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151
book article
Fault management instrumentation network based on IEEE P1687 IJTAG
Shibin, Konstantin
;
Jutman, Artur
;
Devadze, Sergei
European Test Symposium (ETS), 2013, Avignon, France
2013
book article
152
journal article EST
/
journal article ENG
Fault management techniques to enhance the reliability of power electronic converters : an overview
Rahimpour, Saeed
;
Husev, Oleksandr
;
Vinnikov, Dmitri
;
Vosoughi Kurdkandi, Naser
;
Tarzamni, Hadi
IEEE Access
2023
/
p. 13432-13446
https://doi.org/10.1109/ACCESS.2023.3242918
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Common-ground energy router structure with enhanced reliability and protection = Ühise nulljuhtmega suurendatud töökindluse ja kaitsega energiaruuter
153
book article
Fault model and test synthesis for RISC-processors
Ubar, Raimund-Johannes
;
Markus, Antti
;
Jervan, Gert
;
Raik, Jaan
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 229-232: ill
book article
154
book article
Fault modeling and diagnosis in digital systems
Ubar, Raimund-Johannes
CREDES Summer School : Dependable Systems Design : handouts
2011
/
p. 91-106 : ill
book article
155
book article
Fault path detection using a spectral method
Porwik, Piotr
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 315-318: ill
book article
156
book article
Fault prediction in power network
Kangilaski, Taivo
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 289-292
book article
157
dissertation
Fault simulation of digital systems = Digitaalsüsteemide rikete simuleerimine
Devadze, Sergei
2009
https://digi.lib.ttu.ee/i/?445
https://www.ester.ee/record=b2508727*est
dissertation
158
book article
Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDs
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings
2006
/
p. 97-102 : ill
book article
159
book article
Fault simulation with parallel exact critical path tracing in multiple core environment
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 9-13 March 2015, Grenoble, France
2015
/
p. 1180-1185 : ill
book article
160
book article
Fault-aware performance assessment approach for embedded networks
Malburg, Jan
;
Janson, Karl
;
Raik, Jaan
;
Dannemann, Frank
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
2019
/
4 p. : ill
https://doi.org/10.1109/DDECS.2019.8724670
book article
161
book article
Fault-resilient NoC router with transparent resource allocation
Putkaradze, Tsotne
;
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Raik, Jaan
;
Jervan, Gert
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
https://doi.org/10.1109/ReCoSoC.2017.8016161
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8016161
book article
162
book article
Faults and fault models for integrated circuits and systems [Electronic resource] : [slides]
Ubar, Raimund-Johannes
Design and Test Technology for Dependable Hardware/Software Systems : DEDIS/DAAD Summer Academy : BTU Cottbus, Sept. 1st-12th, 2008
2008
/
[64] p. : ill. [CD-ROM]
book article
163
book
Fehler in Automaten
1989
http://www.ester.ee/record=b2015320*est
book
164
journal article
Fehlerbestimmung in kombinatorischen Scaltungen durch Lösung der Booleschen Differentialgleichungen
Ubar, Raimund-Johannes
Nachrichtentechnik, Elektronik : technisch-wissenschaftlishe Zeitschrift für die gesamte elektronische Nachrichtentechnik
1978
/
p. 330-334 : ill
https://www.ester.ee/record=b1550811*est
journal article
165
book article
Finite element analysis based technique implementation for fault diagnostic of electrical machines
Akbar, Siddique
22nd International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology III : Pärnu, Estonia, August 23-26, 2023
2023
/
p. 103-104
https://www.ester.ee/record=b5570906*est
book article
166
book article
First results on load model estimation using digital fault recorder measurements
Leinakse, Madis
;
Sarnet, Tanel
;
Kangro, Triin
;
Kilter, Jako
16th International Symposium "Topical Problems in the Field of Electrical and Power Engineering. Doctoral School of Energy and Geotechnology III" : Pärnu, Estonia, January 16-21, 2017
2017
/
p. 101-105 : ill
http://www.ester.ee/record=b4650094*est
book article
167
book article
FPGA based fault emulation of synchronous sequential circuits
Ellervee, Peeter
;
Raik, Jaan
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Proceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 2004
2004
/
p. 59-62
https://ieeexplore.ieee.org/abstract/document/1423822
book article
168
journal article
FPGA-based fault emulation of synchronous sequential circuits
Ellervee, Peeter
;
Raik, Jaan
;
Tammemäe, Kalle
;
Ubar, Raimund-Johannes
IET computers and digital techniques
2007
/
2, p. 70-76 : ill
https://ieeexplore.ieee.org/abstract/document/1423822
journal article
169
book article
A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routers
Saltarelli, Pietro
;
Niazmand, Behrad
;
Raik, Jaan
;
Govind, Vineeth
;
Hollstein, Thomas
;
Jervan, Gert
;
Hariharan, Ranganathan
NOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 2015
2015
/
[8] p. : ill
http://dx.doi.org/10.1145/2786572.2788713
book article
170
book article
From online fault detection to fault management in network-on-chips : a ground-up approach
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Janson, Karl
;
Nevin, George
;
Oyeniran, Adeboye Stephen
;
Putkaradze, Tsotne
;
Apneet Kaur
;
Raik, Jaan
;
Jervan, Gert
;
Ubar, Raimund-Johannes
;
Hollstein, Thomas
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
2017
/
p. 48-53 : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
book article
171
book article
Guardbands in random testing
Kemnitz, Günter
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 85-88: ill
book article
172
book article
Handling of SETs on NoC links by exploitation of inherent redundancy in circular input buffers [Online resource]
Janson, Karl
;
Pihlak, Rene
;
Azad, Siavoosh Payandeh
;
Niazmand, Behrad
;
Jervan, Gert
;
Raik, Jaan
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600989
book article
173
book article
Harmonic spectrum analysis of induction motor with broken rotor bar fault
Asad, Bilal
;
Vaimann, Toomas
;
Kallaste, Ants
;
Belahcen, Anouar
59th Annual International Scientific Conference on Power and Electrical Engineering : November 12, 13, 2018, Riga Technical University (RTUCON) : conference proceedings
2018
/
7 p. : ill
https://doi.org/10.1109/RTUCON.2018.8659842
book article
174
journal article EST
/
journal article ENG
Health management for self-aware SoCs based on IEEE 1687 infrastructure
Shibin, Konstantin
;
Devadze, Sergei
;
Jutman, Artur
;
Grabmann, Martin
;
Pricken, Robin
IEEE Design & Test
2017
/
p. 27-35 : ill
https://doi.org/10.1109/MDAT.2017.2750902
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
175
journal article
Hierarchical approaches to test generation and fault simulation
Ubar, Raimund-Johannes
Radioelectronics and informatics
2003
/
p. 204
journal article
Number of records 373, displaying
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