Otsing - TalTech teadusportaal

Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English

Publikatsioonid

Publikatsioonid

Otsing

Valitud kirjed 0

at-speed testing (võtmesõna)

—

—

—

—

Lisa tingimus Liitotsing filter

Tühista

teaviku laadid

raamat ..

artikkel ajakirjas ..

artikkel ajalehes ..

artikkel kogumikus ..

dissertatsioon ..

Open Access ..

Teaduspublikatsioon ..

aasta

Toon andmeid..

Toon andmeid..

TTÜ struktuuriüksus

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Tühista

Kirjeid leitud 3
Vaata veel.. (1/133)
Ekspordi

ekspordi kõik päringu tulemused (3)
Salvesta TXT fail

prindi
Märgitud kirjetega toimetamiseks ava valitud kirjed

kuva

reasta
1

artikkel kogumikus

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

artikkel kogumikus
2

artikkel ajakirjas EST / artikkel ajakirjas ENG

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill https://doi.org/10.1016/j.micpro.2014.11.002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG
3

artikkel kogumikus

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

artikkel kogumikus

Kirjeid leitud 3, kuvan 1 - 3

1. at-speed testing
2. absolute convergence with speed
3. A-statistical convergence with speed
4. boundedness and summability with speed
5. boundedness with speed
6. convergence and absolute convergence with speed
7. convergence and boundedness with speed
8. convergence and α-absolute convergence with speed
9. convergence with speed
10. Drilling speed
11. high speed boat
12. high speed craft (HSC)
13. high speed machining
14. high speed measurement
15. high-speed
16. high-speed camera
17. high-speed craft
18. high-speed design
19. high-speed MAS (magic angle spinning)
20. high-speed planing crafts
21. high-speed railway
22. high-speed serial link test
23. high-speed temperature scanner
24. high-speed temperature scanner (HSTS)
25. high-speed thermogravimetric analysis
26. low speed
27. operational speed
28. paranormal absolute convergence with speed
29. paranormal boundedness with speed
30. paranormal convergence with speed
31. paranormed absolute convergence with speed
32. paranormed boundedness with speed
33. paranormed convergence with speed
34. paranormed zero-convergence with speed
35. Pollen fall speed
36. speed
37. speed and position estimation
38. speed of convergence
39. speed of releases
40. speed tracking setpoints
41. speed-Maddox spaces
42. summability and absolute summability with speed
43. summability and boundedness with speed
44. zero-convergence with speed
45. variable speed drive
46. variable speed drives
47. variable speed wind turbines
48. variable-speed drives
49. variable-speed drives (VSDs)
50. water speed
51. wind speed
52. α-absolute convergence with speed
53. α-absolute summability with speed
54. accelerated testing
55. acoustomechanical testing
56. anaerobic testing
57. aspect-oriented testing
58. assessment and testing
59. benchmark testing
60. Berridge testing
61. burst testing
62. cancer genomic testing
63. compliance testing
64. compositional testing
65. computer aided testing
66. conformance testing
67. courses on electronic testing and design
68. cybersecurity testing
69. D. non-destructive testing
70. deformation testing
71. design field testing
72. destructive testing
73. eddy current testing
74. eddy current testing (ECT)
75. erosion testing
76. fatigue testing
77. fire testing
78. hierarchical testing
79. hypotheses testing
80. Implementation-Independent Testing of Microprocessors
81. integration testing
82. laboratory scale testing
83. load testing
84. macro mechanical testing and green surface tribology
85. material testing
86. materials testing
87. measurement and testing
88. mechanical testing
89. memory testing
90. metamorphic testing
91. microprocessor testing
92. model based testing
93. model-based mutation testing
94. model-based testing
95. mutation testing
96. network-testing
97. non destructive testing
98. nondestructive testing
99. non-destructive testing
100. on-site testing
101. pin on disc wear testing
102. PMU calibration testing
103. PMU testing
104. point-of-care testing
105. processor core testing
106. processor testing
107. real-time HiL testing
108. regression testing
109. RISC processor testing
110. robustness testing
111. safety and security testing
112. scenario testing
113. scratch testing
114. security testing
115. small-scale fire testing
116. software testing
117. software-in-the-loop (SIL) testing
118. stand-alone testing
119. stress-testing
120. substation testing methods
121. system testing
122. tensile testing
123. testing
124. testing methods
125. testing of digital devices
126. testing of generator
127. testing of phasor measurement units
128. two-dimensional array testing
129. ultrasonic testing
130. wafer testing
131. wear testing
132. vibration testing
133. virtual testing

vaste

reasta

Otsing
Valikud 0

ilmumisaasta

autor

TTÜ struktuuriüksus

märksõna

seeria-sari

tema kohta

võtmesõna

TalTech Raamatukogu

Akadeemia tee 1

13519

TalTech koduleht TalTech Raamatukogu koduleht Digikogu Digiteek Teadusandmed

6203551

data@taltech.ee

TalTech Raamatukogu