidence-level-in-functional-safety-simulation-tools-for-iso-26262/
https://zenodo.org/record/3361607#.Y0PHFnZByHs
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
200
dissertation
Insulation durability and measurement of partial discharge = Isolatsiooni vastupidavus ja osalahenduste mõõtmine
Kiitam, Ivar
2021
https://www.ester.ee/record=b5473274*est
https://digikogu.taltech.ee/et/Item/401e6d0b-f51d-488f-b0d6-2e2bdb8f9496
https://doi.org/10.23658/taltech.62/2021
dissertation
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