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book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
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keyword
102
1.
RISC processor testing
2.
processor core testing
3.
processor testing
4.
RISC processors
5.
RISC-V
6.
RISC-V processors
7.
RISC-V Security Verification
8.
ARM processor
9.
crypto processor
10.
digital signal processor (DSP)
11.
multicore processor
12.
multi-processor
13.
multi-processor system-on-chip
14.
multi-processor system-on-chips (MPSoCs)
15.
Muti-Processor System on Chip (MPSoC)
16.
processor architecture
17.
processor designs
18.
processor-centric board
19.
processor-centric board test
20.
accelerated testing
21.
acoustomechanical testing
22.
anaerobic testing
23.
aspect-oriented testing
24.
assessment and testing
25.
at-speed testing
26.
benchmark testing
27.
Berridge testing
28.
burst testing
29.
cancer genomic testing
30.
compliance testing
31.
compositional testing
32.
computer aided testing
33.
cone heater testing
34.
conformance testing
35.
courses on electronic testing and design
36.
cybersecurity testing
37.
D. non-destructive testing
38.
deformation testing
39.
design field testing
40.
destructive testing
41.
eddy current testing
42.
eddy current testing (ECT)
43.
erosion testing
44.
fabric testing
45.
fatigue testing
46.
fire testing
47.
hierarchical testing
48.
hypotheses testing
49.
Implementation-Independent Testing of Microprocessors
50.
integration testing
51.
laboratory scale testing
52.
load testing
53.
macro mechanical testing and green surface tribology
54.
material testing
55.
materials testing
56.
measurement and testing
57.
mechanical testing
58.
memory testing
59.
metamorphic testing
60.
microprocessor testing
61.
model based testing
62.
model-based mutation testing
63.
model-based testing
64.
mutation testing
65.
network-testing
66.
non destructive testing
67.
nondestructive testing
68.
non-destructive testing
69.
non-destructive testing (NDT)
70.
On-site drug testing
71.
on-site testing
72.
pin on disc wear testing
73.
PMU calibration testing
74.
PMU testing
75.
point-of-care testing
76.
real-time HiL testing
77.
regression testing
78.
robustness testing
79.
safety and security testing
80.
scenario testing
81.
scratch testing
82.
security testing
83.
shear testing
84.
small-scale fire testing
85.
software testing
86.
software-in-the-loop (SIL) testing
87.
stand-alone testing
88.
stress-testing
89.
substation testing methods
90.
system testing
91.
tensile testing
92.
testing
93.
testing methods
94.
testing of digital devices
95.
testing of generator
96.
testing of phasor measurement units
97.
two-dimensional array testing
98.
ultrasonic testing
99.
wafer testing
100.
wear testing
101.
vibration testing
102.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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