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Harmonic spectrum analysis of induction motor with broken rotor bar faultAsad, Bilal; Vaimann, Toomas; Kallaste, Ants; Belahcen, Anouar59th Annual International Scientific Conference on Power and Electrical Engineering : November 12, 13, 2018, Riga Technical University (RTUCON) : conference proceedings2018 / 7 p. : ill https://doi.org/10.1109/RTUCON.2018.8659842

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202

journal article EST / journal article ENG

Health management for self-aware SoCs based on IEEE 1687 infrastructureShibin, Konstantin; Devadze, Sergei; Jutman, Artur; Grabmann, Martin; Pricken, RobinIEEE Design & Test2017 / p. 27-35 : ill https://doi.org/10.1109/MDAT.2017.2750902 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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203

journal article

Hierarchical approaches to test generation and fault simulationUbar, Raimund-JohannesRadioelectronics and informatics2003 / p. 204

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204

book article

Hierarchical calculation of malicious faults for evaluating the fault-toleranceUbar, Raimund-Johannes; Devadze, Sergei; Jenihhin, Maksim; Raik, Jaan; Jervan, Gert; Ellervee, PeeterProceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China2008 / p. 222-227 : ill https://ieeexplore.ieee.org/document/4459544

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205

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Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patternsUbar, Raimund-Johannes; Jutman, ArturProceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 19991999 / p. 437-442 : ill https://www.sciencedirect.com/science/article/pii/S0026271499002036

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206

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Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Evartson, Teet; Lensen, Harri; Aarna, Margit5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada2007 / [6] p. [CD-ROM]

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207

book article

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

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208

book article

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

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209

book article

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

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210

book article

High level fault modeling in digital systemsUbar, Raimund-Johannes; Aarna, Margit; Brik, Marina; Raik, JaanSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 486-491

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211

book article

High-frequency current sensor for power network on-line mea[s]urementsKütt, Lauri; Järvik, Jaan; Vaimann, Toomas; Shafiq, Muhammad; Lehtonen, Matti; Kilter, JakoProceedings of the 13th International Scientific Conference Electric Power Engineering 2012 : EPE 2012 : Brno. Vol. 12012 / p. 367-371 : ill https://www.researchgate.net/publication/262674502_High-Frequency_Current_Sensor_for_Power_Network_On-line_Measurements

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212

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High-level decision diagram based fault models for targeting FSMsRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 353-358 : ill http://dx.doi.org/10.1109/DSD.2006.60

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213

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High-level design error diagnosis using backtrace on decision diagramsRaik, Jaan; Repinski, Urmas; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, Anton28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers2010 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2010.5669486

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214

book article

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

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215

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High-level functional test generation for microprocessor modulesOyeniran, Adeboye Stephen; Ubar, Raimund-JohannesProceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 20192019 / p. 356-361 : ill https://doi.org/10.23919/MIXDES.2019.8787131

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216

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High-level modeling and testing of multiple control faults in digital systemsJasnetski, Artjom; Oyeniran, Adeboye Stephen; Tšertov, Anton; Schölzel, Mario; Ubar, Raimund-JohannesFormal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia2016 / [6] p. : ill http://dx.doi.org/10.1109/DDECS.2016.7482445

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217

book article

High-level path activation technique to speed up sequential circuit test generationRaik, Jaan; Ubar, Raimund-JohannesEuropean Test Workshop 1999 : proceedings, May 25-28, 1999, Constance, Germany1999 / p. 84-89 : ill https://ieeexplore.ieee.org/document/804289

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218

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High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

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219

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High-speed logic level fault simulationUbar, Raimund-Johannes; Devadze, SergeiDesign and test technology for dependable systems-on-chip2011 / p. 310-335 : ill https://www.igi-global.com/chapter/high-speed-logic-level-fault/51407

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220

book article

Hilbert transform, an effective replacement of Park's vector modulus for the detection of rotor faultsAsad, Bilal; Vaimann, Toomas; Kallaste, Ants; Rassõlkin, Anton; Belahcen, Anouar2019 Electric Power Quality and Supply Reliability Conference (PQ) & 2019 Symposium on Electrical Engineering and Mechatronics (SEEM), Kärdla, Estonia, June 12-15, 2019 : proceedings2019 / 4 p. : ill https://doi.org/10.1109/PQ.2019.8818227

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221

newspaper article

Hispaania stsenaarium: miks elektrisüsteemid ootamatult kustuvadLandsberg, Martpostimees.ee2025 https://tehnika.postimees.ee/8239729/eksperdi-ulevaade-hispaania-stsenaarium-miks-elektrisusteemid-ootamatult-kustuvad

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222

journal article

Holistic approach for Fault-Tolerant Network-on-Chip based many-core systems [Online resource]Azad, Siavoosh Payandeh; Niazmand, Behrad; Raik, Jaan; Jervan, Gert; Hollstein, ThomasarXiv.org2016 / [8] p. : ill

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223

dissertation

Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseksOrasson, Elmet2007 https://www.ester.ee/record=b2305436*est

dissertation

224

book article

Hybrid FEA-Simulink modelling of permanent magnet assisted synchronous reluctance motor with unbalanced magnet fluxPando-Acedo, Jaime; Rassõlkin, Anton; Lehikoinen, Antti; Vaimann, Toomas; Kallaste, Ants; Romero-Cadaval, Enrique; Belahcen, Anouar2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED), 27-30 Aug. 2019, Toulouse, France : proceedings2019 / p. : 174-180 : ill https://doi.org/10.1109/DEMPED.2019.8864925

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225

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Identification and location of PD defects in medium voltage underground power cables using high frequency current transformerShafiq, Muhammad; Kiitam, Ivar; Taklaja, Paul; Kütt, Lauri; Kauhaniemi, Kimmo; Palu, IvoIEEE Access2019 / art. 8771171, p. 103608 - 103618 : ill https://doi.org/10.1109/ACCESS.2019.2930704 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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