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Defect-oriented test generation using probabilistic estimation (title)
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book article
Defect-oriented test generation using probabilistic estimation
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 2000
2001
/
p. 131-136 : ill
book article
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keyword
17
1.
adaptive test strategy generation
2.
automated test pattern generation
3.
automatic test case generation
4.
automatic test pattern generation
5.
automatic test program generation
6.
behaviour level test generation
7.
functional test generation
8.
Hierarchical Multi-level Test Generation
9.
high-level test data generation
10.
highlevel test generation
11.
implementation-independent test generation
12.
offline test generation
13.
provably correct test generation
14.
test generation
15.
test generation and fault diagnosis
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
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