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126

newspaper article

Experts: No need to worry about the impact of solar storms todayPiir, Raitnews.err.ee2024 Experts: No need to worry about the impact of solar storms today

newspaper article

127

journal article EST / journal article ENG

Explainability and transparency of classifiers for air-handling unit faults using explainable artificial intelligence (XAI)Meas, Molika; Machlev, Ram; Köse, Ahmet; Tepljakov, Aleksei; Loo, Lauri; Levron, Yoash; Petlenkov, Eduard; Belikov, JuriSensors2022 / art. 6338 : ill https://doi.org/10.3390/s22176338 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

128

journal article EST / journal article ENG

Exploring the limits of early predictive maintenance in wind turbines applying an anomaly detection techniqueJankauskas, Mindaugas; Serackis, Artūras; Šapurov, Martynas; Pomarnacki, Raimondas; Baskys, Algirdas; Hyunh, Van Khang; Vaimann, Toomas; Zakis, JanisSensors2023 / art. 5695 https://doi.org/10.3390/s23125695 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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129

book article

Extended checkers for control part of routers in network-on-chipsHariharan, Ranganathan; Niazmand, Behrad; Hollstein, Thomas; Raik, Jaan; Jervan, GertMEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France2015 / p. 36-39 : ill

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130

newspaper article

Facebooki katkestus mõjutas nii ettevõtete kui ka riikide toimepidevust [Võrguväljaanne]Pärli, Merilinerr.ee2021 "Facebooki katkestus mõjutas nii ettevõtete kui ka riikide toimepidevust"

newspaper article

131

newspaper article

Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike [Võrguväljaanne]ohtuleht.ee2021 "Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike"

newspaper article

132

journal article EST / journal article ENG

Failure consequence evaluation of uncontrollable district heating networkMao, Ding; Wang, Peng; Ju, Yuchen; Ni, LongSustainable cities and society2022 / art. 103593, 16 p. : ill https://doi.org/10.1016/j.scs.2021.103593 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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133

journal article

Failure mechanisms in oil-shale pillarsPastarus, Jüri-RivaldoOil shale1994 / 3, p. 251-257: ill https://kirj.ee/wp-content/plugins/kirj/pub/OS-3-1994-251-257_20230316182205.pdf

journal article

134

book article

Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

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135

book article

Fast fault simulation for extended class of faults in scan-path circuitsUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturProceedings : Fifth IEEE International Symposium on Electronic Design, Test and Applications : DELTA 2010 : 13-15 January 2010, Ho Chi Minh City, Vietnam2010 / p. 14-19 https://ieeexplore.ieee.org/document/5438717

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136

journal article EST / journal article ENG

Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

137

book article

Fast RTL fault simulation using decision diagrams and bitwise set operationsReinsalu, Uljana; Raik, Jaan; Ubar, Raimund-Johannes; Ellervee, Peeter2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada2011 / p. 164-170 https://ieeexplore.ieee.org/document/6104440

book article

138

book article

Fault aliasing of signature analyzersKemnitz, Günter; Kärger, ReinhardBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 339-346: ill

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139

book article

Fault analysis of manufacturing systems as additional constraint by simulationKaraulova, Tatjana; Papstel, JüriDAAAM international scientific book 20032003 / p. 295-304 : ill

book article

140

journal article

Fault analysis of manufacturing systems as additional constraint by simulationKaraulova, Tatjana; Papstel, JüriInternational journal of simulation modelling2003 / 1/2, p. 5-13 : ill

journal article

141

book article

Fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France2010 / p. 653-656 : ill https://ieeexplore.ieee.org/document/5537504

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142

journal article EST / journal article ENG

Fault detecting accuracy of mechanical damages in rolling bearingsKudelina, Karolina; Baraškova, Tatjana; Shirokova, Veroonika; Vaimann, Toomas; Rassõlkin, AntonMachines2022 / art. 86 https://doi.org/10.3390/machines10020086 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Seotud publikatsioonid 1

Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil

143

book article

Fault detection and predictive maintenance of electrical machines : perspective chapterRaja, Hadi Ashraf; Kudelina, Karolina; Asad, Bilal; Vaimann, ToomasNew Trends in Electric Machines - Technology and Applications2022 https://doi.org/10.5772/intechopen.107167

book article

Seotud publikatsioonid 1

IoT based tools and methods for electrical machine diagnostics = Asjade interneti põhised tööriistad ja meetodid elektrimasinate diagnostikaks

144

book article

Fault detection and protection system for the power converters with high-voltage IGBTs [Electronic resource]Vinnikov, Dmitri; Roasto, Indrek; Lehtla, TõnuICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : August 31 - September 3, 2008, Malta2008 / p. 922-925 : ill. [CD-ROM] https://ieeexplore.ieee.org/document/4675005

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145

book article

Fault diagnosis in integrated circuits with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Evartson, Teet; Lensen, Harri10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 604-610 : ill http://dx.doi.org/10.1109/DSD.2007.4341530

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146

journal article

Fault diagnosis in VLSI devicesUbar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering1995 / 1, p. 51-67

journal article

147

book article

Fault diagnosis of additional vibration in Cartesian robotAutsou, Siarhei21st International Symposium "Topical problems in the field of electrical and power engineering. Doctoral school of energy and geotechnology. III" : Pärnu, Estonia, June 15-18, 20222022 / p. 21-22 : ill https://www.ester.ee/record=b5504019*est

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148

book article

Fault diagnosis system of Cartesian robot for various belt tensionAutsou, Siarhei; Vaimann, Toomas; Rassõlkin, Anton; Kudelina, Karolina2022 International Conference on Diagnostics in Electrical Engineering (Diagnostika)2022 / 4 l https://doi.org/10.1109/Diagnostika55131.2022.9905111

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149

book article

Fault emulation on FPGA : a feasibility studyEllervee, Peeter; Raik, Jaan; Tihhomirov, ValentinIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 92-95 : ill https://www.researchgate.net/publication/246171898_Fault_Emulation_on_FPGA_A_Feasibility_Study

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150

book article

Fault locating in unearthed MV networks based on analysis of wave transientsJärvik, Jaan; Panov, ValeriThe 4th International Conference Electric Power Quality and Supply Reliability : August 29...31, 2004, Pedase, Estonia : proceedings2004 / p. 163-168

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