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Ubar, Raimund-Johannes (TTÜ author)
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326
journal article
Hierarchical physical defect reasoning in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Brik, Marina
Estonian journal of engineering
2011
/
3, p. 185-200
journal article
327
book article
Hierarchical test generation based on alternative graph model
Ubar, Raimund-Johannes
Proceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 1995
1995
/
p. 18
book article
328
journal article
Hierarchical test generation for combinational circuits with real defects coverage
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2002
/
p. 1141-1149 : ill
journal article
329
book article
Hierarchical test generation for complex digital systems with control and data processing parts
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 43-52
book article
330
dissertation
Hierarchical test generation for digital circuits represented by Decision Diagrams : thesis on informatics and system engineering
Raik, Jaan
2001
https://www.ester.ee/record=b1578107*est
dissertation
331
book article
Hierarchical test generation for digital systems
Brik, Marina
;
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Mixed design of integrated circuits and systems
1998
/
p. 131-136: ill
book article
332
book article
Hierarchical test generation for digital systems based on combining bottom-up and top-down approaches
Raik, Jaan
;
Ubar, Raimund-Johannes
World Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 1
1998
/
p. 374-381: ill
book article
333
book article
Hierarchical test generation for finite state machines
Brik, Marina
;
Ubar, Raimund-Johannes
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 319-324: ill
book article
334
book article
Hierarchical test generation with multi-level decision diagram models
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 1998
1998
/
p. 26-33
book article
335
book article
Hierarchical test generation. SEMI show slides
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 53-64
book article
336
book article
Hierarchical test synthesis for digital systems using alternative graph model
Ubar, Raimund-Johannes
Quantitative aspects of designing and validating dependable computing systems
1995
book article
337
book article
Hierarchical timing-critical paths analysis in sequential circuits
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
;
Devadze, Sergei
;
Kostin, Sergei
2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2018) : 2 – 4 July 2018, Spain
2018
/
6 p. : ill
https://doi.org/10.1109/PATMOS.2018.8464176
book article
338
book article
High level fault modeling in digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Brik, Marina
;
Raik, Jaan
Synergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 2
2004
/
p. 486-491
book article
339
journal article
High quality test generation for digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Kruus, Helena
;
Raik, Jaan
Romanian journal of information science and technology
2005
/
1, p. 73-84 : ill
journal article
340
book article
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
book article
341
book article
High-level combined deterministic and pseudo-exhuastive test generation for RISC processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
book article
342
book article
High-level decision diagram based fault models for targeting FSMs
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 353-358 : ill
http://dx.doi.org/10.1109/DSD.2006.60
book article
343
book article
High-Level Decision Diagram manipulations for code coverage analysis
Minakova, Karina
;
Reinsalu, Uljana
;
Tšepurov, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 207-210 : ill
book article
344
book article
High-level decision diagrams based coverage metrics for verification and test
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009
2009
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2009.4813792
book article
345
book article
High-level decision diagrams for improving simulation performance of digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Morawiec, Adam
SCI 2000 : World Multiconference on Systemics, Cybernetics and Informatics : July 23-26, 2000, Orlando, Florida, USA : proceedings. Volume IX, Industrial Systems
2000
/
p. 62-67 : ill
book article
346
book article
High-level design error diagnosis using backtrace on decision diagrams
Raik, Jaan
;
Repinski, Urmas
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers
2010
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2010.5669486
book article
347
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
348
book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
349
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
350
dissertation
High-level implementation-independent software-based self-test for RISC type microprocessors = Mikroprotsessorite tarkvarapõhine implementatsioonist mittesõltuv funktsionaalne enesekontroll
Oyeniran, Adeboye Stephen
2020
https://digikogu.taltech.ee/et/Item/08a75fbb-3f71-4fe4-b3d0-3f37a9a5f36d
dissertation
Number of records 831, displaying
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55
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Avik, Eduard Johannes
6.
Bauer, Johannes
7.
Bender, Naatan Johannes
8.
Buchmann, Johannes
9.
Deelstra, Johannes
10.
Ehala, Johannes
11.
Engelmayer, Johannes
12.
Gotzmann, Johannes
13.
Helander, Johannes
14.
Hint, Johannes
15.
Hüsse, Johannes
16.
Johannes, Anu
17.
Johannes, Ellen
18.
Johannes, Ille
19.
Johannes, Kaljo-Mihkel
20.
Järv, Johannes
21.
Kadak, Johannes
22.
Kajander, Aleksi Oskar Johannes
23.
Kerkhoven, Eduard Johannes
24.
Kiivet, Johannes
25.
Krimmer, Robert Johannes
26.
Kukebal, Johannes
27.
Meitre, Johannes
28.
Miller, Johannes
29.
Mühlman, Johannes
30.
Norberg, Johannes
31.
Notermans, Antonius Johannes Hubertus
32.
Ortlepp, Johannes
33.
Parikas, Johannes
34.
Pello, Johannes
35.
Pervik, Johannes-Eduard
36.
Piiper, Johannes
37.
Presmann, Johannes
38.
Putk, Aksel-Johannes
39.
Pätsch, Johannes
40.
Saar, Johannes
41.
Sautter, Johannes
42.
Sinisalo, Touko Johannes
43.
Steinbrunn, Johannes
44.
Sutt, Johannes
45.
Zeiringer, Johannes Paul
46.
Taimsalu, Johannes
47.
Talu, Martin Johannes
48.
Tammekänd, Johannes
49.
Tilk, Johannes
50.
Tralla, Johannes
51.
Veerus, Johannes
52.
Vibur, Johannes Ferdinand
53.
Vind, Johannes
54.
Voll, Johannes
55.
Voltri, Johannes
CV
55
1.
Ubar, Raimund-Johannes 1941
2.
Räämet, Raimund 1918-2004
3.
Aare, Johannes 1915-2000
4.
Ahrenschild, Johannes (-1936)
5.
Alaots, Johannes
6.
Aljak, Arnold Johannes
7.
Allik, Erich-Johannes
8.
Avik, Eduard Johannes
9.
Drechsler, Wolfgang Johannes Max
10.
Ehala, Johannes 1986
11.
Hint, Johannes 1914-1985
12.
Johannes, Ille 1939
13.
Johannson, Johannes
14.
Johanson, Johannes
15.
Juhans, Johannes 1874-1956
16.
Kajander, Aleksi Oskar Johannes 1994
17.
Kiiwet, Johannes
18.
Kiivet, Johannes 1879-1967
19.
Kivit, Johannes
20.
Kollist, Johannes 1884-1937
21.
Kollist, Johannes Theodor
22.
Korv, August Johannes 1911-1981
23.
Krimmer, Robert Johannes
24.
Käpp, Martin Johannes
25.
Langel, Johannes 1900-1985
26.
Langell, Johannes
27.
Livländer, Robert Johannes
28.
Madise, Johannes 1920
29.
Meitre, Johannes 1906-1978
30.
Messer, Johannes
31.
Mäll, Johannes 1911-1981
32.
Mühlman, Johannes
33.
Mühlmann, Johannes 1888-1936
34.
Notermans, Antonius Johannes Hubertus 1959
35.
Nuudi, Johannes 1895-1975
36.
Palo, Johannes 1925-1960
37.
Pals, Johannes 1903-1941
38.
Pello, Johannes 1958
39.
Pervik, Johannes 1892-1958
40.
Presmann, Johannes 1942
41.
Putk, Aksel-Johannes 1928-1999
42.
Püümann, Mait Johannes
43.
Roes, Johannes 1914
44.
Russwurm, Johannes
45.
Russvurm, Johannes 1855-1939
46.
Russvurm, Johannes Carl Gysbert Immanuel
47.
Sakeus, Johannes 1880-1934
48.
Taimsalu, Johannes 1891-1942
49.
Teiman, Johannes
50.
Teimann, Johannes Rudolf (kuni 22.05.1935)
51.
Tomson, Johannes
52.
Tuulre, Feliks Johannes 1908-1987
53.
Veerus, Johannes Voldemar 1897-1972
54.
Verus, Johannes Voldemar
55.
Vuhk, Oskar Johannes
name of the person
27
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Granö, Johannes Gabriel
9.
Hint, Johannes, 1914-1985
10.
Johannes Paulus II, paavst, 1920-2005
11.
Kert, Johannes
12.
Kiivet, Johannes, 1879-1967
13.
Kollist, Johannes
14.
Käis, Johannes
15.
Lang, Johannes
16.
Maide, Johannes Voldemar
17.
Mossov, Johannes
18.
Pals, Johannes, 1903-1941
19.
Pello, Johannes
20.
Putk, Aksel-Johannes
21.
Rammul, Aleksander Johannes, 1875-1949
22.
Steinbrunn, Johannes
23.
Taimsalu, Johannes, 1891-1942
24.
Talu, Martin Johannes
25.
Veerus, Johannes Voldemar, 1897-1972
26.
Veski, Johannes Voldemar, 1873-1968
27.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
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