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at-speed testing (võtmesõna)

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At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

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Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill https://doi.org/10.1016/j.micpro.2014.11.002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

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Kirjeid leitud 3, kuvan 1 - 3

1. at-speed testing
2. absolute convergence with speed
3. A-statistical convergence with speed
4. boundedness and summability with speed
5. boundedness with speed
6. convergence and absolute convergence with speed
7. convergence and boundedness with speed
8. convergence and α-absolute convergence with speed
9. convergence with speed
10. Drilling speed
11. high speed boat
12. high speed craft (HSC)
13. high speed machining
14. high speed measurement
15. high speed planing craft
16. high-speed
17. high-speed camera
18. high-speed craft
19. high-speed design
20. high-speed MAS (magic angle spinning)
21. high-speed planing crafts
22. high-speed railway
23. high-speed serial link test
24. high-speed temperature scanner
25. high-speed temperature scanner (HSTS)
26. high-speed thermogravimetric analysis
27. low speed
28. operational speed
29. paranormal absolute convergence with speed
30. paranormal boundedness with speed
31. paranormal convergence with speed
32. paranormed absolute convergence with speed
33. paranormed boundedness with speed
34. paranormed convergence with speed
35. paranormed zero-convergence with speed
36. peeling speed
37. Pollen fall speed
38. speed
39. speed and position estimation
40. speed of convergence
41. speed of releases
42. speed tracking setpoints
43. speed-Maddox spaces
44. summability and absolute summability with speed
45. summability and boundedness with speed
46. zero-convergence with speed
47. variable speed drive
48. variable speed drives
49. variable speed wind turbines
50. variable-speed drives
51. variable-speed drives (VSDs)
52. water speed
53. wind speed
54. α-absolute convergence with speed
55. α-absolute summability with speed
56. accelerated testing
57. acoustomechanical testing
58. anaerobic testing
59. aspect-oriented testing
60. assessment and testing
61. benchmark testing
62. Berridge testing
63. burst testing
64. cancer genomic testing
65. compliance testing
66. compositional testing
67. computer aided testing
68. cone heater testing
69. conformance testing
70. courses on electronic testing and design
71. cybersecurity testing
72. D. non-destructive testing
73. deformation testing
74. design field testing
75. destructive testing
76. eddy current testing
77. eddy current testing (ECT)
78. erosion testing
79. fabric testing
80. fatigue testing
81. fire testing
82. hierarchical testing
83. hypotheses testing
84. Implementation-Independent Testing of Microprocessors
85. integration testing
86. laboratory scale testing
87. load testing
88. macro mechanical testing and green surface tribology
89. material testing
90. materials testing
91. measurement and testing
92. mechanical testing
93. memory testing
94. metamorphic testing
95. microprocessor testing
96. model based testing
97. model-based mutation testing
98. model-based testing
99. mutation testing
100. network-testing
101. non destructive testing
102. nondestructive testing
103. non-destructive testing
104. on-site testing
105. pin on disc wear testing
106. PMU calibration testing
107. PMU testing
108. point-of-care testing
109. processor core testing
110. processor testing
111. real-time HiL testing
112. regression testing
113. RISC processor testing
114. robustness testing
115. safety and security testing
116. scenario testing
117. scratch testing
118. security testing
119. shear testing
120. small-scale fire testing
121. software testing
122. software-in-the-loop (SIL) testing
123. stand-alone testing
124. stress-testing
125. substation testing methods
126. system testing
127. tensile testing
128. testing
129. testing methods
130. testing of digital devices
131. testing of generator
132. testing of phasor measurement units
133. two-dimensional array testing
134. ultrasonic testing
135. wafer testing
136. wear testing
137. vibration testing
138. virtual testing

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