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Constraints analysis in hierarchical test generation for digital systems (title)
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book article
Constraints analysis in hierarchical test generation for digital systems
Ubar, Raimund-Johannes
;
Krupnova, Helena
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 313-318: ill
book article
Number of records 1, displaying
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keyword
36
1.
Hierarchical Multi-level Test Generation
2.
hierarchical cluster analysis (statistics)
3.
hierarchical timing analysis
4.
hierarchical two-level analysis
5.
adaptive test strategy generation
6.
automated test pattern generation
7.
automatic test case generation
8.
automatic test pattern generation
9.
automatic test program generation
10.
behaviour level test generation
11.
functional test generation
12.
high-level test data generation
13.
highlevel test generation
14.
implementation-independent test generation
15.
offline test generation
16.
provably correct test generation
17.
test generation
18.
test generation and fault diagnosis
19.
Test Group Generation for Detecting Multiple Faults
20.
test program generation
21.
digital test
22.
Digital test and testable design
23.
distributed generation systems
24.
digital image analysis
25.
droplet digital image analysis
26.
package test analysis
27.
Cross-level Modeling of Faults in Digital Systems
28.
digital circuits and systems
29.
digital control systems
30.
digital product-service systems
31.
digital social systems
32.
digital systems
33.
High-level Decision Diagrams for Modeling Digital Systems
34.
teaching design and test of systems
35.
systems integrated analysis
36.
systems-theoretic process analysis (STPA)
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